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Edx system

Manufactured by Bruker
Sourced in Germany

The EDX system is a laboratory equipment used for elemental analysis. It employs X-ray spectroscopy to identify and quantify the chemical elements present in a sample.

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4 protocols using edx system

1

SEM Imaging of SSBD Spots

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For the SEM imaging, a 3.0-nm Au/Pd layer was coated on the SSBD spots using a sputtering device (ACE600 Carbon & Sputter Coater). Field emission SEM (Magellan 400) was used to acquire the images at a 5-keV accelerating voltage. EDX mappings were conducted at 10 keV (acquisition time: 60 s) using a Bruker EDX system (Bruker Nano GmbH Berlin) on a FIB-SEM (Helios G4 UX, Thermo Fisher Scientific) platform.
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2

Postmortem Electrode Characterization

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Electrodes
for postmortem studies were washed twice in fresh DMC and then dried
in vacuum. ATR-FT-IR spectra were acquired using a Bruker Lumos II
microscope with an integrated FT-IR spectrometer suited for sample
analysis in attenuated total reflection using a Ge crystal. A resolution
of 4 cm–1 and 10 scans were set. Raman spectra were
registered using a DILOR LabRam confocal micro-Raman instrument equipped
with a He–Ne laser source at 632.7 nm. Samples were held in
3D-printed sample holders sealed with a cover glass window and nail
polish in order to avoid undesired reactions with air moisture. An
HR-FESEM Zeiss Auriga coupled with a Bruker EDX system was used for
ex situ morphological characterization and elemental mapping of electrodes.
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3

Characterization of Ag/ZnO@Biochar Nanocomposite

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The phytosynthesis of Ag/ZnO@BC was indicated by UV–visible spectroscopy (Genesis 10S UV–VIS spectrophotometer, Thermo scientific). Crystallinity of pristine biochar and Ag/ZnO@BC were determined by XRD (Siemens D-5000) with Cu Kα radiation (λ = 0.154 nm). SEM (model EVO 40, Zeiss) attached to EDX (model Bruker EDX system) were used for the examination of the morphology and analysis of elements. TEM measurements were conducted on a JEOL model 1200EX instrument operated at an accelerating voltage of (80 kV). XPS analysis was collected ESCALAB250Xi (Thermo Scientific, China) spectrometer with a monochromatic Al Kα radiation source (energy 1486.68 eV) at 164 W. FT-IR spectrums were attained over the range of 4000–400 cm−1 using a TENSOR-5, Bruker FTIR Spectrometer. TGA analysis was carried out using Pyris-1, Diamond TG/DTA PerkinElmer. Zeta potentials of synthesized samples were determined using ZetaPALS, Brookhaven, USA to measure their surface charge and stability.
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4

Characterizing Metal-Organic Frameworks by SEM

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Scanning electron microscopy (SEM) and elemental mapping were used to image the metal–organic frameworks and the extent of Au(III) adsorption. Images were collected using an FEI Quanta 650 ESEM apparatus equipped with a Bruker EDX system. Framework samples were washed 3× with Milli-Q water and 3× with ethanol and dried anaerobically at 30 °C. Dried samples were prepared on carbon-taped mounts and coated with Pd/Au at 40 mA for 40 s using a Denton Thermo sputter coater. Samples analyzed for elemental mapping were not sputter-coated. Esprit software was used analyze the normalized weight and atomic percentage of Fe and Au in the cycled frameworks and to generate elemental mapping images.
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