A field emission (SEM, JEOL-6700 FESEM, Japan) was employed to observe the microstructures of samples. TEM, FEI, USA was carried out with a Talos F200x. The HAADF-STEM images were performed by using the STEM mode of FEI Titan Themis G1 with double aberration correctors. The crystal structures of catalysts were determined by XRD using a Rigaku SmartLab 9 kw diffractometer with Cu Kα radiation (18 (link)). And surface chemical compositions of catalysts were determined by XPS analysis on the ESCALAB-250Xi photoelectron spectroscope with Al Kα radiation. The concentration of Cu and Co ions in Cu/CoSe2/C was investigated with the use of multielemental analysis by inductively coupled plasma atomic emission spectrometry (ICP-AES) Vista-MPX instrument from Varian (Australia). The electrochemical behaviors of prepared catalysts were obtained on an electrochemical workstation (CHI 760E, China). CIP concentration at different reaction time intervals was analyzed by HPLC (Agilent, USA) with a UV detector and a ZORBAX Eclipse XDB-C18 column. The detection wavelength was set at 276 nm for CIP. The CIP mineralization was obtained by a TOC analyzer (TOC-VCPH, Japan).
6700 fe sem
Manufactured by JEOL
Sourced in Japan
The JEOL 6700 FE SEM is a field emission scanning electron microscope that provides high-resolution imaging and analysis capabilities. It features a high-brightness field emission gun, advanced electron optics, and a range of detectors to capture detailed information about the surface morphology and elemental composition of samples.
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3 protocols using 6700 fe sem
1
Multimodal Characterization of Catalysts
2
Scanning Electron Microscopy of M15RL on S. aureus
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The action of M15RL on the S. aureus 6538 morphology was investigated by scanning electron microscopy (SEM). Before preparation for microscopic observation, S. aureus 6538 was processed as described in the antimicrobial assay. After 18 h at 37 °C, 200 μL of the bacterial suspension treated with M15RL at ½ × MIC, 1 × MIC, 2 × MIC, and 4 × MIC was taken and centrifugated at 2500× g for 15 min. For the observation, the cells were treated with little modifications, as described before by Sotirova [30 (link)]. Briefly, the cells were washed in 0.1 M Na cacodylate buffer (CB), fixed for 4 h at 4 °C in 4% glutaraldehyde in CB, resuspended in CB and poured on a 0.4 µm filter, washed in CB, and post-fixed in the dark for 1 h at 4 °C in 1% OsO4 in CB. The filters were washed in CB, successively in MilliQ water, and then dehydrated in graded ethanol series. Finally, the samples were vacuum coated with gold. Observations were made on JEOL 6700 FE SEM (JEOL, Tokyo, Japan).
3
Bacterial Ultrastructure Analysis by SEM and TEM
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The bacterium was cultivated in MB and ISP2 for three days, then the cultures were centrifuged for 10 min at 3000 × g, and the obtained pellet was cleaned in filtered seawater (FSW). Scanning Electron Microscopy (SEM) was performed fixing the cells overnight at 4 • C in 2 % glutaraldehyde in FSW, resuspended in FSW and poured on a 0.4 µm filter. The cells were then washed in FSW and post-fixed in the dark for 1 h at 4-8 • C in 1 % OsO 4 + 0.8 % potassium ferrocyanide in FSW. The filters were washed in FSW, successively in MilliQ water, and then dehydrated in graded ethanol series. Finally, the samples were vacuum coated with gold. Observations were made on JEOL 6700 FE SEM (JEOL, Tokyo, Japan). The cells treated for transmission electron microscopy (TEM) were prepared with the same protocol for SEM analysis until dehydration in graded ethanol series. After that, the samples were enclosed with EMbed 812 resin for 48 h at 60 • C. Finally, they were observed with a ZEISS LEO 912 AB TEM (ZEISS, Oberkochen, Germany).
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