1H NMR spectra were measured with a JEOL JNM ECA-500 using tetramethylsilane (TMS) as an internal standard; δ values are given in parts per million (ppm). IR spectra were measured with a SHIMADZU FTIR IRPrestige-21 spectrometer, and the values are provided in cm−1. Flame atomic absorption spectrometry was conducted with a Hitachi Z-2310 polarized Zeeman atomic absorption spectrometer (AAS). X-ray photoelectron spectroscopy (XPS) was performed with a Kratos AXIS-NOVA instrument. Scanning electron microscopy (SEM) was performed using a HITACHI S-2500 instrument at an acceleration voltage of 1.5 kV. Energy-dispersive X-ray analysis (EDX/SEM) was conducted using a HITACHI S-3400N/BRUKER Quantax 200 System. Transmission electron microscopy (TEM) was conducted using a HITACHI HT-7700 instrument at an acceleration voltage of 20 kV. Samples for TEM analysis were deposited onto a Cu grid. Atomic force microscopy (AFM) was conducted with a KEYENCE VN-8010 instrument using a silicon substrate in the high amplitude mode (tapping mode) under an ambient condition.
Vn 8010
Manufactured by Keyence
Sourced in Japan, United States
The VN-8010 is a high-resolution vision sensor designed for industrial applications. It features a high-speed CMOS image sensor and advanced image processing capabilities. The core function of the VN-8010 is to capture and analyze images for the purpose of inspection, measurement, and identification tasks.
Automatically generated - may contain errors
Lab products found in correlation
Vhx 6000, by Keyence (2 mentions)
Jnm eca500, by JEOL (1 mentions)
Ir prestige 21 ftir spectrometer, by Shimadzu (1 mentions)
Axis nova, by Shimadzu (1 mentions)
Ht7700, by Hitachi (1 mentions)
S 2500, by Hitachi (1 mentions)
Wako special grade, by Fujifilm (1 mentions)
Smartlab, by Rigaku (1 mentions)
Mfp 3d, by Oxford Instruments (1 mentions)
3 protocols using vn 8010
1
Comprehensive Materials Characterization Protocol
2
Synthesis and Characterization of OSC Films
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
As OSC materials, powdered Ph-BTNT-C10 and Ph-BTNT-C12 were synthesized according to the previously described procedure (21 ). After the synthesis, we prepared a 0.05 weight % (wt %) solution of Ph-BTNT-C10 and Ph-BTNT-C12 in chlorobenzene (Wako Special Grade; Fujifilm Wako Pure Chemical Corp., Japan), and these solutions were mixed at a volume ratio of 9:1. The OSC film was fabricated by blade coating or EMG coating, which uses a unidirectional sweep of a thin glass blade covered with a perfluoropolymer, Cytop (CTL-809 M; AGC Inc., Japan). The coating speed was controlled at 3.5 μm s−1 by a stepping motor (SHOT-302GS; Sigma Koki Co. Ltd., Japan) under ambient conditions. The thickness profile of the OSC film was measured by a tapping-mode AFM (VN-8010; Keyence Corp., Japan). The crystallinity of the OSC film was characterized by a crossed-Nicols polarized microscope (VHX-6000; Keyence Corp., Japan). The in-plane XRD measurements were conducted using a thin-film diffractometer (SmartLab; Rigaku Corp., Japan) with a monochromated CuKα radiation. Diffraction intensity is recorded with a scintillation counter under ambient conditions.
3
Blade-Coated p-Tol-BTBT-Cn Thin Films
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Single‐crystal thin films of pTol‐BTBT‐Cn were all fabricated by the blade‐coating technique.[34 ,
36
] 0.05−0.1 wt.% semiconductor solution was used in chlorobenzene at sweep rates of 1.0−3.0 µm s−1 by a fluoropolymer‐coated glass blade at room temperature. The glass blade was coated with CYTOP by spin‐coating technique. Optical microscope images of the films were collected using a digital microscope (VHX‐6000; Keyence Co., Ltd.). The film thickness determined by height profiles of the films was measured by AFM (VN‐8010; Keyence Co., Ltd. and MFP‐3D; Asylum Research, USA).
36
] 0.05−0.1 wt.% semiconductor solution was used in chlorobenzene at sweep rates of 1.0−3.0 µm s−1 by a fluoropolymer‐coated glass blade at room temperature. The glass blade was coated with CYTOP by spin‐coating technique. Optical microscope images of the films were collected using a digital microscope (VHX‐6000; Keyence Co., Ltd.). The film thickness determined by height profiles of the films was measured by AFM (VN‐8010; Keyence Co., Ltd. and MFP‐3D; Asylum Research, USA).
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!