Transmission electron microscopy (TEM) was performed on a JEOL-2010 instrument (JEOL, Tokyo, Japan) at 200 kV. Fourier transform infrared (FTIR) spectra were collected in the wavenumber range of 4000–400 cm−1 using a Nicolet 360 FTIR spectrometer (Nicolet, Madison, WI, USA). X-ray photoelectron spectroscopy (XPS) was performed using an ESCALAB 250 spectrometer (VG Scientific, London, England) with monochromatic Al Kα radiation (hν = 1486.6 eV), and the binding energy calibration was based on C 1s (284.6 eV). UV–vis absorption spectra were recorded on a PerkinElmer Lambda 950 spectrophotometer (PerkinElmer, Waltham, MA, USA). Excitation and emission spectra were collected using a Hitachi F-7000 fluorescence spectrophotometer (Hitachi, Tokyo, Japan). The QY of the CDs was measured at an excitation wavelength of 360 nm using quinine sulfate as a standard (QY = 54%) [6 (link)]. Confocal microscopy analysis was performed using an Olympus FluoView 500 laser scanning confocal microscope (Olympus, Tokyo, Japan), and the 3-(4,5-dimethylthiazol-2-yl)-2,5-diphenyltetrazolium bromide (MTT) assay of the obtained CDs was used to quantify the viability of HeLa cells [40 (link)].
2010 instrument
Manufactured by JEOL
Sourced in Japan
The JEOL 2010 is a high-performance transmission electron microscope (TEM) designed for advanced materials analysis. It features a LaB6 electron source, a high-resolution objective lens, and a multi-function imaging system capable of bright-field, dark-field, and high-resolution imaging. The JEOL 2010 is capable of resolving atomic-scale details and is commonly used for the study of nanomaterials, thin films, and other advanced materials.
Automatically generated - may contain errors
Lab products found in correlation
Lambda 950 spectrophotometer, by PerkinElmer (1 mentions)
Escalab 250 spectrometer, by VG Scientific (1 mentions)
Fluoview 500 laser scanning confocal microscope, by Olympus (1 mentions)
F 7000 fluorescence spectrophotometer, by Hitachi (1 mentions)
K alpha spectrophotometer, by Thermo Fisher Scientific (1 mentions)
Cary 60 uv visible spectrometer, by Agilent Technologies (1 mentions)
Thermo evolution 220, by Thermo Fisher Scientific (1 mentions)
Fei quanta 650 feg, by Thermo Fisher Scientific (1 mentions)
4 protocols using 2010 instrument
1
Comprehensive Characterization of Carbon Dots
2
Multimodal Characterization of Nanomaterials
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Nuclear Magnetic Resonance (NMR) spectra were measured on a Bruker Avance™III HD NanoBay 400 MHz spectrophotometer. UV-visible spectra were measured using an Agilent Technologies Cary 60 UV-visible spectrometer. TEM images were taken using a Hitachi H7500 Transmission Electron Microscope (TEM). Cryo-TEM images were recorded using JEOL 2010 instrument at the Canadian Centre for Electron Microscopy, Hamilton, ON. To perform cryo-TEM measurements, a droplet of the solution was placed on the grid, the excess fluid was blotted using a filter paper to prepare a thin layer of the sample solution. The specimen was vitrified by immediate transferring under liquid N2 into the cryo-TEM chamber using a cryogenic holder and transfer station. X-ray photoelectron spectroscopy (XPS) measurements were performed on a Thermo Scientific K-Alpha spectrophotometer equipped with an Al Kα (1486.6 eV) X-ray source. The binding energies were referenced to the Au 4f7/2 peak at 84.0 eV.
3
Probing Lipid-AgNP Interactions by TEM
4
UV-induced Silver Nanoparticle Characterization
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The diluted CWSAE-induced AgNP solution was divided into six groups (depending on UV exposure durations) of three hundred-microliter (300 µL) samples. Each of these samples was exposed to UV light with a wavelength of 302 nm at the low intensity setting for various durations (1 min, 2 min, 5 min, 10 min, and 30 min) on a UV Transilluminator (Model: TFM-30, 4 × 25 W/230 V/50 Hz/2.0 Amp). We will call these samples 0-min group, 1-min group, 2-min group, 5-min group, 10-min group, and 30-min group, respectively.
The size and other properties of AgNPs were characterized using a UV-Vis spectrometer (Thermo Evolution 220, Thermo Scientific, Waltham, MA, USA). Transmission electron microscopy (TEM) with a JEOL 2010 instrument (200 kV) (Tokyo, Japan) and scanning electron microscopy (SEM) with Energy-Dispersive X-ray Spectroscopy (EDS) using an FEI Quanta 650 FEG (Thermo Scientific, Waltham, MA, USA) were also employed for imaging the AgNPs. TEM imaging was used to evaluate the overall dimension of AgNPs, and SEM imaging was used to characterize the degree of aggregation of AgNPs.
The size and other properties of AgNPs were characterized using a UV-Vis spectrometer (Thermo Evolution 220, Thermo Scientific, Waltham, MA, USA). Transmission electron microscopy (TEM) with a JEOL 2010 instrument (200 kV) (Tokyo, Japan) and scanning electron microscopy (SEM) with Energy-Dispersive X-ray Spectroscopy (EDS) using an FEI Quanta 650 FEG (Thermo Scientific, Waltham, MA, USA) were also employed for imaging the AgNPs. TEM imaging was used to evaluate the overall dimension of AgNPs, and SEM imaging was used to characterize the degree of aggregation of AgNPs.
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