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Supra 55 field emission scanning electron microscope

Manufactured by Zeiss
Sourced in Germany

The Supra 55 Field Emission scanning electron microscope is a high-performance imaging and analytical tool designed for advanced materials characterization. It utilizes a field emission electron source to provide high-resolution imaging and precise elemental analysis capabilities.

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6 protocols using supra 55 field emission scanning electron microscope

1

Petrographic and Elemental Analysis of NWA 8321

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Petrographic observations and X-ray elemental mapping of NWA 8321 were performed using a Zeiss Supra 55 Field Emission scanning electron microscope (FE-SEM) at Nanjing University, Nanjing, China. Mineral compositions were measured using JEOL JXA 8100 electron probe micro-analyzer (EPMA) at Nanjing University. An accelerating voltage of 15 kV and a beam current of 20 nA were used for all minerals in this study. The measurement times for elemental peak and background are 20 and 10 s, respectively, for most elements, except for Na and K (10 and 5 s for peak and background measurements, respectively). Natural and synthetic standards were used for concentration calibration. All data were reduced with the ZAF (atomic number-absorption-fluorescence) procedure. Representative compositions are given in supplementary materials. Typical detection limit is <0.02 wt%. All the microprobe data are given in Supplementary Tables 15.
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2

Silk Filament Visualization by SEM

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Scanning Electron Microscopy was used to visualize the printed silk filaments. Sections were prepared by freeze-fracturing under liquid nitrogen. All samples for SEM were sputter-coated with 102–20 nm gold coating using a Polaron SC502 Sputter Coater (Fisons, VG Microtech, East Sussex, England) and imaged using a Zeiss EVO MA10 electron microscope (Carl Zeiss AG, Germany).
For EDX: Samples were coated with gold and then observed using a Carl Zeiss (Carl Zeiss SMT, Germany) Supra 55 field emission scanning electron microscope (FESEM) at an accelerated voltage of 20 kV. EDX was performed using Zeiss Supra 55 SEM coupled with an EDAX EDX system at the Center for Nanoscale Systems at Harvard University.
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3

Synthesis and Characterization of Organometallic Compounds

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All reagents were commercially available and used as supplied without further purification. Deuterated solvents were purchased from Cambridge Isotope Laboratory (Andover, MA). Compounds 5,51 (link)6,51 (link)7−1051 (link),66 (link) were prepared according to modified literature procedures. NMR spectra were recorded at room temperature. 1H chemical shifts are reported relative to the residual solvent signals, and 31P{1H} NMR chemical shifts are referenced to an external unlocked sample of 85% H3PO4 (δ = 0.0). Mass spectra were recorded on a Waters synapt G2 tandem mass spectrometer using electrospray ionization with a MassLynx operating system. Ultraviolet−visible experiments were conducted on a Hitachi U-4100 absorption spectrophotometer. Fluorescence experiments were conducted on a Hitachi F-7000 fluorescence spectrophotometer. Transmission electron microscopy investigations were performed on a JEM-2100EX instrument. For TEM, dispersions of the assemblies were dried onto carbon-coated copper support grids. A Zeiss Supra55 field-emission scanning electron microscope was used to investigate the assemblies. For scanning electron microscopy, dispersions of the assemblies were dried onto silicon wafers. High-resolution TEM and elemental mapping images were obtained using a Tecnai G2 F30 S-TWIN instrument.
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4

Scanning Electron Microscopy Sample Preparation

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Samples of 10 μl were placed on 1 cm2 cover slips coated with poly-L-lysine and kept in a humid environment at room temperature for 1 hr. Samples were then submerged sequentially for 10 min in 5 ethanol solutions of increasing concentrations from 30% to 100% absolute ethanol. Following critical point drying the samples were sputter coated with an Au/Pd alloy. Images were obtained with a Zeiss Supra55 Field Emission scanning electron microscope.
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5

Multimodal Characterization of Biomaterials

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Scanning electron microscopy (SEM) and energy dispersive spectrometer (EDS) images were obtained on a SUPRA 55 field emission scanning electron microscope (Carl Zeiss AG, Germany). Transmission electron microscope (TEM) images were acquired from a Hitachi H-600 with 120 kV accelerating voltage. The high-resolution transmission electron microscopy (HR-TEM) images were collected on a JEM-2010 instrument at 200 kV accelerating voltage. Raman spectra were obtained from a Renishaw In Via confocal Raman microscope with 785 nm laser excitation. X-ray diffraction (XRD) was carried out on a D8 ADVANCE diffractometer (Bruker AXS, Germany) using Cu Kα radiation as the irradiation source. Inductively coupled plasma mass spectrometry (ICP-MS, ICAP TQ, Thermo Fisher Scientific Inc, Germany) was used to confirm the phosphate concentration in the body fluid. Fourier transform infrared spectroscopy (FTIR, Nicolet 6700, Thermo Fisher Scientific Co., Ltd., USA) was applied for the identification of the MgP. The transmittance of the sample was recorded with 16 scans with resolution of 4 cm -1 between 550 and 4000 cm -1 .
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6

Multifunctional Copper Mesh Coatings

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FTIRs of the samples were analyzed in a region of 400–4000 cm−1 using a Nicolet Avatar 370 (Nicolet, USA). The spectra of coatings were achieved by KBr pellets and the vibrational transition frequencies are reported in wave numbers (cm−1). SEM images were taken on a SUPRA55 field emission scanning electron microscope (Zeiss, Germany). The elemental maps on the coating surfaces were obtained using an EDS spectrometer (Oxford) of SEM. XPS was carried out on a Thermo Scientific™ Escalab spectrometer equipped with monochromatic Al Kα radiation (1486.6 eV) as the X-ray source (Thermo ESCALAB 250). The electron kinetic energy was recorded and converted to binding energy based on a calibration with the C1s peak (284.6 eV) and used a pass energy of 100.0 eV or 20.0 eV. Measurement of the wetting properties of the copper meshes was carried out on a video optical contact angle system (JC2000D1, Shanghai Powereach Digital Technology Equipment Co., Ltd., China) at ambient temperature. A 5 μL water droplet was used for the contact angle (CA) measurement. By adjusting the tilted angle of the sample to make a water drop (5 μL) rolling off the copper mesh, the sliding angle (SA) was obtained. CAs and SAs were determined by averaging values measured at six different points on each sample surface.
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