The measurements were performed in a Siemens 5000 X-ray powder diffractometer with a CuKα radiation (λ = 1.5418 Å) filtered by a nickel window. Angular values with a step size of 0.05° and a sampling time of 2 s were the experimental parameters used for data acquisition. In order to identify the crystalline phases, analysis of the X-ray diffraction patterns was carried out by using electronic databases.
Ray powder diffractometer
Manufactured by Siemens
The 5000 X-ray powder diffractometer is a laboratory instrument used for the analysis of crystalline materials. It employs X-ray diffraction techniques to identify the atomic and molecular structure of a sample. The core function of this device is to provide detailed information about the crystallographic properties of the material under investigation.
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Lab products found in correlation
2 protocols using ray powder diffractometer
1
X-Ray Powder Diffraction Analysis
2
Characterizing Patina via X-ray Diffraction
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X-ray diffraction
patterns were recorded directly on the artifacts or a small amount
of powdered patina by a Siemens 5000 X-ray powder diffractometer with
Ni-filtered Cu Kα radiation (λ = 0.154056 nm) by using
the following experimental parameters: angular values between 10 and
90° in the additive mode, a step size of 0.05°, and a sampling
time of 20 s. X-ray diffraction patterns were analyzed by using electronic
databases and compared with the literature data.
patterns were recorded directly on the artifacts or a small amount
of powdered patina by a Siemens 5000 X-ray powder diffractometer with
Ni-filtered Cu Kα radiation (λ = 0.154056 nm) by using
the following experimental parameters: angular values between 10 and
90° in the additive mode, a step size of 0.05°, and a sampling
time of 20 s. X-ray diffraction patterns were analyzed by using electronic
databases and compared with the literature data.
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