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8453 uv visdiode array spectrophotometer

Manufactured by Agilent Technologies

The 8453 UV–vis diode array spectrophotometer is a laboratory equipment designed to measure the absorbance of light by samples across a range of ultraviolet and visible wavelengths. It utilizes a diode array detector to simultaneously capture the spectrum of a sample, providing rapid and accurate measurements.

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8 protocols using 8453 uv visdiode array spectrophotometer

1

Characterization of SERS Tags

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TEM images
were collected with
a JEOL JEM-1400PLUS transmission electron microscope operating at
120 kV, using carbon-coated 400 square mesh copper grids. UV–vis
optical extinction spectra were recorded using an Agilent 8453 UV–vis
diode array spectrophotometer. Regarding SERS tag stability, no aggregation
was observed during storage at 4 °C. Prior to application to
cells, a brief sonication step is recommended to efficiently redisperse
sedimented SERS tags.
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2

UV-Vis Spectra of Gold Nanoparticles

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Optical extinction spectra were recorded using an Agilent 8453 UV/Vis diode-array spectrophotometer. The resulting spectra were normalized at 400 nm. At this wavelength the absorbance by gold nanoparticles has been shown to be nearly independent of particle size.47 (link)
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3

Nanocrystal Analysis via STEM and TEM

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Scanning transmission electron microscopy
(STEM) images were obtained with an aberration corrected “cubed”
FEI Titan 60–300 electron microscope operated at 300 kV. TEM
images were obtained with a JEOL JEM-1400PLUS transmission electron
microscope operating at an acceleration voltage of 120 kV. Samples
were prepared by dripping the corresponding nanocrystal solution on
carbon-coated copper grids. UV–Vis optical extinction spectra
were recorded using an Agilent 8453 UV–vis diode-array spectrophotometer.
Acquisition time for EDX measurements was ∼600 s.
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4

TEM and UV-Vis Characterization

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TEM images were collected with
a JEOL JEM-1400PLUS transmission electron microscope operating at
120 kV, using carbon-coated 400 square mesh copper grids. UV–vis
optical extinction spectra were recorded using an Agilent 8453 UV–vis
diode array spectrophotometer.
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5

TEM Imaging and UV-Vis-NIR Spectroscopy

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TEM images were collected
using a transmission electron microscope JEOL JEM-1400PLUS operating
at 120 kV. A drop of the dispersion was deposited on a carbon-coated
copper grid and dried under ambient conditions. UV–vis–NIR
optical extinction spectra were recorded using an Agilent 8453 UV–vis
diode array spectrophotometer.
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6

Detailed Materials Characterization Protocol

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Transmission electron microscopy (TEM) images were obtained in a JEOL JEM-2100F electron microscope, at an acceleration voltage of 120 kV. Samples for TEM analysis were prepared by adding a single drop (2 µL) of the aqueous solution (ca. 0.1 mg/mL in milliQ water) of particles onto a copper grid coated with a carbon film (Electron Microscopy Sciences). Further details on the preparation of grids can be found in the SI, Section A4.
UV-Vis spectra were measured in an Agilent 8453 UV-Vis diode-array spectrophotometer. Zeta potential measurements were performed in a Malvern Zetasizer 3000 HS particle size analyzer (Malvern Instruments, UK). Fluorescence measurements were carried out with a PerkinElmer LS55 Fluorescence Spectrometer. ICP-MS measurements were performed on a Thermo iCAP Q ICP-MS (Thermo Fisher Scientific GmbH, Bremen, Germany). A ASX560 autosampler was coupled to the ICP-MS (CETAC Tech, Omaha, NE, USA). In order to digest the different materials for ICP experiments, 100 µL of CaF2 particles aqueous solution was digested overnight in 10 mL HNO3 (65%, Scharlau) at 70 oC. Full beads were digested overnight in aqua regia. Spheroids were digested in aqua regia as well, but they required sonication before and after a 24h digestion time.
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7

Multimodal Characterization of Nanoparticles

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TEM images were obtained on a JEOL
JEM-1400PLUS TEM operating at an acceleration voltage of 120 kV. Elemental
maps were performed on a JEOL JEM-2100F UHR TEM operating at an acceleration
voltage of 200 kV and equipped with an Oxford INCA EDX system. Extinction
spectra were measured using an Agilent 8453 UV–vis diode array
spectrophotometer. ζ-potential was measured with a Z-sizer instrument
(Nano ZS, Nanoseries; Malvern). Cell microscopy experiments were conducted
on an LSM510 Zeiss confocal microscope for bright-field imaging and
on an LSM 880 Zeiss confocal fluorescence microscope for reflection
and fluorescence imaging. Dark-field scattering imaging and spectroscopy
were performed with an inverted dark-field microscope (Nikon Eclipse
Ti-U) equipped with a monochromator (Acton) and a color video camera
(Coolprix).
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8

Thermal Reshaping of Spiked AuNS

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The AuNS dispersion was placed in an oil bath at 95 1C, under magnetic stirring. The first aliquot was taken before heating started, then UV-vis spectra were monitored over time (Agilent 8453 UV/vis diode-array spectrophotometer) and aliquots were sampled until no further changes in the LSPR band were observed. The various aliquots were also characterized by transmission electron microscopy (JEOL JEM-1400PLUS operating at 120 kV), the Feret's diameter (equivalent to the tip-to-tip maximum diameter of the 2D TEM projection) was used as the dimension parameter indicative of nanoparticle ''spikiness''. The mechanism involving the structural rearrangement is commonly ascribed to thermally induced motion of weakly bound atoms from highly convex surfaces toward concave areas. 19 Other possible reshaping mechanisms, such as Ostwald ripening, are typically discarded as no chelating molecules (CTAB, halogen analogs, etc.) are present, and no significative changes are observed in the sphere-equivalent size of the nanoparticles.
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