D max iiia x ray diffractometer

X-ray diffraction (a Rigaku D/Max-IIIA X-ray diffractometer with Cu Kα radiation, at a scanning rate of 2° s⁻¹) was used to characterize the crystal structure of carbyne nanocrystals. The morphology of the sample was observed using a scanning electron microscopy system (FEI Quanta-400). The NEXAFS spectra of the samples were collected at the Singapore Synchrotron Light Source (SSLS) center, where a pair of channel-cut Si (111) crystals was used in a monochromator. The energy resolution was set at ∼0.1 eV for C K edges. The K-edge absorption data are collected in total electron yield (TEY) mode monitoring the total current. The base pressure in the UHV chamber is maintained at ∼2 × 10⁻¹⁰ mbar throughout the measurements.

Malvern Zetasizer Nano-ZS90 (Worcestershire, United Kingdom) was used to measure the mean size and zeta potential of SSPNs through dynamic light scattering (DLS) method. Transmission electron microscopy (TEM) (JEM1400, JEOL Co., Japan) was carried out to characterize morphologies of SSPNs. Briefly, the samples were introduced into a carbon-coated grid and staining was done using uranyl acetate solution (1%, w/v) after the removal of water had been done.
Stability of SSPNs was assessed by dispersing 200 μg of freshly prepared samples in phosphate buffer saline (PBS, pH 7.4) containing 10% fetal bovine serum (FBS). Then, this system was placed in a shaker (37°C, 1,000 rpm) and the particle size of the samples was detected at different times. Inductively coupled plasma atomic emission spectrometry (ICP-AES) was used to determine the content of SPIOs in SSPNs. Rigaku D/Max-IIIA x-ray diffractometer with a Cu target (40 kV, 40 mA) was used to obtain the XRD patterns of SPIOs and SSPNs. Magnetization data were measured using MPMS XL-7 Quantum Design SQUID magnetometer with an applied magnetic field set between 2 × 10⁴ Oe to and 2 × 10⁴ Oe at 300 K.

The structures of the samples were determined by the X-ray diffractometer (XRD) with a CuKα-radiation at 30 kV and 20 mA (Rigaku D/Max-IIIa X-ray diffractometer, Rigaku, Tokyo, Japan). Samples were scanned from 3° to 70° at a speed of 8° min⁻¹ with a scanning step length of 0.01°. TEM (transmission electron microscopy) tests of the MMT and nZVI/MMT were carried on a JEOL-2100 transmission electron microscope (JEOL, Tokyo, Japan) with an accelerating voltage of 200 kV. The sample powders were well dispersed in ethanol and dried on a copper grid supported carbon film before observation. Microwave absorption properties of the flexible absorbing film were analyzed using a microwave network analyzer N5244A (Agilent Technologies, Santa Clara, CA, USA). The frequency range was from 2 to 10 GHz. The coaxial wire method was adopted for the analyses.