D max 2550 pc x ray diffractometer
The D/max-2550 PC X-ray diffractometer is a laboratory instrument manufactured by Rigaku. It is designed to perform X-ray diffraction analysis, a technique used to study the atomic and molecular structure of materials. The core function of the D/max-2550 PC is to collect and analyze the patterns of X-ray diffraction from a sample, providing information about its crystallographic properties.
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9 protocols using d max 2550 pc x ray diffractometer
Comprehensive Material Characterization
Characterization of Co3O4@PPy Nanocomposite
Comprehensive Characterization of Materials
Comprehensive Characterization of Hydrogels
Comprehensive Material Characterization
Characterization of Se@SiO2 Nanoparticles
Characterization of Fe3O4 and Fe3O4@HA Nanoparticles
Formulation and Characterization of mPEG-PE/siRNA Nanoparticles
siRNA (150 μL of 20 μM) was added to 100 μL of a 100 mM CaCl2 solution, and was subsequently mixed with 250 μL of an mPEG-PE (1 mg/mL) solution. HBS (500 μL; 50 mM Hepes, 280 mM NaCl, 1.5 mM Na3PO4, pH = 7.4) was quickly added to the mPEG-PE/Ca2+/siRNA solution and was allowed to react for 30 min. To remove the excess Ca2+, the reaction mixture was centrifuged at 1000 g and 4°C for 1 h using Amicon® Ultra-4 centrifugal filter devices (MWCO: 10 kDa). The sample solution was used in further experiments.
The particle size, polydispersity index (PDI) and zeta potential of the prepared nanoparticles were determined using dynamic light scattering (DLS) (Malvern Zetasizer nano ZS, Malvern) measurements. To observe the morphology of the nanoparticles, the nanoparticle solution was dropped onto a 300-mesh carboncoated copper grid and the excess solution was removed using a filter paper. The grid was allowed to dry at room temperature and was observed using transmission electron microscopy (TEM) (H-800, Hitachi, Japan). X-ray diffraction (XRD) measurements were carried out on a Rigaku D/Max-2550PC X-ray diffractometer using Cu Kα radiation.
X-ray Diffraction Analysis Protocol
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