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D max 2550 pc x ray diffractometer

Manufactured by Rigaku
Sourced in Japan

The D/max-2550 PC X-ray diffractometer is a laboratory instrument manufactured by Rigaku. It is designed to perform X-ray diffraction analysis, a technique used to study the atomic and molecular structure of materials. The core function of the D/max-2550 PC is to collect and analyze the patterns of X-ray diffraction from a sample, providing information about its crystallographic properties.

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9 protocols using d max 2550 pc x ray diffractometer

1

Comprehensive Material Characterization

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The morphology and structure of the samples were investigated by a field-emission scanning electron microscope (SEM) on SU8010. X-ray diffraction (XRD) patterns were recorded on a Rigaku D/MAX-2550-PC X-ray diffractometer with Cu Kα radiation (λ = 0.154 nm). The 2θ degree range used in the measurements was from 20° to 80°. Thermogravimetric analysis (TGA) was performed on a Pyris 1 TGA (Perkin Elmer) system under air flow (50–800 °C, 10 °C min−1). Inductive coupled plasma (ICP) emission spectrometry was executed on an iCAP6300 (detection limit: 2–200 µgL−1).
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2

Characterization of Co3O4@PPy Nanocomposite

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As-synthesized products were characterized by D/Max-2550 PC X-ray diffractometer (XRD, Rigaku, Cu-Kα radiation), X-ray photoelectron spectroscopy (XPS, PHI5000VersaProbe), scanning electron microscopy (SEM, HITACHI, S-4800) and transmission electron microscopy (TEM, JEOL, JEM-2100F) equipped with an energy-dispersive X-ray spectrometer (EDX). The Co3O4@PPy samples were easily scraped off from the Ni foam substrate for the Fourier transform infrared (FTIR) test, and the FTIR spectrum was recorded on a Nicolet 6700 FTIR spectrometer (Bruker).
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3

Comprehensive Characterization of Materials

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Powder X-ray diffraction (XRD) patterns of the samples were obtained on a RIGAKU D/max-2550 PC X-ray diffractometer with Cu Kα radiation (λ = 0.15406 nm) at a scan rate of 0.02°/s32 (link). Fourier transform infrared (FTIR) spectra of the samples were obtained between 4000 and 400 cm−1 on a Nicolet Nexus 670 FTIR spectrophotometer using KBr pellets. Scanning electron microscopy (SEM) images were obtained with a JEOL JSM-6360LV scanning electron microscope at an accelerating voltage of 5 kV, which equipped with energy dispersive spectrometer (EDS). Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) were operated with a JEOL JEM-2100F transmission electron microscope at an acceleration voltage of 200 kV42 (link). The N2 adsorption-desorption isotherms were record at 77 K and analyzed using an ASAP 2020 surface area analyzer. X-ray photoelectron spectroscopy (XPS) measurements were performed using an ESCALAB 250 spectrometer. The UV-vis diffuse reflectance spectra (UV-vis DRS) were obtained with a Shimadzu UV2450 UV-vis spectrophotometer, and barium sulfate was used as reference. The photoluminescence (PL) experiment were conducted on a Hitachi F-4500 fluorescence spectrometer using an excitation wavelength of 254 nm3. The contact angles of the samples were measured using the sessile-drop technique using a goniometer (GBX, France).
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4

Comprehensive Characterization of Hydrogels

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Fourier transform infrared (FTIR) spectra were recorded on an FTIR NEXUS-670 spectrometer over a scan range of 4000–500 cm−1, with a resolution of 2 cm−1. Morphological analysis of the hydrogels was performed by S-4800 field emission scanning electron microscopy. Samples for observation were freeze-dried for 48 h and sputter-coated with gold. Powder X-ray diffraction (XRD) measurements were performed by a Rigaku D/MAX-2550PC X-ray diffractometer with Cu Kα irradiation from 5–90°. A tensile strength test was carried out under ambient conditions on a universal material testing machine (Instron 5969) equipped with a 100 N load cell at a speed of 20 mm/min. The hydrogels were investigated by an ultraviolet (UV)–visible spectrometer (UV3600, Japan).
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5

Comprehensive Material Characterization

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The morphologies of the as-prepared samples were analyzed by TEM (JEM-2100F). XRD analyses were performed by using a D/max-2550 PC X-ray diffractometer (Rigaku). The XPS patterns were obtained by using an X-ray photoelectron spectrometer (ESCALab 250). UV-Vis-NIR spectra were recorded by using a UV-1902PC spectrophotometer (Phoenix).
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6

Characterization of Se@SiO2 Nanoparticles

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The size and morphology of the Se@SiO2 NPs were captured by TEM using a JEM-2100F microscope (JEOL, Tokyo, Japan). X-ray diffraction (XRD) was measured by a D/max-2550 PCX-ray diffractometer (Rigaku, Tokyo, Japan).
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7

Characterization of Fe3O4 and Fe3O4@HA Nanoparticles

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The crystalline structure of the Fe3O4 and Fe3O4@HA nanoparticles was characterized by X-ray diffraction (XRD) in a 2θ range of 20–80°, using a D/max 2550 PC X-ray diffractometer (Japan, Rigaku Cop.) with Cu Kα radiation (λ = 0.154,056 nm) at 40 kV and 200 mA. Fourier transform infrared (FTIR) spectra of Fe3O4 and Fe3O4@HA nanoparticles were obtained by using a Nexus 670 spectrometer (Thermo Nicolet Corporation, Madison, WI). Thermogravimetric analysis (TGA) was performed in a temperature range of 30–900°C with a heating rate of 20°C/min under nitrogen using a TG209 F1 (NETZSCH Instruments Co., Ltd., Germany) thermogravimetric analyzer.
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8

Formulation and Characterization of mPEG-PE/siRNA Nanoparticles

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mPEG-PE (40 mg) was dissolved in 4 mL TCM and dried under vacuum. After evaporating the TCM, the residual membrane was dispersed in 4 mL of Tris-HCl (10 mM Tris-HCl pH 7.4) to form mPEG-PE micelles. The micelles were stored at 4°C.
siRNA (150 μL of 20 μM) was added to 100 μL of a 100 mM CaCl2 solution, and was subsequently mixed with 250 μL of an mPEG-PE (1 mg/mL) solution. HBS (500 μL; 50 mM Hepes, 280 mM NaCl, 1.5 mM Na3PO4, pH = 7.4) was quickly added to the mPEG-PE/Ca2+/siRNA solution and was allowed to react for 30 min. To remove the excess Ca2+, the reaction mixture was centrifuged at 1000 g and 4°C for 1 h using Amicon® Ultra-4 centrifugal filter devices (MWCO: 10 kDa). The sample solution was used in further experiments.
The particle size, polydispersity index (PDI) and zeta potential of the prepared nanoparticles were determined using dynamic light scattering (DLS) (Malvern Zetasizer nano ZS, Malvern) measurements. To observe the morphology of the nanoparticles, the nanoparticle solution was dropped onto a 300-mesh carboncoated copper grid and the excess solution was removed using a filter paper. The grid was allowed to dry at room temperature and was observed using transmission electron microscopy (TEM) (H-800, Hitachi, Japan). X-ray diffraction (XRD) measurements were carried out on a Rigaku D/Max-2550PC X-ray diffractometer using Cu Kα radiation.
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9

X-ray Diffraction Analysis Protocol

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XRD patterns were measured at room temperature using a RIGAKU D/MAX 2550/PC X-ray diffractometer with monochromatic Cu Kα radiation (λ = 1.54184 Å) at 18 kW.
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