Quanta 400f

Powder samples were dispersed on an aluminum stub with a thin self-adhered carbon film, and were coated with a thin layer of gold using an ion sputter under an argon atmosphere. The surface morphology of the sample was observed using a scanning electron microscope (Quanta400F, FEI, Inc., Hillsboro, OR, USA).

MCF‐7 cells were incubated with 200 nm biotin‐labeled TDN‐3 EpCAM or DNA nanosynapse in BB buffer at 4 °C for 30 min with a final volume of 200 µL. 5 µL Dynabeads of 10 mg mL⁻¹ (65 001, Thermo Fisher Scientific) were then added and continued incubation for another 30 min, followed by magnetic separation. After that, cells were fixed by adding 500 µL glutaraldehyde (2.5%) and incubated overnight at RT. Cells were then washed three times by PBS, and underwent gradient dehydration by exposure to a series of ethanol solutions (30%, 50%, 70%, 90%, 95%, and 100%) for 15 min per turn. Subsequently, cells were treated with 50% HMDS for 15 min, followed by resuspending in 100% HMDS. Cells were added dropwise to silicon wafer and dried in the cupboard overnight. The samples were subjected to gold sputtering and finally imaged by thermal field‐emission environmental scanning electron microscope (Quanta 400F, FEI) at an accelerating voltage of 20 kV.

The morphology and corresponding elemental mapping images of MME structures were measured using scanning electron microscopy (Quanta 400 F, FEI, USA) and its energy dispersive spectroscopy (EDS), respectively. NdFeB microparticles and liquid metal distribution inside the MME structure were measured by micro-CT (GE Vtomex). The optical photos of the MME structure were captured by the digital SLR camera (EOS5D, Canon, Japan). The morphology of the MME structure was measured by the ultra-depth three-dimensional microscope (VHX-7000, KEYENCE, Japan).

With the aid of a Lambda 950 UV /VIS /NIR spectrometer, optical characteristics were determined in the wavelength range of 400 to 700 nm (Perkin-Elmer, USA). At room temperature, the structural characteristics of the films were evaluated using an AXS-D8 Advance Cu-K diffractometer (Bruker Corp., USA). Using the Cu-K radiation wavelength,, of 1.5408, we also examined the XRD patterns in a 2 range with a step size of 0.02°, ranging 10° to 80°. FEI Quanta 400F field emission scanning electron microscope (FESEM) equipped with Oxford- Instruments INCA 400 X-Max detector for energy–dispersive x-ray spectroscopy (EDX) measurements at × 300 magnification (1 mm × 1 mm spot size) and 20 kV accelerating voltage. Finally, the electrical characteristics of films were examined using an HMS ECOPIA 3000 Hall Effect measuring instrument with a 0.57 T magnetic field and 45 nA probe current. We used the Ag paste method to form an ohmic contact by adding Ag dots to each sample's four corners, and then repeated each reading for each sample ten times to improve the reliability of our findings.