Lmplanfl n
The LMPlanFL N is a high-performance microscope objective lens designed for fluorescence microscopy applications. It features a numerical aperture of 0.5 and a working distance of 10.6 mm. The lens is optimized for use with common fluorescent dyes and provides high-quality, high-contrast images.
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21 protocols using lmplanfl n
Raman Spectroscopy of Surface-Adsorbed Species
Combined AFM-Raman TERS Imaging Protocol
Raman Spectroscopic Analysis of ABS Nanocompounds
Thermal and Structural Analysis of 3D-Printed Nanocomposites
Raman measurements were performed with a modified LabRAM HR Raman Spectrometer (HORIBA Scientific, Kyoto, Japan). Raman excitation was achieved with a 532 nm central wavelength solid-state laser module with a maximum laser output power of 90 mW. The microscope is coupled with a 50× microscopic objective lens with a 0.5 numerical aperture and 10.6 mm working distance (LMPlanFL N, Olympus) that delivered the excitation light and collected the Raman signals. A neutral density filter of 5% transmittance was used, which resulted in 2 mW of power on the sample. The laser spot size was approximately 1.7 μm laterally and approximately 2 μm axially. A 600 grove grating was used, resulting in a Raman spectral resolution of approximately 2 cm−1. The Raman spectral range was set to be from 500 to 3900 cm−1, resulting in 3 optical windows per point. The acquisition time for each measurement was 10 s and with five accumulations at each point.
Automated Nonlinear Microscopy for SHG Imaging
SERS Analysis of Biotin-Streptavidin Interaction
Confocal Microscopy of NV Emission
To investigate the tuned NV emission, we used an objective with a long working distance (Olympus LMPlanFLN, 50×, NA = 0.5, WD = 10.6 mm) to avoid a short circuit between the microscope objective and the metallized and wired diamond surface.
Raman Spectroscopy Protocol for Material Analysis
Raman, PL, and AFM Analysis of Nanomaterials
Atomic force microscopy (AFM) measurements were recorded by using an AIST-NT model SmartSPM 1000 in intermittent contact mode with an Al-coated Si probe (k = 2 N/m, 240 µm length) (AC240TM-R3, Oxford Instruments Asylum Research, Santa Barbara, CA, USA) operating at a 70 kHz resonant frequency and controlled by Omega software 3.5.81 (AIST-NT).
Characterizing Fluorescent Nanodiamonds via Confocal Microscopy
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