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34 protocols using pilatus 300k

1

Multi-Angle X-Ray Scattering Technique

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The instruments “Ganesha-Air” from SAXSLAB/XENOCS (Grenoble, France) and Gallium Anode Low-Angle X-ray Instrument (GALAXI) were used. The X-ray source of the laboratory-based “Ganesha-Air” system is a D2-MetalJet (Excillum, Kista, Sweden) with a liquid metal anode operating at 70 kV and 3.57 mA with Ga–Kα radiation (wavelength λ = 0.134 nm). The beam is further focused with a focal length of 55 cm, using especially made X-ray optics (Xenocs) to provide a very narrow and intense beam at the sample position. Two pairs of scatterless slits are used to adjust the beam size depending on the detector distance. The data were acquired with a position-sensitive detector (PILATUS 300 K, Dectris, Baden-Daettwil, Switzerland). After calibration with silver behenate, the distance from the sample to the detector was set to 950 and 350 mm resulting in a Q-range 0.13–6.00 nm−1. All samples were sealed in glass capillaries of 2 mm inner diameter. Data reduction and background subtraction were performed using the Python-based project Jscatter [47 (link)]. Fitting of radially averaged SAXS curves was done using Scatter [48 (link)].
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2

SAXS Characterization of Nanomaterials

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SAXS experiments were
performed with a ‘“Double Ganesha AIR”’
system (SAXSLAB, Denmark). The X-ray source of this laboratory-based
system is a rotating anode (Cu, MicroMax 007HF, Rigaku Corporation,
Japan) providing a microfocused beam at λ = 0.154 nm. The scattering
data were recorded by a position-sensitive detector (PILATUS 300 K,
Dectris). To cover the range of scattering vectors between 0.026 and
2 nm–1, different detector positions were used.
The measurements were done in 1 mm glass capillaries (Hilgenberg,
code 4007610, Germany) at room temperature. The circularly averaged
data were normalized to incident beam, sample thickness, and measurement
time before subtraction of the solvent scattering curve.
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3

SAXS and WAXS Characterization Protocol

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SAXS (small-angle X-ray scattering) and WAXS (wide-angle X-ray scattering) measurements were measured on a Xeuss 2.0 SAXS/WAXS system (Xenocs SA, France). Cu Kα X-ray source (GeniX3D Cu ULD), generated at 50 kV and 0.6 mA, was utilized to produce X-ray radiation with a wavelength of 1.5418 Å. A semiconductor detector (Pilatus 300 K, DECTRIS, Swiss) with a resolution of 487 × 619 pixels (pixel size = 172 × 172 μm2) was used to collect the scattering signals. For two dimensional (2D) SAXS, the sample-to-detector distance was 1196.26 mm, which was determined by a Silver Behenate (AgC22H43O2) standard. Each WAXS pattern was collected with an exposure time of 6 min. with 2θ range of 1.8-30 degree. The one-dimensional intensity profiles were integrated from background corrected 2D WAXS patterns (Supplementary Fig. 28). Beamstop: D = 5 mm.
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4

Transmission WAXS Analysis of Materials

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Transmission WAXS
diffractograms were obtained under vacuum using a Mat:Nordic instrument
from SAXLAB equipped with a Rigaku 003+ high brilliance microfocus
Cu-radiation source (wavelength = 1.5406 Å) and a Dectris Pilatus
300K detector. Samples were placed at a distance of 134 mm from the
sample and irradiated for 1800 s. The sample-to-detector distance
was calibrated using silver behenate powder. The SaxsGUI software
was used for data reduction.
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5

X-ray Characterization of Structural Transitions

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The structural characterization was performed
in the 1W2A beamline
of the Beijing Synchrotron radiation Facility (BSRF). Selected samples
were previously fractionated in a Linkam THMS600 hot stage connected
to a liquid nitrogen station. The final heating was performed from
25 to 140 °C at 5 °C/min in a Linkam TST350 hot stage, and
the WAXS patterns were taken simultaneously. An exposure time of 25
s was used, and the patterns were taken every 30 s (i.e., every 2.5
°C). A Pilatus 1M detector collected the scattering patterns
with a resolution of 981 × 1043 pixels (pixel size = 79 ×
79 μm2). The sample-to-detector distance was 121.8
mm, and the wavelength was 1.54 Å.
WAXS experiments, on
selected samples, were performed with transmission geometry at RT.
These experiments were performed on a Xeuss 2.0 system (Xenocs SA),
equipped with a microfocus Cu Kα X-ray source (GeniX3D, 50 kV,
0.6 mA), generating X-ray radiation of a wavelength of 1.54 Å.
The detector used was a Pilatus 300K (DECTRIS, Swiss) with a resolution
of 487 × 619 pixels (pixel size = 172 × 172 μm2). The sample-to-detector distance was 138.61 mm, and exposure
time of 1800 s. The 1D intensity profiles were integrated from background-corrected
2D WAXS patterns with an azimuthal angle range of 0–90°.
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6

Synchrotron X-ray Scattering of Biomolecular Solutions

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All solution X-ray scattering data were acquired at the 16-ID (LiX) beamline of the National Synchrotron Light Source II (NSLS II) at Brookhaven National Laboratory. 38 Sixty µL of solution samples and their matching bu↵ers were manually loaded and individually measured in a continuous flow mode with five 2-second exposures. The momentum transfer of the scattered X-ray photons is defined as q = (4⇡/ ) sin ✓, where is the incident X-ray wavelength in Å and ✓ is half of the scattering angle. Solution X-ray scattering data with a q range of 0.005 to 3.2 Å 1 were recorded using a Pilatus 1M (small angle) and two Pilatus 300K (wide angle) detectors (Dectris, Switzerland) in vacuum. On-site frame-to-frame data screening was done by py4xs package 38 to ensure matching of pre-and post-sample bu↵ers and to ensure the absence of radiation damage. For all measurements, the signal-to-noise ratio (SNR) was above 30.0 at q = 1.0 Å 1 . The SASBDB access codes for experimental profiles used in this study are reported in Table S2.
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7

Synchrotron and In-House X-Ray Scattering Analysis

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For solubilizing conditions
(above the transition
pH, generally above pH 6), samples were measured at three synchrotron
facilities: Beamline B21, Diamond Light Source, UK, beamline 12.3.1,
SIBYLS, Advanced Light Source, Berkeley, USA and beamline SWING, SOLEIL
synchrotron facility, Paris, France.
For phase-separating samples
that display sediment (below the transition pH, generally pH 3–5.5),
measurements were performed using an in-house X-ray scattering system,
with a Genix3D (Xenocs) low divergence Cu Kα radiation source
(wavelength of λ = 1.54 Å) with a Pilatus 300 K (Dectris)
detector and scatterless slits setup59 (link) as
well as beamline I22 at Diamond Light Source. Here, samples were measured
inside 1.5 mm quartz capillaries (Hilgenberg).
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8

Time-resolved X-ray Diffraction of Silver Nanocrystals

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DXB measurements were performed using the BL39XU beamline (SPring-8, Japan). The X-ray beam was monochromatized to 15.2 keV using a Si 111 double-crystal monochromator. Monochromatic X-rays were focused to a spot of ∼ 0.52 μm × 0.77 μm using K–B mirrors. The sample-to-detector distance was 85 mm, and 2,000 time-resolved diffraction images from silver halide nanocrystals immobilized on the polyimide film were recorded on a 2D photon-counting detector (Pilatus 300 K, Dectris Switzerland). The exposure time per frame and interval time were set to 50.0 and 53.0 ms, respectively.
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9

X-Ray Diffraction Characterization of Materials

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Out-of-plane XRD profiles
were recorded on a Rigaku RINT-TTR III diffractometer equipped with
a rotating anode (Cu-Kα, λ = 1.5418 Å) operated at
15 kW and a Rigaku D/teX Ultra 1D silicon strip detector. Measurements
were performed in the θ–2θ mode. Experiments of
2D-GIWAXS analysis were conducted at beamline BL19B2 in SPring-8 (Hyogo,
Japan). The X-ray beam was monochromatized using a double-crystal
Si(111) monochromator, and the X-ray energy was 12.398 keV (λ
= 1 Å). The incident angle was set to 0.12° with a Huber
diffractometer, and the sample-to-detector distance was about 174
mm. Diffracted X-ray from samples was recorded using an X-ray photon
counting pixel detector (PILATUS 300K, Dectris) for 30 s. The surface
topology was studied using a Shimadzu SPM-9700 atomic force microscope
in the tapping mode using a silicon probe with a resonant frequency
of 122 kHz and a force constant of 15 N m–1 (SI-DF20).
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10

SAXS Analysis of GM Filaments

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GM solution was extruded through a 1 mm tube into DMF and left for 30 s to obtain a filament. Three positions from the edge to the center of this filament were selected for study. Experiments were conducted on Xeuss 2.0 SAXS system (Xenocs, France) with a Pilatus 300K (Dectris) detector using Cu Kα radiation (50 kV, 60 mA) and an exposure time of 10 min. The sample‐detector distance was 294 mm, which was calibrated using silver behenate. 1D scattering profiles were reduced from the 2D data using Foxtrot.
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