Pilatus 300k
The Pilatus 300K is a hybrid pixel detector developed by Dectris. It is designed for X-ray diffraction experiments and features a large sensitive area, high readout speed, and low noise. The Pilatus 300K is capable of single-photon counting and has a high dynamic range.
Lab products found in correlation
34 protocols using pilatus 300k
Multi-Angle X-Ray Scattering Technique
SAXS Characterization of Nanomaterials
performed with a ‘“Double Ganesha AIR”’
system (SAXSLAB, Denmark). The X-ray source of this laboratory-based
system is a rotating anode (Cu, MicroMax 007HF, Rigaku Corporation,
Japan) providing a microfocused beam at λ = 0.154 nm. The scattering
data were recorded by a position-sensitive detector (PILATUS 300 K,
Dectris). To cover the range of scattering vectors between 0.026 and
2 nm–1, different detector positions were used.
The measurements were done in 1 mm glass capillaries (Hilgenberg,
code 4007610, Germany) at room temperature. The circularly averaged
data were normalized to incident beam, sample thickness, and measurement
time before subtraction of the solvent scattering curve.
SAXS and WAXS Characterization Protocol
Transmission WAXS Analysis of Materials
diffractograms were obtained under vacuum using a Mat:Nordic instrument
from SAXLAB equipped with a Rigaku 003+ high brilliance microfocus
Cu-radiation source (wavelength = 1.5406 Å) and a Dectris Pilatus
300K detector. Samples were placed at a distance of 134 mm from the
sample and irradiated for 1800 s. The sample-to-detector distance
was calibrated using silver behenate powder. The SaxsGUI software
was used for data reduction.
X-ray Characterization of Structural Transitions
in the 1W2A beamline
of the Beijing Synchrotron radiation Facility (BSRF). Selected samples
were previously fractionated in a Linkam THMS600 hot stage connected
to a liquid nitrogen station. The final heating was performed from
25 to 140 °C at 5 °C/min in a Linkam TST350 hot stage, and
the WAXS patterns were taken simultaneously. An exposure time of 25
s was used, and the patterns were taken every 30 s (i.e., every 2.5
°C). A Pilatus 1M detector collected the scattering patterns
with a resolution of 981 × 1043 pixels (pixel size = 79 ×
79 μm2). The sample-to-detector distance was 121.8
mm, and the wavelength was 1.54 Å.
WAXS experiments, on
selected samples, were performed with transmission geometry at RT.
These experiments were performed on a Xeuss 2.0 system (Xenocs SA),
equipped with a microfocus Cu Kα X-ray source (GeniX3D, 50 kV,
0.6 mA), generating X-ray radiation of a wavelength of 1.54 Å.
The detector used was a Pilatus 300K (DECTRIS, Swiss) with a resolution
of 487 × 619 pixels (pixel size = 172 × 172 μm2). The sample-to-detector distance was 138.61 mm, and exposure
time of 1800 s. The 1D intensity profiles were integrated from background-corrected
2D WAXS patterns with an azimuthal angle range of 0–90°.
Synchrotron X-ray Scattering of Biomolecular Solutions
Synchrotron and In-House X-Ray Scattering Analysis
(above the transition
pH, generally above pH 6), samples were measured at three synchrotron
facilities: Beamline B21, Diamond Light Source, UK, beamline 12.3.1,
SIBYLS, Advanced Light Source, Berkeley, USA and beamline SWING, SOLEIL
synchrotron facility, Paris, France.
For phase-separating samples
that display sediment (below the transition pH, generally pH 3–5.5),
measurements were performed using an in-house X-ray scattering system,
with a Genix3D (Xenocs) low divergence Cu Kα radiation source
(wavelength of λ = 1.54 Å) with a Pilatus 300 K (Dectris)
detector and scatterless slits setup59 (link) as
well as beamline I22 at Diamond Light Source. Here, samples were measured
inside 1.5 mm quartz capillaries (Hilgenberg).
Time-resolved X-ray Diffraction of Silver Nanocrystals
X-Ray Diffraction Characterization of Materials
were recorded on a Rigaku RINT-TTR III diffractometer equipped with
a rotating anode (Cu-Kα, λ = 1.5418 Å) operated at
15 kW and a Rigaku D/teX Ultra 1D silicon strip detector. Measurements
were performed in the θ–2θ mode. Experiments of
2D-GIWAXS analysis were conducted at beamline BL19B2 in SPring-8 (Hyogo,
Japan). The X-ray beam was monochromatized using a double-crystal
Si(111) monochromator, and the X-ray energy was 12.398 keV (λ
= 1 Å). The incident angle was set to 0.12° with a Huber
diffractometer, and the sample-to-detector distance was about 174
mm. Diffracted X-ray from samples was recorded using an X-ray photon
counting pixel detector (PILATUS 300K, Dectris) for 30 s. The surface
topology was studied using a Shimadzu SPM-9700 atomic force microscope
in the tapping mode using a silicon probe with a resonant frequency
of 122 kHz and a force constant of 15 N m–1 (SI-DF20).
SAXS Analysis of GM Filaments
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