data (13C and 1H) were assembled on a Bruker
DPX 500 MHz apparatus in DMSO-d6 solution,
and the chemical shifts were accounted to the internal standard TMS
(0 ppm). FTIR (Fourier transform infrared spectroscopy) spectra were
confirmed on an Agilent Technologies 41630 apparatus. The elemental
analysis was obtained on a Vario EL cube. PXRD (powder X-ray powder
diffraction) peaks were verified using a Cu Kα radiation source
on a D8 advanced Bruker-Powder-Diffractometer. The SEM (scanning electron
microscopy) measurements were performed on a JSM740 Scanning Electron
Microscope. A NETZSCH STA 409 PC/PG instrument was employed for recording
TGA (thermogravimetric analyses) under a N2 environment
with a heating rate of 10 °C/min. Pore size and BET surface measurements
were done at 77 K with N2 sorption isotherms on the Micromeritics
ASAP 2020 apparatus. Prior to the analysis, the prepared Cu-MOF effectively
degassed overnight at a temperature of 150 °C as well.