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8 protocols using 2400ii elemental analyzer

1

Synthesis and Characterization of Ionic Liquids

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All chemical reagents were purchased from FUJIFILM Wako Pure Chemical Corporation (Osaka, Japan) and Tokyo Chemical Industry Co., Ltd. (TCI, Tokyo, Japan). The starting polymerizable ionic liquid of [{CH2=C(CH3)COO(CH2)2}C3H3N2] (denoted as MAIm–N) was synthesized as a neutral compound, and [{CH2=C(CH3)COO(CH2)2}C3H3N2(C8H17)]Br (MAImC8·Br) were synthesized as bromide salts according to previous studies (Figure S1) [42 (link),43 (link),44 (link)].
Infrared (IR) spectra were recorded on a Jasco FT/IR-4200ST spectrometer (JASCO Corporation, Tokyo, Japan) by the KBr pellet method. Powder X-ray diffraction (XRD) patterns were measured with a Rigaku MiniFlex300 diffractometer (Rigaku Corporation, Tokyo, Japan) by using Cu Kα radiation (λ = 1.54056 Å) at ambient temperature. CHN (carbon, hydrogen, and nitrogen) elemental analyses were performed with a PerkinElmer 2400II elemental analyzer (PerkinElmer, Waltham, MA, USA).
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2

Structural and Thermal Analysis of Coating Materials

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Using a Fourier transform infrared spectrometer (iSTM 20 Thermo Fisher, Waltham, Massachusetts, USA) equipped with a Kinmen single attenuated total reflection accessory (ATR), the chemical structure of L, AL, and keratin hydrolysate PL coating material films was recorded in the range of 4000~600 cm−1 with a resolution of 16 cm−1. The elemental analysis of the L and AL was carried out using X-ray photoelectron spectroscopy (XPS) (madzu Corporation, Tokyo, Japan) and a PerkinElmer 2400II elemental analyzer (Perkin Elmer, Waltham, MA, USA). The thermal stabilities of the obtained films were determined using a thermogravimetric analyzer (TGA8000; PerkinElmer, Waltham, MA, USA) from room temperature (30 °C) to 500 °C in a nitrogen atmosphere at a rate of 10 °C min−1. The PL composites were characterized using a German Bruker D8 X-ray diffractometer (λ = 0.154 nm) in the range of 0–80° with a scanning rate of 10°/min.
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3

Comprehensive Spectroscopic Analysis of Compounds

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NMR spectra were recorded on a JEOL JNM-AL 400 Fourier-transform NMR spectrometers (400 MHz). The chemical shifts of the 1H, 13C{1H}, 11B{1H} and 19F{1H} NMR spectra determined in CDCl3 were given in ppm relative to tetramethylsilane (0.00 ppm for 1H and 13C{1H}) as an internal standard, or boron trifluoride diethyl-ether complex (0.00 ppm for 11B{1H}) and hexafluorobenzene (−164.9 ppm vs. CFCl3 for 19F{1H}) as external standards. High-resolution fast-atom bombardment mass spectroscopies (HR-FAB-MS) were carried out on a JEOL JMS-700N spectrometer. Elemental analyses (C, H, N) were performed by a Perkin Elmer 2400II elemental analyzer. UV-vis absorption spectra were recorded on a Jasco V-560 spectrophotometer. The corrected emission spectra were obtained by using a Jasco F-6500 spectrofluorometer (excitation wavelength = 365 nm). Fluorescence decay measurements were conducted by using a Hamamatsu Photonics picosecond fluorescence lifetime measurement system C11200 equipped with picosecond light pulser PLP-10 as a 405 nm excitation light source. Emission quantum yields were determined by using a Hamamatsu Photonic Absolute PL Quantum Yield Measurement System C9920-02 (excitation wavelength = 365 nm). For the photophysical measurements, spectrophotometric-grade toluene was used as supplied.
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4

Characterization of C12NH3-CrMo6 Precipitate

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Infrared (IR) spectra were measured using an FT/IR-4200ST spectrometer (Jasco Corporation, Tokyo, Japan, KBr pellet method). Powder X-ray diffraction (XRD) patterns were recorded using a MiniFlex300 diffractometer (Rigaku Corporation, Tokyo, Japan, Cu Kα radiation, λ = 1.54056 Å) under an ambient atmosphere. CHN (carbon, hydrogen, and nitrogen) elemental analyses were performed using a 2400II elemental analyzer (PerkinElmer, Inc., Waltham, MA, USA). Thermal gravimetric (TG) analyses were carried out on a TG/DTA-6200 (Seiko Instruments, Chiba, Japan) at a heating rate of 10 °C min−1 in a nitrogen atmosphere.
Steady-state diffuse reflectance, excitation, and emission spectra were recorded at 300 K using an FP-6500 fluorescence spectrometer (Jasco Corporation, Tokyo, Japan) equipped with an Xe lamp. Time-resolved emission spectra were obtained at 15 and 300 K with an Ultra CFR 400 YAG:Nd3+ laser (Big Sky Laser Technologies, Inc., Bozeman, MT, USA, 266 nm fourth harmonics, pulse duration 10 ns with a repetition rate of 10 Hz) as an excitation source. A Spectra Pro 2300i (Princeton Instruments, Inc., Trenton, NJ, USA) was utilized as a spectrometer, and a PI-Max with an intensified CCD camera (Princeton Instruments, Inc., Trenton, NJ, USA) was used as a detector. Pelletized samples of the C12NH3-CrMo6 precipitate were used for the aforementioned photoluminescence measurements.
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5

Synthesis and Characterization of Longifolene Derivatives

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The synthesized
compounds were characterized by IR (Nicolet IS 50 FT-IR spectrometer
using KBr tableting), 1H NMR and 13C NMR (Bruker
AVANCE III HD 600 MHz spectrometer using CDCl3 or dimethyl
sulfoxide as the solvent and TMS as an internal standard), ESI-MS
(TSQ Quantum Access MAX HPLC-MS apparatus), and elemental analysis
(PerkinElmer 2400II elemental analyzer). The melting points were measured
using a Hanon MP420 automatic melting point apparatus. All the characterization
data above can be found in the Supporting Information. Longifolene 1 was provided by Wuzhou Pine Chemicals
Co., Ltd., Wuzhou, China (65.0%, GC analyses). All other reagents
were purchased from commercial suppliers and used as received. Using
longifolene as the starting material, the longifolene-derived diacylhydrazine
target compounds were synthesized. The longifolene-derived tetraline 2 and the longifolene-derived tetralone 3 were
prepared according to our previously reported method.
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6

Characterization of Inorganic Compounds

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All chemical reagents were purchased from FUJIFILM Wako Pure Chemical Corporation (Osaka, Japan) and Tokyo Chemical Industry Co., Ltd. (TCI, Tokyo, Japan) and utilized without further purification.
Infrared (IR) spectra were measured on a Jasco FT/IR-4200ST spectrometer (KBr pellet method). Powder X-ray diffraction (XRD) patterns were recorded with a Rigaku MiniFlex300 diffractometer (Cu Kα radiation, λ = 1.54056 Å) at ambient temperature. CHN (carbon, hydrogen and nitrogen) elemental analyses were carried out with a PerkinElmer 2400II elemental analyzer. X-ray fluorescence (XRF) analyses were performed with a Hitachi EA1000AIII XRF analyzer.
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7

Synthesized Metal-Organic Complexes

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There was no need for further purification because all of the reagents and solvents utilized in the synthetic process were readily accessible on the market as reagent-grade compounds. We purchased EB, DAPI, HSA, and CT-DNA from Sigma Aldrich Chemicals. Merck provided the quercetin hydrate, zinc chloride, copper chloride, sodium azide, sodium dicyanamide (NaN(CN)2), and triethylamine (Et3N). A PerkinElmer 2400II elemental analyzer was utilized in the current investigation to conduct elemental (C, H, and N) analysis. A Bruker Tensor-27 in ATR mode was used to obtain FTIR data. PerkinElmer UV-VIS Lambda 365 spectrophotometer was utilized for the electronic absorption experiments, while PerkinElmer FL6500 fluorescence spectrophotometer was used for the fluorometric measurements. The total interaction investigations among macromolecules and complexes were executed in citrate-phosphate (CP) buffer of 10 mM [Na+] at pH 7.4 containing 0.5 mM Na2HPO4.
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8

Quantifying Sweet Corn Fruit Quality

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Each replicate consisted of one strip (27 square meters, approximately 112-115 plants). All fresh fruit were harvested from each strip and every fruit was weighed. Above 200 g per fruit was characterized as qualified fruit, otherwise it was defined as unqualified. Unqualified fruit was ultimately grouped by insect pest or disease. Total N from the harvest sweet corn leaves were determined by combustion (PerkinElmer 2400 II elemental analyzer, PerkinElmer, Shelton, CT, USA).
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