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Nicolet 6700 fourier transform infrared spectrometer ftir

Manufactured by Thermo Fisher Scientific
Sourced in Germany

The Nicolet 6700 Fourier Transform Infrared Spectrometer (FTIR) is a laboratory instrument designed to analyze the molecular composition of samples by detecting and measuring the absorption of infrared radiation. It is capable of identifying and quantifying a wide range of organic and inorganic compounds.

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Lab products found in correlation

2 protocols using nicolet 6700 fourier transform infrared spectrometer ftir

1

Fracture Plugging Evaluation Workflow

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A Brookfield viscometer, Brookfield company (Middleboro, MA, USA); RS-600HAAKE rheometer, Haake company (Karlsruhe, Germany); Nicolet 6700 Fourier Transform Infrared Spectrometer (FTIR), Thermo Fisher company (Waltham, MA, USA); DSC823 Differential Scanning Calorimeter, Mettler Toledo company (Zurich, Switzerland); and Anton-Paar Dynamic Mechanical Analyzer, Anton-Paar company (Graz, Austria), were used. A conventional physical simulation displacement experimental apparatus, Hai’an Petroleum Research Instruments Co., Ltd. (Hai’an, China), was used. For the plugging experiments, a visually observable fracture model was created to simulate reservoir fractures. This fracture model was formed by bonding two pieces of frosted glass along the sides by using epoxy resin adhesive. The aperture of the fracture was controlled by filling rubber bands with different sizes on the fracture surface. The parameters of the fractures used in the experiment are shown in Table 1. The temperature of the displacement experiment is 45 °C, and the injection rate of the fluid is 0.5 mL/min. The inlet of the fracture model is connected to a pressure sensor, and the inlet pressure is automatically recorded by the computer. The outlet of the fracture model is connected to the atmosphere. The pressure difference (ΔP) at both ends of the fracture model is numerically equal to the inlet pressure.
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2

Surface Characterization of PP-HMDSO and PP-MA Films

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The XPS spectra were obtained using a Versa Probe II Scanning XPS Microprobe from Physical Electronics (PHI) under ultrahigh vacuum (2.0 × 10−6 Pa). Automated dual beam charge neutralization was used during sample analysis to reduce surface charging. The analyzer pass energy was 117.4 eV for the survey spectra. Survey scans in the range 0–1000 eV were used to evaluate the percentage of different atoms present on the surfaces of the samples. Each spectrum was collected using a monochromatic Al Kα X-ray beam (E = 1486 eV) over a 200 μm diameter probing area with a beam power of 50 W.
Infrared spectroscopy measurements were performed using a Thermo Nicolet 6700 Fourier transform infrared spectrometer (FTIR) equipped with a mercury–cadmium–tellurium (MCT) detector. The spectrum for PP–HMDSO was collected using transmission geometry with the PP–HMDSO thin film deposited on CaF2. The spectrum for PP-MA was collected using an ATR geometry with the PP-MA thin film deposited on a silicon crystal.
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