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35 protocols using merlin microscope

1

Comprehensive Materials Characterization

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Elemental composition was
determined by inductively coupled plasma mass spectrometry (ICP-MS)
(Shimadzu ICPMS-2030), and water content was estimated using thermogravimetric
analysis (TGA) (NETZSCH STA 449 F3 Jupiter) under Ar at a heating
rate of 5 °C min–1. Scanning electron microscopy
(SEM) was carried out on a Zeiss Merlin microscope. Synchrotron X-ray
diffraction (XRD) measurements were performed on I11 beamline of the
Diamond Light Source operating with an X-ray wavelength of 0.826872
Å. The position-sensitive detector was used to collect diffraction
patterns over the temperature range 30–450 °C with a hot-air
blower. Ex situ X-ray powder diffraction measurements
of the electrode materials were performed using a Rigaku Smartlab
diffractometer (Cu Kα). All Rietveld and Pawley refinements
were carried out using the TOPAS-Academic software.29
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2

High-Resolution Scanning Electron Microscopy

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SEM was performed with an ultra-high-resolution field emission gun MERLIN microscope with GEMINI II column (Carl Zeiss Microscopy GmbH, Jena, Germany) operating in high-resolution mode at accelerating voltage 2 kV. Secondary electron imaging was performed with a parallel on-axis in-lens secondary electron detector. The working distance was maintained at 2 mm.
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3

Glycerin-preserved Specimen Preparation

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Specimens preserved in glycerin were selected for observation according to Abolafia (2015) (link). They were hydrated in distilled water, dehydrated in a graded mixture of ethanol-acetone series, critical point-dried with liquid carbon dioxide, and coated with gold. The mounts were examined with a Zeiss Merlin microscope (5 kV).
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4

Characterization of Nanomaterial Morphology

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Field emission scanning electron microscopy (FE-SEM) images were taken with a ZEISS MERLIN microscope. Samples dispersed in ethanol were deposited onto silicon wafers and sputtered with platinum by a JFC-1600 auto fine coater at a 20 mA current for 300 s prior to observation. Transmission electron microscopy (TEM) images were examined by a JEOL JEM-3010 microscope with Oxford 794-CCD camera at an accelerating voltage of 200 kV. Samples suspended in ethanol were dropped onto copper grids coated with a carbon support film before observation. The photographs of the water contact angle were recorded with an ultrapure water droplet of 8 μL on a JC2000D1 contact angle analyzer at room temperature. All the contact angle values were determined by using the Laplace-Young fitting mode.
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5

SEM Imaging and Elemental Analysis Protocol

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Scanning Electron Microscopy (SEM) was performed with a MERLIN microscope (Zeiss, Cambridge, UK) equipped with InLens, EBSD and SE2 detectors using a low accelerating tension (2–3 kV) with a diaphragm aperture of 30 μm. Prior to the analyses, the samples were coated with a 4-nm layer of palladium/platinum alloy in a Cressington 208 HR sputter-coater. Energy-dispersive X-ray spectroscopy (EDX) was performed using an SSD X-Max detector of 50 mm2 from Oxford Instruments (127 eV for the Kα ray of Mn).
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6

Comprehensive Characterization of Nanomaterials

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X-ray diffraction (XRD) analysis was carried out with a D/Max2550VB+/PC X-ray diffractometer with Cu Kα (λ = 0.15406 nm), using an operation voltage and current of 40 kV and 30 mA, respectively. TEM images were collected using a JEM-2100 microscope working at 200 kV. Specimens for observation were prepared by dispersing the samples into alcohol by ultrasonic treatment and dropped on carbon-copper grids. SEM and EDS images were collected using a Zeiss Merlin microscope working at 15 kV. The composition of the products was determined by X-ray photoelectron spectroscopy (XPS, Thermo ESCALAB 250). A Beckman coulter-type nitrogen adsorption-desorption apparatus (ASAP 2020 M) was used to investigate the pore property degassing at 120 °C for 12 h below 10−3 mmHg. The pore size distribution was calculated by the BJH (Barrett-Joyner-Halenda) method from the desorption branch.
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7

Protein NP Characterization on Plasma-Treated Silicon

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Immediately before sample deposition, silicon wafers were treated in plasma cleaner Electronic Diener (Plasma Surface Technology, Ebhausen, Germany). The protein NP were then deposited onto them and characterized using a Zeiss Merlin microscope equipped with GEMINI II Electron Optics (Zeiss, Oberkochen, Germany). SEM imaging was done at 1–3 kV accelerating voltage and 30–80 pA probe current.
EDX was performed by SEM via Silicon Drift Detector (SDD) X-MaxN 150 (Oxford Instruments, Abingdon, Oxfordshire, UK) and AztecEnergy EDX Software (Version 3.0).
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8

Plasma-Cleaned Silicon Wafer Characterization

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Immediately before sample deposition, silicon wafers were treated in plasma cleaner Electronic Diener (Plasma Surface Technology, Regensburg, Germany). The CC particles were then deposited onto them and characterized using a Zeiss Merlin microscope equipped with GEMINI II Electron Optics (Zeiss, München, Germany). SEM parameters were accelerating voltage (1–3 kV) and probe current (30–80 pA).
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9

SEM Preparation of Preserved Nematodes

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After their examination and identification, a few specimens preserved in glycerin were recycled to their observation under SEM following the protocol by Abolafia and Peña-Santiago (2005) . The nematodes were hydrated in distilled water, dehydrated in a graded ethanol and acetone series, critical point dried, coated with gold, and observed with a Zeiss Merlin microscope.
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10

Multifaceted Characterization of Adsorbent Materials

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The morphological
and structural characteristics of the adsorbent were examined by scanning
electron microscopy (SEM) under a MERLIN microscope (Carl Zeiss, Jena,
Germany), and transmission electron microscopy (TEM) using a JEM-2010
instrument (JEOL Ltd., Tokyo, Japan). The specific surface area and
porosity were measured based on nitrogen adsorption using an Autosorb-iQ
analyzer (Quantachrome). To determine the qualitative and quantitative
phase composition of the materials, a Difrey 401 desktop X-ray diffractometer
(Scientific Instruments CJSC, St. Petersburg, Russia) was used. The
absorbance of the prepared solutions was determined on a PE-5400 V
spectrophotometer (Ekros-Engineering LLC, Saint Petersburg, Russia).
Raman spectra were recorded on a DXR Raman microscope (Thermo Scientific
Instruments Group, Waltham, MA). The mass losses and thermal effects
were determined by an STA 449 F3 Jupiter instrument (NETZSCH-Feinmahltechnik
GmbH, Selb, Germany), which allowed simultaneous thermogravimetry
(TG) and differential scanning calorimetry (DSC) measurements too.
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