Graphite flakes, potassium permanganate, sulfuric acid, aqueous hydrogen peroxide solution (30 wt%), isopropanol, acetic acid, sulfuric acid, N,N-diisopropylethylamine, and ethane thiol were purchased from Sigma-Aldrich and were used as received. Tapping mode atomic fore microscopy (AFM) was performed in a NX-10 Park system. FTIR spectra were collected from a Cary 600 by Agilent Technologies in ATR mode. X-Ray photoelectron spectroscopy data (survey and high-resolution scans) were collected using PHI Versaprobe 5000 X-ray photoelectron spectrometer with Al Kα radiation and was referenced to internal SiO2. Raman Spectra were acquired using a Jasco Analytic Instruments NRS-4100 with 532 nm excitation. 2D X-ray diffraction experiment was performed using Bruker Discover D8 X-ray diffractometer, which has a monochromated X-ray source (normally used with a Co K-alpha X-ray tube), configured in point focus mode. Thermogravimetric analysis was performed in a TGA 2050 system by TA Instruments set at 10 °C min−1. UV-Vis spectra were collected using Agilent Cary 5000 UV-Vis-NIR in a quartz cuvette. Fluorescence studies were performed using Agilent Cary Eclipse fluorescence spectrophotometer. Sheet resistances were measured using EDTM R-Chek four-point probe.
D8 discover x ray diffractometer
Manufactured by Bruker
Sourced in United States, Germany
The D8 Discover is an X-ray diffractometer manufactured by Bruker. It is a versatile instrument designed for the analysis of crystal structures and materials. The D8 Discover is capable of performing a range of X-ray diffraction measurements, including phase identification, quantitative analysis, and structural characterization.
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Lab products found in correlation
V 570 uv vis nir spectrophotometer, by Jasco (3 mentions)
Nicolet is50, by Thermo Fisher Scientific (3 mentions)
Tga 209, by Netzsch (2 mentions)
Zetasizer nano z, by Malvern Panalytical (2 mentions)
Nicolet is10, by Thermo Fisher Scientific (2 mentions)
Sta449f3, by Netzsch (2 mentions)
Geminisem 500, by Zeiss (2 mentions)
Libra 200 mc schottky field emission gun instrument, by Zeiss (2 mentions)
Supra 50vp, by Zeiss (2 mentions)
Jem 2100f, by Thermo Fisher Scientific (2 mentions)
Carbon coated copper grid, by Merck Group (2 mentions)
Tecnai f20 200 kev, by Thermo Fisher Scientific (2 mentions)
Titan 80 3000, by Thermo Fisher Scientific (2 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
Cary 600, by Agilent Technologies (1 mentions)
Cary 5000, by Agilent Technologies (1 mentions)
Cary eclipse fluorescence spectrophotometer, by Agilent Technologies (1 mentions)
Origin 2019, by OriginLab (1 mentions)
Fourier transform infrared spectroscopy ft ir, by PerkinElmer (1 mentions)
Optizen pop spectrophotometer, by Mecasys (1 mentions)
54 protocols using d8 discover x ray diffractometer
1
Synthesis and Characterization of Graphene Oxide
2
Characterization of CIGS Solar Cells
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A Bio-Logic potentiostat/galvanostat Model VSP A (Seyssinet-Pariset, France) was used as the power source to obtain polarization curves by applying a constant step voltage (chronoamperometry experiments) on the electrochemical system. The final electrodeposit composition at the CIGS surface was determined using a Hitachi S4500 scanning electron microscope (SEM) equipped with a Noran energy dispersive spectrometer (EDS), (Santa Clara, CA, USA). The focused ion beam (FIB) for the atomic composition analysis in the cross section of the CIGS film was determined by the FEI Helios NanoLab 650 Dual-Beam System equipped with an EDS (Milpitas, CA, USA). KLA-Tencor P-6 Stylus Profilometer, (Milpitas, CA, USA) was used to determine the thickness of the CIGS film. X-ray diffraction (XRD) was used to analyze CIGS crystallography (Bruker Discover D8 X-ray diffractometer, Billerica, MA, USA) with a Cu K α (alpha) radiation (λ = 0.15406 nm) as the source, with a step of 0.01°. The equipment used in the PV measurements was the QEX10 quantum efficiency measurement system (PV Measurements, Boulder, CO, USA), and an Oriel Sol2A solar simulator, (Irvine, CA, USA). As a result, the characterized parameters were overall efficiency, quantum efficiency, open circuit voltage, short circuit current, dark current, band gap, and the fill factor.
3
Mineralogical Characterization of Terrestrial Analogues
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A Discover D8 X-Ray Diffractometer (Bruker) was used to investigate the mineralogical composition of the terrestrial analogues. The instrument includes a Cu X-ray tube (wavelength 1.54 Å) as excitation source and a LynxEye detector. Fine-powdered rocks (granulometry ≤ 150 µm) were analyzed by setting a scan range between 5° and 70° 2θ, a step increment in 2θ of 0.01 and a count time of 0.5 s per step. Analysis of resulting diffractograms was performed with the XPowder 2004.04.71 software with PDF-2 (2010) and the American Mineralogist Crystal Structure Database crystallographic databases. A background correction for each diffractogram was achieved with the Splin-autoroller and polynomial tools available XPowder 2004.04.71 that allows for calculation of a background polynomial subtraction function36 . XRD mineral quantification and theoretical density determination of the mixture were achieved by using the reference intensity ratio from pattern matching results with XPowder 2004.04.7136 .
4
Characterization of Chitosan-LNZ Biocomposite
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XRD patterns of optimized LNZ-loaded bio-composite film and its pure starting materials (chitosan and LNZ) were achieved using a Bruker D8 DISCOVER X-ray diffractometer, Germany. Samples were conducted with Ni-filtered Cu Kα radiation (λ = 0.15416 nm), under a voltage of 45 kV and current of 40 mA. The rate of scanning was set at 2° min−1 over a diffraction angle (2θ) ranging from 5° to 100° (Zhang et al., 2020 (link)).
5
Analyzing Protein Purity and Cellulose DP
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The purity of purified proteins was examined by 12% SDS-PAGE. The number-average DP of cellulose was calculated by the ratio of glucosyl monomer concentration (determined by the phenol–sulfuric acid method) divided by the reducing-end concentration (determined by the modified bicinchoninic acid (BCA) method) [24 (link)]. X-ray diffractograms of all freeze-dried samples were measured using a Bruker D8 Discover X-ray diffractometer (Madison, WI, USA) with the scanning rate of 4°/min, ranging from 10° to 50° [10 (link)].
6
Characterizing Coaxial PGS/PCL Fibers
7
Quantifying Clay Mineral Content
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All 43 samples
were analyzed by a Bruker D8 Discover X-ray diffractometer according
to the Chinese industry standard (SY/T 5163-2018).20 Samples were milled and passed through a 200 mesh sieve.
The suspension method was used to determine the relative clay content.
Clay minerals with a diameter of less than 2 μm were extracted,
and a directional film was produced that included natural air-dried
pieces, ethylene glycol pieces, and pieces heated at 550 °C.
The content of the clay mineral was calculated by the diffraction
peak intensity contrast method and adiabatic equations.21 (link)
were analyzed by a Bruker D8 Discover X-ray diffractometer according
to the Chinese industry standard (SY/T 5163-2018).20 Samples were milled and passed through a 200 mesh sieve.
The suspension method was used to determine the relative clay content.
Clay minerals with a diameter of less than 2 μm were extracted,
and a directional film was produced that included natural air-dried
pieces, ethylene glycol pieces, and pieces heated at 550 °C.
The content of the clay mineral was calculated by the diffraction
peak intensity contrast method and adiabatic equations.21 (link)
8
Characterization of Nanomaterials by TEM, XRD, UV-Vis, FT-IR
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The morphology was characterized using transmission electron microscopy (TEM) and FEI Tecnai G2 F20 microscope (Philips, Amsterdam, Holland) with an accelerating voltage of 200 kV. X-ray diffraction (XRD) patterns were obtained using a Bruker D8 Discover X-ray diffractometer. UV-visible absorbance spectra were acquired on Jasco V-630 spectrophotometers. Fourier transform infrared (FT-IR) spectra were obtained by Nicolet 5700 FT-IR spectrometer.
9
Characterizing Nanocapsules via Spectroscopy and Microscopy
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JASCO V-570 UV-VIS-NIR spectrophotometer was used to record the absorption spectra at room temperature in a wavelength range of 300–600 nm in a 3 mL cuvette. All fluorescence measurements were carried out at 425 excitation wavelength unless specified. Before freeze drying, the nanocapsules are resuspened in deionized water. From this solution, 0.1 mL was pipetted and diluted into a total volume of 3 mL. Scanning electron microscopy (SEM) analysis was done using a Tescan, Vega 3 LMU with an Oxford EDX detector (Inca XmaW20) at 5 kV accelerating voltage. Briefly, few drops of suspended NCs were deposited on an aluminum stub and coated with carbon conductive adhesive tape. The X-ray diffraction (XRD) analysis was obtained using a Bruker D8 discover X-ray diffractometer equipped with CuKa radiation (λ = 1.5405 Å). The monochromator used was a Johansson type monochromator. The X-ray scans were done for 2θ between 10° and 45°.
10
Nanoparticle Characterization: Techniques Explored
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The apparent zeta potential was measured using a Malvern Zetasizer Nano ZS (M3-PALS) using the Non-Invasive Back Scatter technique. The instrument was equipped with a monochromatic red laser operating at 632.8 nm and the data were analysed with the Malvern Dispersion technology software. Z-average values for three measurements were recorded. The Thermogravimetric Analysis (TGA) and Differential Scanning Calorimetry (DSC) measurements were done using a Netzsch TGA 209 in the temperature range 0 to 800 oC with an increment of 30 K/10 minutes in a N2 atmosphere. Scanning electron microscopy (SEM) analysis was carried out using Tescan, Vega 3 LMU with Oxford EDX detector (Inca XmaW20) SEM. The sample was deposited on a carbon film for SEM analysis. Transmission electron microscopy (TEM) measurement was carried out with a JEOL 2200FS double aberration corrected FEG microscope, operating at 200 kV. TEM samples were prepared by casting a drop of the nanoparticle suspension onto copper grids covered with holey carbon films. The X-Ray Diffraction (XRD) data were recorded using a Bruker d8 discover X-Ray diffractometer equipped with Cu-Kα radiation (λ = 1.5405 Å). The monochromator used was Johansson Type. The step size was 0.02 degree and the scan rate was 20 s per step.
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