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X pert pro x ray diffractometer

Manufactured by Malvern Panalytical
Sourced in Netherlands, United Kingdom, India, United States

The X'Pert Pro X-ray diffractometer is a laboratory instrument designed to perform X-ray diffraction analysis. It is used to identify and quantify the crystalline phases present in a sample by measuring the diffraction pattern of X-rays interacting with the sample's atomic structure.

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146 protocols using x pert pro x ray diffractometer

1

Characterization of Nano-Hydroxyapatite and Imatinib Composite

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The XRPD patterns obtained from nHAp and nHAp/IM were detected by using a PANalytical X’Pert Pro X-ray diffractometer (Malvern Panalytical Ltd., Royston, UK) equipped with Ni-filtered Cu Kα1 radiation (Kα1 = 1.54060 Å). All samples were measured under the same conditions, voltage: 40 kV, current: 30 mA, and a scan angle (2θ) in the range of 5° to 80° (step size = 0.0263°, time per step = 2.5 s). The experimental nHAp/IM diffractogram was compared with the pattern of nHAp standard from Inorganic Crystal Structure Database (ICSD–180315 [51 (link)]) with the pattern of unmodified imatinib supplied by Sigma Aldrich, as well as with the experimental diffractogram of IM.
The average crystallite size of nHAp was calculated based on the Rietveld refinement method [52 (link)] using the MAUD [53 (link)] program, version 2.93, based on the apatite hexagonal crystal structure with the better approximation and indexing using the Crystallographic Information File (CIF).
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2

Microstructure Analysis of Sintered Ceramics

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The sintered ceramic pellets were ground using 800, 1200, 2400 and 4000 grit SiC paper followed by polishing procedures with 3, 1, 0.25 μm diamond paste and 0.04 μm OPS silica colloidal suspension. Examination of microstructure and micro-chemical elemental mapping of the polished cross-sections were conducted using a scanning electron microscope (SEM, Tescan Mira3 SC, TESCAN-UK Ltd., Cambridge, UK) equipped with an energy-dispersive X-ray spectroscopy (EDS) system. The average grain sizes were determined quantitatively from the SEM images by line intercept analysis using ImageJ software (National Institutes of Health, Bethesda, MD, USA). X-ray diffraction (XRD) patterns of as-sintered samples were obtained using a PANalytical X’Pert Pro X-ray diffractometer (Malvern Panalytical Ltd., Malvern, UK) in the 2θ range from 10 to 100°, with a step size of 0.0167° and a counting time of 1.5 s for each step. TOPAS v5 software (Bruker Corporation, Billerica, MA, USA) was utilized for Rietveld refinement of the XRD data.
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3

Comprehensive Material Characterization Using XRD, FT-IR, and SEM

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The X-ray powder diffractograms (XRD) were recorded on a PANalytical X’Pert Pro X-ray diffractometer (Malvern Panalytical Ltd., Malvern, UK) equipped with Ni-filtered Cu Kα1 radiation (Kα1 = 1.54060 Å, V = 40 kV, I = 30 mA). FT-IR spectra were recorded using a Thermo Scientific Nicolet iS50 FT-IR spectrometer (Waltham, MA, USA) over the wavenumbers 4000–500 cm−1 (spectral resolution was set to 4 cm−1) The ATR (Attenuated Total Reflection) spectra were recorded using Nicolet iS50 FT-IR (Thermo Scientific) spectrometer equipped with an Automated Beamsplitter exchange system (iS50 ABX containing DLaTGS KBr detector), built-in all reflective diamond ATR module (iS50 ATR), Thermo Scientific PolarisTM and HeNe laser as an IR radiation source. Spectral resolution was set to 4 cm−1. The microstructure of obtained hydrogels and elemental analysis together with the mapping of elements were carried out using a scanning electron microscope FEI Nova NanoSEM 230 (FEI Company, Hillsboro, OR, USA) equipped with an energy dispersive spectrometer (EDAX PegasusXM4,FEI Nova NanoSEM 230) and operating at an acceleration voltage in the range of 3.0–15.0 kV and spot 2.5–3.0 were observed.
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4

Comprehensive Characterization of Adsorbents

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X-ray diffraction (XRD) and X-ray fluorescence (XRF) analyses were conducted to confirm the mineralogy and chemical composition of the adsorbents. The XRD patterns were recorded by a PANalytical X’Pert Pro X-ray diffractometer (Malvern Panalytical) using monochromatic CuKα1 radiation (λ=1.5406 Å) at 45 kV and 40 mA. Diffractograms were collected within the 2θ range 10°–90° at 0.017° intervals and with a scan step time of 100 s. The crystalline phases and structures of the adsorbents were analyzed using the HighScore Plus software (Version 4.0, PANalytical). The peaks were identified according to the International Centre for Diffraction Data (ICDD) (PDF-4+ 2020 RDB). The phases were quantified through Rietveld analysis using HighScore. XRF spectra were recorded by a PANalytical Axios mAX XRF spectrometer, wherein the samples were prepared as loose powders using a mylar film under helium atmosphere at 4 kW.
The Fourier transform infrared spectroscopy (FTIR) spectra of the adsorbents were collected using a Perkin Elmer Spectrum One spectrometer equipped with an attenuated total reflectance unit.
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5

Comprehensive Characterization of Crystalline Nanomaterials

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The crystal growth planes and crystallite sizes were determined using x-ray diffraction (XRD). The analysis was conducted using X'Pert PRO x-ray Diffractometer (PanAnalytical) operating with Cu K-α radiation (wavelength of 1.544 Å) at 45 kV and 40 mA with a 20–70° 2θ range, a 0.2° step width scanning 1.2 deg/min on a 2 g sample. The absorbance was measured using a UV-Vis spectrophotometer (Thermo Fisher Scientific, China) operating within a scanning range of 300–800 nm with a 5 nm scan step on a 3 ml sample. The surface morphology of the samples was studied using a scanning electron microscope (SEM), Phenom desktop SEM with EDX analysis software. The Fourier-transform infra-red spectroscopy was performed using a PerkinElmer spectrum 2 spectrometer (PerkinElmer Inc., UK) with a 4000-400 cm−1 scanning range and 4 cm−1 resolutions on a 0.1 g sample.
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6

Characterization of WO3 Crystallinity

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The nature of WO3 crystallinity was investigated on PANanalytical X'Pert PRO X-ray diffractometer (XRD) Malvern, United Kingdom. The diffraction patterns were obtained from a 2θ degree angle = 10–90° and a step size of 0.0170° using Cu radiation with a wavelength of 0.154 nm. The generator was kept at 40 kV and a current of 40 mA. The internal structures of WO3 were examined with Field emission scanning electron microscopy (FESEM, JEOL JSM-7500F, Japan) and transmission electron microscopy (JEOL 2100 HRTEM 200 V, Japan). The optical properties were studied using UV–vis diffuse reflectance spectroscopy (UV–vis DRS) coupled with UV–vis Spectrophotometer Cary 60 UV–vis spectrophotometer (Malaysia).
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7

X-Ray Diffraction for Solid-State Form Analysis

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A PANalaytical X’pert PRO X-Ray Diffractometer (purchased from PANanalytical B.V., Almelo, Netherlands) consisting of a θ/θ goniometer and a solid state PIXcel detector was used for solid-state form identification and verification. The radiation was nickel-filtered CuKα (λ = 1.5418 Å) generated at a tube voltage of (45 kV) and current (40 mA), respectively. The samples were scanned in reflection mode between 5° and 35° with a scan speed of 0.06734° 2θ and a step size of 0.0263° 2θ. The data were analysed using the X’Pert Data Collector software (PANalytical, Almelo, Netherlands). The measurements were done in triplicate. The variable temperature-XRPD measurements were all performed using a steel sample holder (0.2 mm in depth) on an Anton Paar CHC chamber (Anton Paar GmbH, Graz, Austria). The temperature was controlled using a TCU 110 Anton Paar GmbH controller. A scan speed of 0.328 was used for NF and TP temperature measurements. For NF MH II the measurement was performed at room temperature then the temperature was ramped to 120 °C at 35 °C/min and held for 120 mins with an exposure time of 10 mins. For TP MH, the temperature was raised to 50 °C at the same heating rate and held for 90 minutes. The particle size that was used for the temperature measurements were between 50–150 μm.
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8

Magnetically Enhanced Enzyme Immobilization

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The strong magnetic properties of nanoparticles assist in the efficient recovery of the immobilised enzyme. To increase the saturation magnetisation of nanoparticles, zinc was doped into magnetite for the present study. Magnetic nanoparticles were synthesised using a hydrothermal method. To achieve this, aqueous solutions of iron(III) chloride hexahydrate (FeCl3.6H2O), iron(II) chloride tetrahydrate (FeCl2.4H2O) and zinc chloride (ZnCl2) were mixed in a molar ratio of Fe3+:Fe2+:Zn2+ = 2.0:0.6:0.4. An aqueous sodium hydroxide (NaOH) solution was subsequently added to neutralise the pH. The precipitates were subjected to hydrothermal treatment at 150°C for 12 h, followed by repeated rinsing with deionised water and freeze-drying at -80°C and 0.014 mbar for 24 h.
The crystalline structure of the nanopowder was characterised using an X’Pert pro X-ray diffractometer (Pan-Analytical, The Netherlands) with Cu K-alpha radiation (40 KV, 30 mA). The morphology of the synthesised particles was characterised by transmission electron microscopy (TEM) using a JEOL 2100 M microscope (JEOL, Japan) with an electron beam energy of 200 kV. The magnetic hysteresis of the particles was measured using a semiconductor quantum interference device magnetometer (Quantum Design Inc., San Diego, CA, USA) at room temperature.
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9

Quantifying Coralline Algae Mineralogy

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At the end of the experiment, crusts and erect thalli of coralline macroalgae were removed from the plates by scraping with a scalpel. Samples were bleached to remove organic material, rinsed and dried. They were ground to a fine powder in an agate mortar with 0.1 g NaCl as an internal XRD standard, spread out and dried on a glass slide to randomize crystallite orientation. Each slide was run through a PAN Analytical X'Pert PRO X-ray diffractometer at a scan speed of 0.02571 °2 θ, over the range of 26 to 33 °2 θ. Peak heights (in counts) and positions (in °2 θ) were determined using X'Pert Data Collector and High Score data processing. The halite peak position was standardized to 31.72 °2 θ, and other peak positions corrected. The percent Mg in the calcite by dry weight was calculated from calcite peak position (in °2 θ) using the equation y = 30x−882 [38 ]. Each spectrum and the locations of ragged peaks were visually inspected and confirmed. Relative peak height counts (ht) of aragonite (A1 at 26.213 °2 θ and A2 at 27.216 °2 θ) and calcite (C1 at 29.4 to 29.8 °2 θ) were used to calculate Peak Height Ratio (PR) for each graph: PR = (ht A1 + ht A2)/(ht A1 + ht A2 + ht C1). Wt% calcite was calculated using the calibration of [39 ]: Wt % Calcite = 80.4 (PR)2–180.9 (PR) + 101.2. This method assumes that only calcite and aragonite are present.
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10

Crystallinity Index of Cellulose Samples

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X-ray diffraction patterns of α-cellulose and Avicel samples were recorded with an X’Pert PRO X-ray diffractometer (PANanalytical) at room temperature from 10 to 60 °C, using Cu/Kα irradiation (1.542 Å) at 45 kV and 40 mA. The scan speed was 0.021425° s−1 with a step size of 0.0167°. Crystallinity index (CrI) was calculated using the peak intensity method [49 (link)]: CrI=I002-Iam/I002×100, where I002 is the intensity of the peak at 2θ = 22.5° and Iam is the minimum intensity, corresponding to the non-crystalline content, at 2θ = 18°.
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