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N storm inverted tirf microscope

Manufactured by Nikon

The N-STORM inverted TIRF microscope is a high-resolution imaging system designed for advanced fluorescence microscopy applications. It utilizes total internal reflection fluorescence (TIRF) illumination to selectively excite fluorophores near the coverslip-sample interface, enabling high-contrast imaging of cellular structures and dynamics. The N-STORM microscope is capable of achieving single-molecule localization and super-resolution imaging, providing researchers with a powerful tool for exploring the nanoscale features of biological samples.

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2 protocols using n storm inverted tirf microscope

1

STORM Imaging of Lipid Assemblies

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Mixtures of PC-C12 (19 μM) and 5CB were used for STORM. ATTO 488-labeled PE-C14 (10 % mol/mol based on PC-C12) was also doped into the mixture as a fluorescent probe for STORM imaging50 . Optical cells were prepared by using polyimide-coated #1.5 coverslips. Imaging was carried out on a Nikon N-STORM inverted TIRF microscope with 405 nm and 488 nm laser excitation. Images were collected with an Andor iXon Ultra 897 EMCCD camera and controlled through NIS-Elements Ar software with N-STORM analysis. Images were acquired after an initial 1 min pre-exposure (to allow the transition of the majority of fluorophores into a meta-stable dark state) followed by a 5–10 min acquisition period at 17 ms/frame. The apparent widths of the assemblies formed in LC defects were determined by measuring the full width at half maximum (FWHM) of the assemblies.
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2

STORM Imaging of Lipid Assemblies

Check if the same lab product or an alternative is used in the 5 most similar protocols
Mixtures of PC-C12 (19 μM) and 5CB were used for STORM. ATTO 488-labeled PE-C14 (10 % mol/mol based on PC-C12) was also doped into the mixture as a fluorescent probe for STORM imaging50 . Optical cells were prepared by using polyimide-coated #1.5 coverslips. Imaging was carried out on a Nikon N-STORM inverted TIRF microscope with 405 nm and 488 nm laser excitation. Images were collected with an Andor iXon Ultra 897 EMCCD camera and controlled through NIS-Elements Ar software with N-STORM analysis. Images were acquired after an initial 1 min pre-exposure (to allow the transition of the majority of fluorophores into a meta-stable dark state) followed by a 5–10 min acquisition period at 17 ms/frame. The apparent widths of the assemblies formed in LC defects were determined by measuring the full width at half maximum (FWHM) of the assemblies.
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