A thin conductive coating of gold was spurted to the polished sections prior to examination in the SEM. The SEM used was FEI Quanta 400F, equipped with an energy-dispersive spectrometer, wavelength-dispersive X-ray spectroscopy, and backscattering electron diffraction. The FEI Quanta 400F was operated under high vacuum mode with gaseous backscatter electron detector. Scanning electron micrographs of the material interfaces were captured at ×500. Quantitative elemental analysis of the products was done by EDX. Lines parallel to the interface at increasing incremental distances of 50 μm up to 400 μm were scanned and spectra collected were used to draw atomic ratio plots.
Fei quanta 400 f
The FEI Quanta 400 F is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a field emission electron source, which provides improved resolution and lower charging effects compared to traditional SEMs. The Quanta 400 F is capable of operating in high-vacuum, low-vacuum, and environmental modes, allowing for the examination of both conductive and non-conductive samples.
6 protocols using fei quanta 400 f
Interfacial Analysis of Pulp Chamber
A thin conductive coating of gold was spurted to the polished sections prior to examination in the SEM. The SEM used was FEI Quanta 400F, equipped with an energy-dispersive spectrometer, wavelength-dispersive X-ray spectroscopy, and backscattering electron diffraction. The FEI Quanta 400F was operated under high vacuum mode with gaseous backscatter electron detector. Scanning electron micrographs of the material interfaces were captured at ×500. Quantitative elemental analysis of the products was done by EDX. Lines parallel to the interface at increasing incremental distances of 50 μm up to 400 μm were scanned and spectra collected were used to draw atomic ratio plots.
Nanosphere Size and Morphology Analysis
Characterizing Coptidis Rhizoma Extract
Comprehensive Material Characterization
Visualization and Characterization of Ablated Microchannels
Scanning Electron Microscopy of Biomass
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