The prepared self-assembled fullerene nanomaterials (before and IPA after washing) were characterized by powder X-ray diffraction (RINT2000 diffractometer, Rigaku, Tokyo, Japan, with Cu-Kα radiation (λ = 0.1541 nm, scanning electron microscopy (SEM: Model SU-8000, Hitachi Tokyo, Japan) which was operated at 10 kV), transmission electron microscopy (TEM, Model JEM-2100F operated at 200 kV, JEOL, Tokyo, Japan), Raman scattering spectroscopy (T64000, Jobin-Yvon Edison, Edison, NJ, USA) at a wavelength of 514.5 nm and Fourier transform infrared (FT-IR) spectroscopy (model 4700 instrument, Nicolet, Walthan, MA, USA). For the preparation of SEM samples, a dilute suspensions of fullerene crystals in IPA were drop casted on a clean silicon wafer and dried at 80 °C for 6 h. All the SEM samples were coated with platinum (~2 nm) by sputtering using a Hitachi S-2030 ion coater. TEM samples were prepared by dropping suspensions of fullerene crystal onto standard carbon-coated copper grids. TEM samples were dried at 80 °C in vacuum for 24 h.
Model jem 2100f
Manufactured by JEOL
Sourced in Japan
The JEOL Model JEM-2100F is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials. It features a field emission gun (FEG) electron source, providing a high-brightness electron beam for enhanced resolution and contrast. The JEM-2100F is capable of achieving a point resolution of 0.23 nm, allowing for detailed observation of nanostructures and thin films.
Automatically generated - may contain errors
Lab products found in correlation
Supra 55vp fesem, by Zeiss (2 mentions)
Rint2000 diffractometer, by Rigaku (1 mentions)
Jem arm300f, by JEOL (1 mentions)
Vega3, by TESCAN (1 mentions)
Model h 800, by Hitachi (1 mentions)
Model d max ra, by Rigaku (1 mentions)
Physica mcr 301, by Anton Paar (1 mentions)
Escalab 250xi spectrometer, by Thermo Fisher Scientific (1 mentions)
Jsm 7600f, by JEOL (1 mentions)
Spectrum two ft ir spectrometer, by PerkinElmer (1 mentions)
X pert mpd diffractometer, by Philips (1 mentions)
V 770 spectrophotometer, by Jasco (1 mentions)
Quantaurus qy absolute pl quantum yield spectrometer, by Hamamatsu Photonics (1 mentions)
Verios g4 uc, by Thermo Fisher Scientific (1 mentions)
Miniflex 2, by Rigaku (1 mentions)
Zetasizer nano zs90, by Malvern Panalytical (1 mentions)
10 protocols using model jem 2100f
1
Characterization of Fullerene Nanomaterials
2
Morphological Examination of FOS-Loaded Niosomes
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The morphologic examinations of selected FOS-loaded niosomes with or without γCD were performed using the TEM technique. Initially, the sample was placed on a formvar-coated grid. After blotting the grid with a filter paper, the grid was transferred onto a drop of negative stain. Aqueous 1% phosphotungstic acid solution was used as a negative stain. The sample was air dried at room temperature and finally the samples were examined by TEM (Model JEM-2100F, JEOL, Peabody, MA, USA).
3
Comprehensive Characterization of Novel Materials
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The X-ray diffraction (XRD) patterns were collected by a powder X-ray diffractometer (Rigaku SmartLab 9kW-Advance) with Cu K irradiation source at a rate of 20° min -1 . The Raman spectra were recorded using a Renishaw Micro-Raman Spectroscopy System, with an excitation wavelength of 532 nm and intensity of 0.5 mW. A TESCAN VEGA3 field emission scanning electron microscope (SEM) were used to observe the micromorphology of samples. High resolution transmission electron microscopy (TEM) images and were acquired via a JEOL-Model-JEM-2100F field emission electron microscope at an accelerating voltage of 200 kV. Cs-corrected TEM images, energy dispersive X-ray spectroscopy (EDX), electron energy loss spectroscopy (EELS), and the elemental mapping were carried out on a JEOL JEM-ARM300F operating at 300kV. The specific surface areas were measured by the N2 adsorption-desorption isotherms at 77.35 K and calculated using the Brunauer-Emmett-Teller (BET) method. The oxidation states of surface elements were identified through X-ray photoelectron spectroscopy (XPS) using a Nexsa XPS system. The spectra were fitted using the XPSPEAK41 software, and the different valent species were quantified by the peak area.
4
Characterization of Ni-Al LDH and Composites
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Field-emission scanning electron microscopy (FE-SEM) (Model JSM-2010, JEOL) was used to observe the morphology of Ni-Al LDH sheet and SiO2@Ni-Al LDH composites. Transmission electron microscopy (TEM) (Model H-800, Hitachi, Tokyo, Japan) was performed to analyze the morphology of Ni-Al LDH sheets and SiO2@Ni-Al LDH composites. Scanning transmission electron microscopy (STEM) (Model JEM 2100 F, JEOL) was carried out to characterize the distribution of the elements. X-ray photoelectron spectroscopy (XPS) tests were measured using an ESCALAB MK-II electron spectrometer with an Al Kα X-ray source. X-ray diffraction (XRD) (Model DMax/rA, Rigaku, Japan) was performed using a rotating anode X-ray diffractometer with Cu Kα radiation (λ = 0.154 nm) at 40 kV. The ER characteristics were examined using a rotational rheometer (Physica MCR301, Anton Paar) equipped with a coaxial cylinder.
5
Characterization of Carbon Quantum Dots
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Transmission Electron Microscopy (TEM) (Model JEM-2100F, 200 kV, Japan Electron Optics Laboratory Ltd.) was adopted to characterize the morphology and size distribution of the as-prepared carbon quantum dots. X-ray Photoelectron Spectroscopy (XPS) analysis was performed using a Thermo Fisher Scientific Escalab 250XI spectrometer with a monochromatic X-ray source Al Kα excitation (1486.6 eV). The fluorescence excitation and emission spectra, the UV-vis absorption spectra, as well as the quantum yield were measured using the multifunctional fluorescence spectrophotometer (FS5) from Techcomp (China) Ltd. The samples were put in a quartz fluorescence cuvette with 10 mm optical path length. The samples were excited by the light with wavelength of 440 nm, and the emission spectrum was recorded in the range of 480 to 680 nm. The excitation and emission slit width were fixed at 1 nm and 2 nm, respectively.
6
Transmission Electron Microscopy Evaluation
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The morphology of the samples was evaluated using a TEM (Model-JEM2100F, Japan Electron Optics Laboratory (JEOL), Tokyo, Japan) at 80 K. Sample was mounted on carbon grids and negatively stained with phosphotungestic acid (2% w/v) [30 (link)].
7
Nanomaterial Characterization by FE-SEM and TEM
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The FE-SEM
images were captured using the JEOL JSM-7600F model with an accelerator
voltage of 10 kV to determine the elemental analysis and the surface
morphology of the prepared nanocomposites. The TEM images were taken
using the JEOL JEM-2100F model to determine the crystallinity, shape,
and size of the prepared products.
images were captured using the JEOL JSM-7600F model with an accelerator
voltage of 10 kV to determine the elemental analysis and the surface
morphology of the prepared nanocomposites. The TEM images were taken
using the JEOL JEM-2100F model to determine the crystallinity, shape,
and size of the prepared products.
8
Comprehensive Characterization of Perovskite Nanocrystals
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SEM was measured with Verios G4 UC (FEI) and UPS spectra were collected using a photoelectron spectrometer (Thermo FisherScientific Theta Probe) with a He I (21.22 eV) ultraviolet source in Hanyang LNC 3.0 Analytical Equipment Center (Seoul). PLQY measurement was conducted with a Quantaurus‐QY Absolute PL quantum yield spectrometer (HAMAMATSU) equipped with an integrating hemisphere, and samples were excited at the wavelength of 365 nm. Steady‐state PL measurements were carried out using a pulsed xenon lamp. And time‐resolved PL decay measurements were carried out using a He–Cd laser operating at a wavelength of 375 nm. For PeLEDs, J–V–L characteristics and device performances were measured using a Konica Minolta spectroradiometer (CS‐2000) with a Keithley 2450 sourcemeter. XRD patterns were measured using an X'Pert‐MPD diffractometer (Philips, Netherlands) employing CuKα radiation. UV–vis absorption spectra were measured by a V‐770 spectrophotometer (JASCO). TEM samples were prepared by diluted QD solution in hexane dropped on a carbon grid. TEM was measured with the JEM‐2100F model (JEOL). The Fourier transform infrared (FT‐IR) was recorded on PerkinElmer Spectrum Two FT‐IR Spectrometer.
9
Characterization of Electrodeposited Ni-based Catalysts
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The FE-SEM images were recorded on Carl Zeiss SUPRA 55VP FESEM. The XRD measurements were performed on a PANalytical X’PERT PRO instrumenthaving Cu Kα = 1.54059 Å radiation. XPS measurements were carried out in a photoelectron spectrometer from VSW Scientific Instruments, by mounting the vacuum dried samples on copper stubs with silver paste and irradiating with Al Kα radiation (1486.6 eV). The base pressure was maintained at 5 × 10–10 mbar. The XPS data were fitted with fityk software. XRD measurements were performed with a Rigaku (mini flex II, Japan) powder X-ray diffractometer with Cu Kα = 1.54059 Å radiation. HR-TEM images were obtained by UHR-FEG-TEM, JEOL, JEM 2100 F model using 200 kV electron source. Samples were electrodeposited on FTO substrates and samples were prepared by scratching off NiFe and NiMo from the FTO surface and drop casting the ethanol solutions onto Cu-grids. Electrical conductivity measurements were performed using standard 4-probe technique on a 0.5 × 0.5 cm2 sized Ni-P or Ni-CF electrodes.
10
Characterization of CeO2 Nanoparticles
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The hydrodynamic diameter and zeta potential of NPs in solution were measured by using a Malvern Zetasizer (Nano ZS90). Field emission gun transmission electron microscopy (FEG-TEM) using a JEOL (JEM 2100F model) with a 200 kV electron source was used to conrm the primary size and morphology of CeO 2 nanoparticles. CeO 2 NPs were sonicated for 30 minutes and drop casted on a carbon-coated 300 mesh copper grid to obtain TEM images. Field emission scanning electron microscope (Carl Zeiss SUPRA 55VP FESEM) monographs were obtained by drop-casting the bentonite clay suspension on a silicon wafer, having a concentration of 80 mg L À1 dispersed in Milli-Q water.
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