Fei quanta 200 instrument
The FEI Quanta 200 Instrument is a scanning electron microscope (SEM) that provides high-resolution imaging and analysis of surface structures and compositions of a wide range of samples. The instrument utilizes an electron beam to scan the surface of the sample, generating detailed images and data about the sample's characteristics.
Lab products found in correlation
2 protocols using fei quanta 200 instrument
Cell Morphology Analysis Protocol
Surface Characterization of Glasses
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