SEM and EDS measurements were carried out on a Philips XL30 FEG SEM with an attached EDAX CDU LEAP EDS detector. To analyse template-freed Bi nanotubes, the membranes were dissolved using dichloromethane (DCM). This was done by placing the sample on a Si wafer piece and applying a drop of DCM to fix it, before placing it in DCM for several hours until the solvent was evaporated.
TEM measurements were performed on 70 nm thin microtome cuts of the metallised membranes. Prior to cutting, samples were embedded in Araldite® 502 resin (polymerization for 16 h at 60 °C). The obtained slices were placed on Cu-grids and analysed in a FEI CM20 TEM at an acceleration voltage of 200 kV.
XRD analysis was carried out on as-fabricated samples using a Seifert XRD 3003 PTS diffractometer with a Cu anode (40 kV, 40 mA). The Cu Kα radiation (λ ≈ 154.2 pm) is separated by a graphite monochromator and collimated on the secondary side using a long Soller slit. All measurements were performed in θ/2θ-geometry.
All UV-Vis measurements were performed on a VWR UV-3100PC spectrophotometer using Quartz-cuvettes. Due to their strong absorbance in the UV-range, Bi(iii ) containing solutions were diluted with water in a 1 : 100 ratio prior to the measurements.
TEM measurements were performed on 70 nm thin microtome cuts of the metallised membranes. Prior to cutting, samples were embedded in Araldite® 502 resin (polymerization for 16 h at 60 °C). The obtained slices were placed on Cu-grids and analysed in a FEI CM20 TEM at an acceleration voltage of 200 kV.
XRD analysis was carried out on as-fabricated samples using a Seifert XRD 3003 PTS diffractometer with a Cu anode (40 kV, 40 mA). The Cu Kα radiation (λ ≈ 154.2 pm) is separated by a graphite monochromator and collimated on the secondary side using a long Soller slit. All measurements were performed in θ/2θ-geometry.
All UV-Vis measurements were performed on a VWR UV-3100PC spectrophotometer using Quartz-cuvettes. Due to their strong absorbance in the UV-range, Bi(