D8 advance txs xrd
The D8 Advance TXS XRD is an X-ray diffraction (XRD) instrument designed for materials analysis. It provides accurate phase identification and quantification of crystalline materials. The system features a high-intensity X-ray source, a precise goniometer, and advanced detector technology to deliver reliable and reproducible results.
Lab products found in correlation
2 protocols using d8 advance txs xrd
Characterization of BP2TPANs Molecules
Comprehensive Characterization of PW and DW
of the samples was carried out by TEM (FEI-Talos F200S, USA) and SEM
(Hitachi, S4800) equipped with an EDX detector for elemental analysis.
The chemical components of PW and DW were measured through FT-IR (PerkinElmer,
USA) in the wavenumber range of 600–4000 cm–1. XRD was implemented on a Bruker D8 Advance TXS XRD instrument with
1.5418 Å) at a scan rate (2θ) of 4° min–1 and a scan range from 5 to 85°. XPS measurements were performed
using a Thermo Scientific ESCALAB250 spectrometer (Thermo VG, USA)
with a dual Al Kα X-ray source. A Raman spectrometer (LabRAM
HR Evolution, Horiba, JPN) test was carried out in the spectral range
of 0–2000 cm–1. The pore properties of the
carbon materials were studied by N2 adsorption–desorption
experiment measurements at 77 K (3H-2000PS2 unit, Beishide Instrument
S&T Co., Ltd.).
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