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D8 advance txs xrd

Manufactured by Bruker

The D8 Advance TXS XRD is an X-ray diffraction (XRD) instrument designed for materials analysis. It provides accurate phase identification and quantification of crystalline materials. The system features a high-intensity X-ray source, a precise goniometer, and advanced detector technology to deliver reliable and reproducible results.

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2 protocols using d8 advance txs xrd

1

Characterization of BP2TPANs Molecules

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NMR spectrum was recorded on Bruker AMX-400 NMR spectrometer or Bruker AVANCE III HD600 600 MHz NMR instrument in deuterated solvent at room temperature. High-resolution mass spectrometry (HRMS) was performed on Bruker Daltonics ULTRAFLEXTREME MALDI-TOF/TOF mass spectrometer. UV-vis absorption and emission measurements were performed on a TU-1901 UV-vis spectrophotometer and a Perkin-Elmer LS 55 luminescence spectrometer, respectively. X-ray diffraction (XRD) measurements were carried out using Bruker D8 Advance TXS XRD with Cu Kα radiation at room temperature. Thermogravimetric analysis (TGA) and differential scanning calorimetric (DSC) measurements were conducted on TGA Q5000 V3.13 Build 261 instrument and Netzsch DSC 200 F3 under nitrogen at a heating and cooling rate of 5 °C min−1, respectively. Emission quantum yields (ΦF's) of BP2TPANs in solvents were estimated by using quinine sulfate (ΦF = 54% in 0.1 N H2SO4) as standard, while solid-state efficiencies were determined using an integrating sphere. The ground-state geometries were optimized using the density functional with B3LYP hybrid functional at the basis set level of 6-31G(d). All calculation were performed using the Gaussian 09 package.
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2

Comprehensive Characterization of PW and DW

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The morphology
of the samples was carried out by TEM (FEI-Talos F200S, USA) and SEM
(Hitachi, S4800) equipped with an EDX detector for elemental analysis.
The chemical components of PW and DW were measured through FT-IR (PerkinElmer,
USA) in the wavenumber range of 600–4000 cm–1. XRD was implemented on a Bruker D8 Advance TXS XRD instrument with S5 Cu Kα (target) radiation (λ =
1.5418 Å) at a scan rate (2θ) of 4° min–1 and a scan range from 5 to 85°. XPS measurements were performed
using a Thermo Scientific ESCALAB250 spectrometer (Thermo VG, USA)
with a dual Al Kα X-ray source. A Raman spectrometer (LabRAM
HR Evolution, Horiba, JPN) test was carried out in the spectral range
of 0–2000 cm–1. The pore properties of the
carbon materials were studied by N2 adsorption–desorption
experiment measurements at 77 K (3H-2000PS2 unit, Beishide Instrument
S&T Co., Ltd.).
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