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Alpha p ft ir spectrophotometer

Manufactured by Bruker
Sourced in Germany

The Alpha-P FT-IR Spectrophotometer is a compact and versatile laboratory instrument designed for Fourier Transform Infrared (FT-IR) spectroscopy analysis. It provides rapid and reliable infrared spectral data for a wide range of sample types and applications.

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4 protocols using alpha p ft ir spectrophotometer

1

Microencapsulated Phase Change Materials Characterization

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The chemical structures of microPCM and each of its components (i.e., PLA and PA) were analyzed using Fourier transform infrared (FTIR) spectroscopy (Bruker Alpha-P FT-IR Spectrophotometer). The spectra were collected by averaging signals from 32 scans at a resolution of 4 cm−1 in the range of 400–4000 cm−1.
Scanning electron microscopy (SEM) (FEI Company, Quanta 3D FEG) was used to observe the morphologies (i.e., surface features and sphericity) and sizes of microPCM. The fabricated microPCM were sputter coated with gold (Denton Vacuum, Desk V Sputter Coater) before the observation. The particle sizes were obtained by analyzing the SEM micrographs using ImageJ (NIH Image). The interior morphology of microPCM was exposed by microtoming microcapsules using a diamond knife.
The enthalpy of fusion and the melting point of microPCM were determined by a differential scanning calorimetry (DSC) (TA Instrument, DSC Q20). These measurements were performed in the temperature range from 40 to 90 °C at a heating rate of 10 °C min−1. In order to determine the thermal stability of the microPCM, the enthalpy of fusion was analyzed after samples [i.e., the base case (PCM0.6)] were subjected to 50 thermal cycles at the same temperature range and heating rate.
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2

Characterization of Silver Nanoparticles and Composites

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The size and morphology of AgNPs and CA-AgNPs/MWCNTs was determined by using a model JEOL2100 TEM instrument (München, Germany) fitted with a LaB 6 electron gun at 5 kV, and the images were captured using an Ultrascan digital camera (Gatan, München, Germany). Samples were prepared after sonication for 1 h by placing a drop of fresh suspension on the TEM copper grids, followed by solvent drying and evaporation. The surface morphology of the AgNPs was observed using a Quanta FEG 250 Environmental Scanning electron microscope (ESEM, Hillsboro, OR, USA) under an acceleration voltage of 30 kV. Powdered samples were placed on the sample stumps and a thin gold layer was deposited on the samples to improve the electrical conductivity for better imaging. Simultaneously, the energy dispersive spectrum (EDS) was also recorded. FTIR spectroscopy measurements were carried out to identify the functional groups which are bound distinctively on the AgNPs surface and involved in the synthesis of AgNPs. Samples for the FTIR analysis were recorded using an alpha-P FT-IR spectrophotometer (Bruker, Bryanston, Sandton, Gauteng, South Africa.) in the wavenumber range 400–4000 cm−1. Thermal analysis was performed using a TG/DSC SDT600 thermogravimetric analyzer (TA instruments, New Castle, DE, USA) under nitrogen flow.
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3

Spectroscopic and Electrochemical Analysis of Materials

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FTIR measurements of the compounds were carried out using a Bruker alpha-P FTIR spectrophotometer in the wavenumber range of 400–4000 cm−1. The 1H and 13C NMR analyses were carried out using 600 MHz Bruker Avance III NMR spectrometers at room temperature and DMSO was used as solvent.
Electrochemical characterisation techniques such as potentiodynamic polarization (PDP) and electrochemical impedance spectroscopy (EIS) were carried out using Autolab PGSTAT 302N obtained from Metrohm. The make-up of the instrument includes a three electrode system; mild steel, platinum rod and Ag/AgCl with 3 M KCl serving as working, counter and reference electrodes respectively. Surface characterisations of the materials combined with simultaneous elemental characterisation were done using Quanta FEG 250 Environmental scanning electron microscope (ESEM) under an acceleration voltage of 15 kV in high vacuum.
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4

Characterization of Synthesized Nanomaterials

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All chemicals were obtained from Merck chemicals (Darmstadt, Germany) and used without further purification. The 1H and 13C-NMR measurements in dimethyl sulfoxide (DMSO), were obtained using a Bruker Avance III 600 MHz (Billerica, MA, USA). Elemental C, H, N, and S (in %) analyses were obtained using an Elementar Vario EL Cube (Langenselbold, Germany), while the infrared spectra were recorded on a Bruker Alpha-P FTIR spectrophotometer. The crystalline phases of the synthesized materials were identified using X-ray diffraction (XRD) measurements at a scanning rate of 0.0018 °/min, using a Rőntgen PW3040/60 X’Pert Pro XRD (Shanghai, China) diffractometer which is equipped with a nickel filtered Cu Ka radiation (k = 1.5418 Å) at room temperature. The UV-Vis-NIR spectra were obtained from a Jobin Yvon LabRAM HR 800 UV-VIS-NIR (Horiba, Edison, NJ, USA) spectrophotometer in toluene. The morphology of the nanoparticles was characterized using a TECNAI G2 (ACI) TEM (Hillsboro, OR, USA) with an accelerating voltage of 200 kV.
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