Jem 2000fx electron microscope
The JEM 2000FX is an electron microscope designed for high-resolution imaging and analysis of materials. It is capable of operating in transmission electron microscopy (TEM) mode, providing detailed information about the internal structure and composition of samples at the nanoscale level.
2 protocols using jem 2000fx electron microscope
Transmission Electron Microscopy Protocol
Characterization of Composite Nanochains
Analysis by XRD was performed using a Siemens D-5000 with monochromatic Cu Kα radiation (λ = 1.540562 Å), and EDX measurements were collected using an Oxford EDX attached to the TEM microscope to confirm the structure. All extinction spectra were recorded at room temperature on a Cary 50 Scan UV–visible spectrometer over the wavelength range of 250–1100 nm. The magnetic properties of the nanochains were obtained using a SQUID magnetometer with fields up to 5 T. The temperature-dependent magnetization curves varying between 5 and 400 K were measured in an applied magnetic field of 100 Oe.
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