Empyrean xrd diffractometer

X-ray diffraction (XRD) was used to ascertain the structure of the SSD-based mixtures. With the use of a PANalytical Empyrean XRD diffractometer, we analyzed the XRD. There was a Cu anode with a K_α of 1.54 Å, an X-ray voltage of 45kV, and a tube current of 40 mA. Data for X-ray diffraction were gathered at a scan rate of 1°/min across a 2 range of 5°–90°.

The mineralogical composition in the homogenous powder was analyzed with a Panalytical Empyrean XRD diffractometer equipped with a monochromator and a 1D Pixel detector. XRD measurements were carried out with Cu Kα radiation operating at 40 kV and 40 mA. Spectra were collected over a 2θ range of 5–70° in 0.013 steps with a scan speed of 0.16° s^–1 resulting in a total scan time of 7 min. All samples were measured using a standard sample holder except samples having insufficient mass (CRY1, CRY2) were measured using a silicon crystal sample holder. Spectra were analyzed using a Bruker DiffracEVA software by comparing with PDF2 patterns.