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Jem 2100 high resolution transmission electron microscope

Manufactured by JEOL
Sourced in Japan

The JEM-2100 is a high-resolution transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-quality imaging and analysis capabilities for a wide range of materials and applications. The JEM-2100 features a LaB6 electron source, advanced optics, and a robust design to ensure reliable performance and high resolution.

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20 protocols using jem 2100 high resolution transmission electron microscope

1

Phage Lysate Production and Characterization

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Phage lysate produced from plate cultures of phage P7_Pc was used to prepare high-titer phage lysate (>1 × 1010 PFU/mL) using PEG precipitation. Forty milliliters of phage lysate was added to an SS-34 Oakridge tube, and 10 mL of 20% PEG 8000 (wt/vol)–2.5 M NaCl was added to the same tube. Next, the tube was incubated on ice for >30 min and centrifuged at 11,000 × g for 20 min to spin down the phage. The supernatant was removed using a micropipette, and the centrifugation step was repeated 2 to 3 times to remove any remaining PEG solution. The resulting pellet was resuspended in 1 mL of Sodium chloride-Tris-EDTA buffer (STE) buffer and transferred into a clean microcentrifuge tube. Then, it was centrifuged at 14,000 × g for 10 min and the supernatant was collected into another sterile microfuge tube. The phage lysate was stored at 4°C until further analysis.
The TEM grid (a holey carbon-coated Cu grid, 400 mesh size) was placed on 10 μL of the PEG-precipitated phage suspension and held for 5 to 6 min, followed by a staining step using 1% ammonium molybdate (wt/vol) for 30 s. The grids were observed using a JEOL-JEM-2100 high-resolution transmission electron microscope at the Electron Microscopy Facility of Sri Lanka Institute of Nanotechnology at 120 kV to determine the morphological characteristics of P7_Pc.
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2

Density-Optimized Nanoparticles for Gamma Ray Shielding

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Bi2O3-NPs, WO3-NPs, BaO-NPs, and Zr2O3-NPs were chosen due to their higher density, as follows: 8.90, 7.16, 5.72, and 5.68 g·cm−3. As well, they have high absorption points (k-edges) at different energies, and NPs have higher homogenous distribution than the MPs inside the SR. These reasons improve the prepared SR samples against gamma ray radiations. TEM-images of presented NPs were performed using JEOL JEM-2100 high-resolution transmission electron microscope (JEOL, Ltd., Tokyo, Japan) at an accelerating voltage of 200 kV as shown in Figure 1 and the obtained properties of presented NPs were tabulated in Table 1. The average size of PbO-microparticles replaced with nanoparticles was 40 μm, its purity was 98.8%, it had 1.2% impurities and was purchased from EPPCO, in Al Arbaeen, Suez Governorate, Egypt.
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3

Characterization of Mg-Al Layered Double Hydroxide

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UV-vis absorption spectra were obtained on a UV 3600 spectrophotometer (Shimazu, Japan).Fourier transform infrared (FTIR) spectra were collected on a Nicolet 6700 FTIR spectrometer (Nicolet, USA).X-ray diffraction (XRD) measurement was performed on a XRD-6000 diffractometer (Shimadzu, Japan), using Cu Kα radiation (λ = 1.5418 Å) with a scan rate 2 deg/min. Scanning electron microscopy (SEM) images were obtained on a Hitachi S-4800 field-emission scanning electron microscope (Hitachi, Japan).Transmission electron microscopy (TEM) images were collected with a JEM-2100 high-resolution transmission electron microscope (JEOL, Japan). The molar ratio of Mg2+/Al3+ in Mg-Al-LDH was determined by an optima 5300DV inductively coupled plasma atomic emission spectroscopy (ICP-AES, Perkin Elmer, USA). Thermogravimetry- differential scanning calorimetry (TG-DSC) analysis was performed on a STA 449C thermal analyzer (Netzsch, Germany) under the air flow with a heating rate of 10 K/min. The N2 adsorption-desorption experiment was carried out by Micromeritics ASAP 2010 (Micromeritics, USA) at 77 K. Specific surface area of Mg-Al-LDH nanoflowers was calculated according to the Brunnauer-Emmett-Teller (BET) method.
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4

Comprehensive Materials Characterization Protocol

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Powder XRD crystallogram was recorded using X-ray BRUKER D8 Advance X-ray diffractometer with Cu Kα source (λ = 1.5406 Å). JEOL JEM 2100 high resolution transmission electron microscope (HRTEM) was used for imaging, SAED pattern and energy dispersive X-ray pattern with an accelerating voltage of 200 KV at different magnification. Raman spectroscopy analysis was carried out using Thermo Scientific DXR2. Diffuse reflectance spectra were recorded using JASCO V-670 UV-Vis spectrophotometer. The photoluminescence (PL) spectra were obtained using HITACHI F-7000 fluorescence spectrophotometer. XPS data was acquired using Kratos Axis Ultra 165 spectrometer with a monochromated Al Kα X-ray source (hα = 1486.6 eV).
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5

Thermal Stability and Microstructure Analysis

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The thermal stability of the sample was measured by the TGA/SDT-851 differential thermal analyzer of Mettler Toledo, Switzerland; the phase of the sample was measured by the 3271 X-ray fluorescence spectrometer of Kokosha Co., Ltd. of Japan; Quanta-chrome of the United States was used. The AUTOSORB-1-MP adsorption instrument is used to determine the pore structure of the sample; the JEOL JEM-2100 high-resolution transmission electron microscope is used to determine the microstructure and other information of the sample.
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6

Comprehensive Characterization of Carbon Nanobubbles

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A JEOL JEM-2100 high-resolution transmission electron microscope (HRTEM) was used to observe the microscopic morphologies of CNBs. A NETZSCH STA 449 F3 Jupiter/Nicolet 6700 (TGA/FT-IR) system was used to obtain the thermogravimetric analysis (TGA) curve and the three-dimensional FT-IR profile. Elemental analysis results of the pre-CNBs were obtained using an Elementar Vario EL III. X-ray photoelectron spectroscopy (XPS) spectra of the CNBs were recorded using an ESCALAB 250 XPS. Powder XRD analysis was performed using a SmartLab of Rigaku Corporation. The Raman spectrum of the CNBs was recorded on a Horiba HR 800 Raman system. FT-IR spectra were recorded using a Nicolet 6700 FT-IR spectrometer. The laser confocal fluorescence microscopy (LCFM) images were obtained on a Leica TCS/SP5 system. The time-resolved fluorescence decay curve of the CNBs was also measured on the Leica TCS/SP5 at an excitation wavelength of 405 nm. Photoluminescence (PL) spectra were measured on a Varian Cary Eclipse spectrophotometer. The UV-vis absorption spectrum was recorded on a Lambda 950, PerkinElmer. The electrochemical measurements were performed on a CHI760E electrochemical workstation. The mechanical properties of the CNBs/TPU conductive fibers were investigated using an ETM503C universal strength tester. All the measurements were carried out at room temperature.
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7

Analytical Techniques for Material Characterization

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All chemicals of high grade of purity were obtained from Sigma-Aldrich (St. Louis, MA, USA).All solutions were prepared with double distilled water. Analyses, qualitative and quantitative measurements involved the use of the following tools and systems: WARING COMMERCIAL Lab Blender (Dynamics Corp. of America, New Hartford, CT, USA), Hei-VAP Rotary evaporator (Heidolph, Germany),1260 Infinity II LC System (Agilent, USA),Ultrasonic homogenizer model 150/vt (Biologics Inc. Cary, North Carolina), UV-Visible Spectrophotometer (JASCO, Japan), FT/IR-4100 Spectrometer (JASCO, Japan), X’Pert PRO X-ray Diffraction System (PANalytical, Netherland), JEM-2100 High Resolution Transmission Electron Microscope (JEOL Ltd, Japan), Cellstar 96-well plate (Greiner Bio One International, Austria) and MR-96A microplate reader (Shenzhen Mindray Bio-Medical Electronics Co., Ltd, China).
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8

TEM Analysis of Diluted Samples

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A 200-mesh copper specimen grid coated with film was used to hold 20 Âµl of diluted samples for 10 min before the extra liquid was filtered out with filter paper. Next, one drop of 3% phosphotungstic acid was used to stain the grid, and it was given three minutes to dry. After drying, the coated grid was examined with a TEM microscope (JEOL JEM-2100 high-resolution transmission electron microscope). The samples were evaluated using an accelerating voltage of 200 kV, respectively.
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9

Comprehensive Material Characterization

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X-ray diffraction (XRD) measurements were recorded on a Rigaku D/max-2550 PC (Tokyo, Japan) X-ray diffractometer using Cu Ka radiation (λ = 0.15418 nm). Scanning electron microscope (SEM) tests were performed on a Hitachi S-4800 field emission scanning electron microscope (Tokyo, Japan). Transmission electron microscope (TEM) tests were conducted by a JEOL JEM-2100 high-resolution transmission electron microscope (Tokyo, Japan). N2 adsorption-desorption isotherms were determined by Brunauer-Emmett-Teller measurements (BET, Micromeritics ASAP 2020, Norcross, GA, USA). Optical diffuse reflectance spectra were obtained on a UV-Vis-NIR scanning spectrophotometer (Shimadzu UV-2600, Kokyo, Japan) with an integrating sphere accessory.
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10

Comprehensive Nanoparticle Characterization

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The yield prepared its characterizations were investigated to get clear information about size, shape, morphology (using JEOL JEM-2100 high resolution transmission electron microscope (HRTEM, at Alexandria University in Egypt, Model JEOL-JSM-6360LA) crystallinity (using X-ray diffraction analyzer, (JEOL Ltd., Tokyo, Japan), purity using (energy dispersive X-ray (EDX, JEOL Ltd., Tokyo, Japan) and types of bonds attached together (using Fourier-transform infrared at Egypt Japan University of Science and Technology, Alexandria, Egypt)
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