Following gentle rinsing in PlasmaLyte A to remove nonadherent blood elements and fixation in Karnovsky's reagent, a ~1.0 cm length of each flow diverter was cut out of loops leaving the tubing sheath present. These samples were secondarily fixed in osmium tetroxide for 1 h and dehydrated in graded ethanol from 40% to 100%. They were then subjected to critical point drying using a Tousimous Autosamdri‐815 critical point dryer. The stents were then carefully removed from the PVC sheaths, longitudinally hemisected, mounted, and sputter coated with Au/Pd coated for 30–80 s using a Denton Vacuum Desk II sputter coater. A JEOL 6700F field emission scanning electron microscope was then used to take representative 30–2000× micrographs of the flow diverter luminal surfaces.
Vacuum desk 2 sputter coater
Manufactured by Denton
Sourced in United States
The Denton Vacuum Desk II Sputter Coater is a laboratory equipment designed for thin film deposition. It utilizes the sputtering process to apply a thin, uniform metallic or dielectric coating onto a substrate under vacuum conditions.
Automatically generated - may contain errors
Lab products found in correlation
Supra field emission scanning electron microscope, by Zeiss (2 mentions)
6700 f field emission scanning electron microscope, by JEOL (1 mentions)
Jsm 5410 scanning electron microscope, by JEOL (1 mentions)
Sigma fesem, by Zeiss (1 mentions)
Xl30 environmental sem feg, by Thermo Fisher Scientific (1 mentions)
Vega3, by TESCAN (1 mentions)
15 protocols using vacuum desk 2 sputter coater
1
Scanning Electron Microscopy of Flow Diverters
2
SEM Visualization of Nanoparticle Formulations
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A scanning electron microscope (SEM) was used to visualize M13–NL, NL, and DiL–NL. In general, sample suspensions were dried for 3 h at room temperature, glued to holders, and coated with an approximately 15 nm layer of gold using a Denton Vacuum Desk II sputter coater (Moorestown, NJ, USA). Then, the processed samples were imaged at 15 kV by using a Tescan VEGA 3 scanning electron microscope (Tescan Analytics, Fuveau, France) located at the Imaging Core Facility, Georgia State University (Atlanta, GA, USA). For size and zeta-potential characterization, NLs were measured at room temperature using Malvern Zetasiser Nano ZS90 Apparatus (Malvern Instruments, Malvern, UK).
3
Scanning Electron Microscopy of Mouse Organ of Corti
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Mouse organ of Corti samples were fixed in 3 mm calcium chloride, 2.5% glutaraldehyde in 0.1 m cacodylate and allowed to fix overnight. Samples were then rinsed with 0.1 m cacodylate buffer followed by postfixed in 1% osmium tetroxide in 0.1 m cacodylate for 1 h and rinsed in deionized water. The samples were dehydrated through an ethanol series and then placed in 100% dry ethanol. The samples were placed into labeled microprous specimen capsules and loaded into the sample boat of a chilled Polaron E3000 critical point drying unit. The unit was sealed and filled with liquid CO2 under pressure. The CO2 was allowed to gently wash through the chamber and exchange for the ethanol in the tissue. When the exchange was complete, the CO2 was brought to its critical point of 1073 psi and 31°C and allowed to gently bleed away.
The dry samples were mounted on labeled SEM stubs and then coated using a Denton Vacuum Desk II sputter coater with a Gold/Palladium target. The samples were imaged at 10 kV using the lower stage of a Topcon DS130 field emission scanning electron microscope (SEM) and images collected using a Quartz PCI digital image collection system.
The dry samples were mounted on labeled SEM stubs and then coated using a Denton Vacuum Desk II sputter coater with a Gold/Palladium target. The samples were imaged at 10 kV using the lower stage of a Topcon DS130 field emission scanning electron microscope (SEM) and images collected using a Quartz PCI digital image collection system.
4
SEM Analysis of Biofilm Microstructure
5
Scanning Electron Microscopy of Mycobacteria
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Cells of M. bovis BCG Pasteur and M. tuberculosis H37Rv were fixed with 2.5% glutaraldehyde, 0.1 M sodium cacodylate, 0.2 M sucrose, 5 mM MgCl2 pH 7.4 and dehydrated through a graded series of ethanol solutions. Critical point dry was accessed using liquid carbon dioxide in a Toumisis Samdri 795 Critical Point drier (Rockville,MD, USA). Sputter was coated with gold-palladium in a Denton Vacuum Desk-2 Sputter Coater (Cherry Hill, NJ, USA). Samples were examined in a Zeiss Supra Field Emission Scanning Electron Microscope (Carl Zeiss Microscopy, LLC North America), using an accelerating voltage of 5 kV.
6
Stem Xylem Tissue Analysis by SEM
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Stem xylem tissues were analyzed by conventional scanning electron microscopy (SEM) following the protocol of Sun et al. (2011 (link)). Briefly, stem samples were collected and immediately fixed in a formalin glutaraldehyde solution for over 48 h. Then, 1 mm thick xylem segments were cut from 2 cm below the inoculation site of each fixed sample, exposing transverse or longitudinal surfaces. The trimmed xylem segments were dehydrated through an ethanol series, critical-point-dried in a Denton Vacuum DCP-Critical Point Dryer (Denton Vacuum LLC, USA), coated with gold and palladium in a Denton Vacuum Desk II Sputter Coater (Denton Vacuum, Inc., Moorestown, NJ, USA) and finally observed under a SEM (Hitachi S3400N, Hitachi Science Systems, Ltd., Tokyo, Japan) at an accelerating voltage of 8 kV.
7
Microstructural Analysis of C- and BNB-MPC Powders
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The microstructure of C- and BNB-MPC powders were examined using a scanning electron micrography (SEM) according to the method described by Bouvier et al. [25 (link)]. The C- and BNB-MPC powders were chopped at room temperature using an injector blade (71990, Electron Microscopy Sciences, Hatfield, PA, USA). After chopping, the C- and BNB-MPC powders were directly mounted onto a carbon double-sided adhesive tape on microscopy stubs and sputter-coated with palladium using a Denton Vacuum Desk II sputter coater (Denton Vacuum, Moorestown, NJ, USA) for 15 min to avoid the charge buildup under the electron beam. The imaging for obtaining the cross-section of C- and BNB-MPC powders samples were performed using the S-3500N (Hitachi Science Systems Ltd., Tokyo, Japan) version 10-16-2266 (PC) 10-04 (SEM) and was examined by a secondary electron detector operating at 10 kV and at magnification range of ×500 to ×4000 was obtained. The images were produced at Nanotechnology Innovation Center of Kansas State University (Manhattan, KS, USA).
8
Scanning Electron Microscopy of Granules
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Cross sections of granules were made using razor blades and mounted on SEM pedestal using conductive silver epoxy paint (EMS, Hatfield, USA). Samples were then sputter coated with gold (Denton Vacuum Desk II Sputter coater, Denton Vacuum, Moorestown, USA) and observed with a JSM-5410 scanning electron microscope (JEOL, Tokyo, Japan) at a working distance of 40 mm at 10 kV.
9
Particle Morphology Assessment via FE-SEM
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Assessment of particle morphology was completed using Field Emission Scanning Electron Microscopy (Zeiss Sigma FE-SEM; Carl Zeiss, Oberkochen, Germany). Powder was mounted onto a carbon tape-covered aluminum SEM stub (Product 16,111; Ted Pella, Inc.; Redding, CA, United States), and subsequently samples were sputtered with a gold coating (Denton Vacuum Desk II Sputter Coater; Denton, Moorestown, NJ, United States) to a thickness of approximately 16 nm. Images were taken at a magnification of 3,000–5,000x.
10
SEM Analysis of MPC Powders
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The microstructure of MPC powders were examined using a scanning electron microscope according to the method described by Mimouni et al. (2010) . The MPC powders were directly mounted onto a carbon doublesided adhesive tape on microscopy stubs and sputter coated with palladium using a Denton Vacuum Desk II sputter coater (Denton Vacuum, Moorestown, NJ) for 15 min to avoid the charge buildup under the electron beam. The imaging was conducted using a S-3500N (Hitachi Science Systems Ltd., Tokyo, Japan) and examined by a secondary electron detector operating at 10 kV.
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