Tecnai g2 tf20
The Tecnai G2 TF20 is a high-resolution transmission electron microscope (TEM) designed for advanced imaging and analysis of materials at the nanoscale. It is capable of producing high-quality, high-resolution images and diffraction patterns of samples.
Lab products found in correlation
11 protocols using tecnai g2 tf20
Characterization of Tribofilm Nanostructures
Morphological Analysis of C. albicans by TEM
Nanoparticle Characterization by DLS and TEM
Negative-Stain TEM of siRNA Complexes
Advanced Characterization of Porous Materials
Cryo-EM Structural Analysis of Protein Samples
Comprehensive Characterization of Nanomaterials
Characterization of Rhenium Oxide Adsorbents
(used IIP), and ReO4–-IIP that has been
reused nine times (reused IIP) were ground into powder using an agate
mortar. FTIR (Nicolet Nexus 670, American Nicolet Co., Ltd., U.S.)
was performed. Then, the FTIR test of the samples was performed to
determine the components using the KBr pressed-disk method, and the
scan wavenumber range was 4000–400 cm–1.
The morphology of the IIP was characterized by SEM (JSM-5600LV, JEOL
Co., Ltd., Tokyo, Japan) and transmission electron microscope (TEM,
TECNAI G2 TF20, FEI Co., Ltd., U.S.).
Analytical Techniques for Material Characterization
Multi-Technique Characterization of Nanomaterials
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