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11 protocols using tecnai g2 tf20

1

Characterization of Tribofilm Nanostructures

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The worn surfaces of the composites were characterized using an optical microscope (U-25ND25, OLYMPUS, T2,Tokyo, Japan). Nanostructures of the tribofilms were imaged with a scanning electron microscope (SEM, 7610F, JEOL, Tokyo, Japan). Additionally, the changes in the chemical states of the tribofilms were analyzed with X-ray photoelectron spectroscopy (XPS, 250Xi, ESCALAB, Waltham, MA, USA). Moreover, slices of the tribofilm were prepared using focused ion beam (FIB) machining (Quanta 3D FEG, FEI, Hillsboro, OR, USA), and the fractured surfaces were then observed via high-resolution transmission electron microscopy (HR-TEM, TecnaiG2 TF20, FEI, Hillsboro, OR, USA).
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2

Morphological Analysis of C. albicans by TEM

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The morphology of C. albicans ATCC 90028 was analyzed using TEM following the standard protocol [28 (link)]. Mid-log phase cells were harvested, standardized (A600 ≈ 0.1) and exposed to MIC of lead inhibitors 3a and 3b for 1 h. Cells were then washed thrice with phosphate buffer solution to remove the residual medium and fixed overnight in 2.5% glutaraldehyde in phosphate/magnesium buffer (40 mM K2HPO4/KH2PO4, pH 6.5–0.5 mM MgCl2). Cells were washed twice for 15 min in 0.1 M sodium phosphate buffer (pH 6.0) and post-fixed for 2 h in 2% osmium tetroxide. Cells were again washed twice for 15 min in distilled water and then en bloc stained with 1% uranyl acetate (aqueous) for 30 min. After two further washes, cells were dehydrated in 95% and 100% ethanol. Cells were then exposed to propylene oxide for 2×10 min and infiltrated for 1 h in 1:1 propylene/epoxy embedding material (Epon) mixture and then overnight in fresh Epon. After polymerization for 48 h at 60°C, ultrathin sections were cut using a microtome (LeicaEM UC6) and transferred to a copper grid. Samples were stained with uranyl acetate (saturated solution of uranyl acetate in 50% alcohol) followed by lead citrate. Samples were washed three times in Milli-Q (MQ) water and dried by touching Whatman filter paper. Sections were examined with a FEI Tecnai G2 TF20 transmission electron microscope at 200 KV.
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3

Nanoparticle Characterization by DLS and TEM

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Nanoparticle size and polydispersity was determined using a Malvern ZEN3600 dynamic light scattering (DLS) instrument with a disposable sizing cuvette. Lyophilization of polymer samples was performed using a Labconco Freezone 4.5. TEM image was obtained on a FEI Tecnai G2 TF20 high resolution TEM operated with an accelerating voltage of 200 kV.
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4

Negative-Stain TEM of siRNA Complexes

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siRNA-amphiphile complexes for negative-stainTEM studies were prepared at 2–10 μM siRNA concentration and a N/P ratio of 20 in ddH2O. In a typical procedure, 10 μL solution containing dendron amphiphiles were added to 10 μL of siRNA solution containing 160 pmol negative control siRNA. The solution was briefly vortexed and incubated at rt for 30 m before imaging. TEM grids (Ultrathin Carbon Type-A, 400 mesh) were glow discharged before use. Sample (8 μL) solution was placed on the grid and allowed to stand for 1 min. The solution was blotted away with a filter paper, while 15 μL of 2% uranyl acetate was pipetted on to the grid from the other side. After 1 min, the staining process was repeated with another 15 μL of 2% uranyl acetate solution. All the solution was removed by a filter paper and the grid was left to air-dry for 10 min before loading into the instrument. Images were obtained on a FEI Tecnai G2 TF20 high resolution TEM operated at an accelerating voltage of 200 kV.
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5

Advanced Characterization of Porous Materials

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The QuadraSorb SI is used in order to analyze the specific surface area, pore size, and CO2 adsorption quantity. UV–vis diffuse reflection absorption spectra of samples are obtained by the UV2600 spectrophotometer equipped with an integrating sphere accessory and Teflon as a reference material. The morphologies and microstructures are inspected by transmission electron microscopy (TEM, HT-7700, accelerating voltage 100 kV) and scanning electron microscope (FE-SEM, ZEISS SUPRATM 55). Elemental characterization including HAADF and EDS images are carried out by using STEM (FEI Tecnai G2 TF20). Powder X-ray diffraction (PXRD) is recorded using a Bruker D8 DISCOVER X-ray power diffractometer. Time-resolved fluorescence decay is measured by time-correlated-single photon counting (Edinburgh Instruments, FLS 920). Electron paramagnetic resonance (EPR) signals are recorded using JEOL JES-X320. Photoluminescence (PL) measurements are performed at room temperature using a F-320 fluorescence spectrophotometer.
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6

Cryo-EM Structural Analysis of Protein Samples

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A 3 μl sample was applied to 400 mesh Quantifoil R1.2/1.3 grids (Quantifoil, Germany) with freshly made, thin continuous carbon film, blotted for 3 s in the chamber of the Vitrobot IV at 100% humidity (FEI, USA) and then flash-frozen in liquid ethane. The EM data for the sample with the presence of calcium ions were collected on an FEI Titan Krios at 300 kV. The total dose used for each exposure was 20 electrons/Å2. The images were recorded on a Gatan UltraScan4000 (model 895) 16-megapixel CCD camera and the final pixel size was 1.196 Å/pixel. The defocus values ranged from −0.9~−3 μm. The EM data for the sample with the presence of EDTA were collected on an FEI Tecnai G2 TF20 at 200 kV. The images were recorded on an Eagle (FEI, USA) 4 k × 4 k CCD camera and the final pixel size was 1.35 Å/pixel.
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7

Comprehensive Characterization of Nanomaterials

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The crystal structure was examined using X-ray diffraction diffractometer (X’pert PRO, PANalytical, Almelo, The Netherlands). The BET-specific surface area, pore diameter, and pore size were determined via the N2 adsorption–desorption isotherms at 77 K with a surface area (ASAP 2010, Micromeritics, Norcross, Georgia, USA). The morphologies were studied by field emission scanning electron microscope (FESEM) (JSM-6701F scanning electron microscope, JEOL, Tokio, Japan) and transmission electron microscope (TEM) (Tecnai G2TF20, FEI, Hillsboro, Oregon, USA). The functional groups were characterized using Fourier transmission infrared spectroscopy (FTIR) (model IFS120HR, Bruker, Karlsruhe, Germany) equipped with a DTGS detector, collecting 32 scans per sample at a resolution of 4 cm−1 and Raman spectroscopy (model IFS120HR, Bruker, Germany). Zeta potential was determined using a Zeta sizer Nano-ZS90 dynamic light scattering instrument (Malvern, Britain). X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, Thermo Fisher Scientific, Waltham, Massachusetts, USA) was used to identify the electronic state and chemical bonding at the surface of the synthesized samples. The concentration of sulfonamides was measured by high-performance liquid chromatography (HPLC, 1260 Infinity series, Agilent Technologies, Santa Clara, California, USA).
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8

Characterization of Rhenium Oxide Adsorbents

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ReO4-IIP, NIIP, ReO4-IIP after adsorption
(used IIP), and ReO4-IIP that has been
reused nine times (reused IIP) were ground into powder using an agate
mortar. FTIR (Nicolet Nexus 670, American Nicolet Co., Ltd., U.S.)
was performed. Then, the FTIR test of the samples was performed to
determine the components using the KBr pressed-disk method, and the
scan wavenumber range was 4000–400 cm–1.
The morphology of the IIP was characterized by SEM (JSM-5600LV, JEOL
Co., Ltd., Tokyo, Japan) and transmission electron microscope (TEM,
TECNAI G2 TF20, FEI Co., Ltd., U.S.).
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9

Analytical Techniques for Material Characterization

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The TEM images and energy dispersive X-ray spectroscopy (EDS) measurements were obtained from a transmission electron microscope (FEI Tecnai G2 TF20 USA). Fluorescence experiments were performed by a Horiba FluoroMax 4 spectrophotometer (HORIBA Scientific, Edison, NJ, USA). Absorption spectra were recorded by an UV-visible spectrophotometer (PerkinElmer Lambda 35, USA). The enzyme reaction was incubated in a SPH-2000 Shaking Incubator. Nuclear magnetic resonance (NMR) spectra of the NCPDs and PEI were employed by a Bruker AVANCE III-400 spectrometer (Bruker AXS GmbH, Karlsruhe, Germany).
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10

Multi-Technique Characterization of Nanomaterials

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TEM images and EELS data were acquired with a Nion U-HERMS200 microscope operated at 60 kV. HAADF-STEM studies were carried out with a probe semiangle of 35 mrad at a spatial resolution of 0.11 nm. For EELS measurements, half convergence angle was set at 20 mrad, and a current was set at 150 pA with a dispersion of 0.268 eV channel−1. The integral time for spectral collection of the Pt signals was 2 s, and that of C, N signal was 12 s. High-resolution TEM (HRTEM) studies and elemental mapping based on energy-dispersive X-ray spectroscopy (EDS) were acquired with a FEI Tecnai G2 TF20 transmission electron microscope operated at 200 kV. ICP-OES measurements were carried out with a SPECTRO BLUE SOP instrument. XRD studies were performed with a SmartLab 9 KW XRD system. Raman spectra were collected with a Laser Microscopic Confocal Raman Spectrometer. XPS data were acquired with a PHI-5702 XPS instrument.
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