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1

Amorphous Stability Monitoring via PXRD

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Stability of the samples in their amorphous form was monitored using a Powder X-ray Diffractometer (PXRD) Rigaku Miniflex 600 (Tokyo, Japan). Measurements were performed with a source voltage of 30 kV and 15 mA using a Cu cathode (K α ) as a source. Samples were measured from 5 to 37 with a step size of 0.05 and a speed of 2 /min for crystalline samples and 5 /min for amorphous samples. The amorphous samples for PXRD analysis were prepared by melting crystalline samples directly on a 22 × 22 mm cover glass used as a sample holder; this procedure allowed having amorphous samples permanently mounted on the cell holder on a fixed position. Samples were stored in a desiccator at room temperature and were continuously monitored as a function of storage time.
Also, the remaining undissolved excess of the material from a tablet of a SIM–NIF 1:1 after dissolution profile was subjected to XRD analysis to investigate the possible occurrence of recrystallization during the dissolution process.
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2

Powder X-Ray Diffraction Analysis of Nilotinib

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The nilotinib free base samples were promptly measured at room temperature using PXRD with two distinct types of detectors. These detectors included the semiconductor detectors equipped in the Bruker D8 and Bruker D2 powder X-ray diffractometer (Bruker in Karlsruhe, Germany), as well as the scintillation detectors equipped in the Rigaku Miniflex600 and Rigaku Smartlab powder X-ray diffractometer (Rigaku in Tokyo, Japan). The PXRD measurement parameters utilized in this study were as follows: Ag Kα radiation with a wavelength of 0.56 Å, a tube voltage of 100 kV, and a tube current of 80 mA. The scanning step size was maintained at a constant value of 0.02°, while the scanning speed was set at 6°/min, and time per step was set at 1 s. Moreover, the divergent slit was set at 0.6 mm, the anti-scatter slit was set at 3 mm. The specific PXRD diffraction angle range for the scans was set at 5–40° or 5–90°. The instrument continuously performed scans on the samples of nilotinib free base, allowing for the acquisition of PXRD patterns for each sample. In addition, it should be noted that two Rigaku Smartlab powder X-ray diffractometers were utilized in this study. These diffractometers were sourced from different universities and have been designated as Smartlab-1 and Smartlab-2 for the purposes of this research. Each sample underwent three measurements.
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3

Powder X-ray Diffraction Analysis

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The dried powders were examined by powder X-ray diffraction (PXRD) using a Rigaku MiniFlex 600 X-ray diffractometer (Rigaku, Tokyo, Japan), Cu-Kα1 radiation, and Smart lab/MiniFlex guidance software version 2.0.2.1 (Rigaku, Tokyo, Japan). Gently pressed powders, after grinding, were placed in aluminum holders and analyzed at room temperature. Data were collected at a scanning rate of 3°/min, in the 2θ range of 5°–40°.
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4

X-ray Diffraction Analysis of Materials

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X-ray diffraction analyses were performed using a Rigaku Miniflex 600 diffractometer (Rigaku Co., Tokyo, Japan), operating at 30 kV and 20 mA using CuKa radiation of 1.5406 Å as the X-ray source. The analysis was performed by changing 2θ in the region between 2 and 60 A (scan speed of 5°/min, room temperature).
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5

Characterization of Extrudate Crystallinity

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The FNB crystallinity in the formulated extrudates was evaluated using a benchtop Rigaku MiniFlex 600 (Rigaku Corporation, Tokyo, Japan). The instrument (equipped with a Cu Kα radiation source) was set to 15 mA with a 40 kV voltage. The samples (pure crystalline drug, polymer, PM, and the drug-loaded EXT crushed into a fine powder) were evenly spread into the holder and analyzed over a 2θ range of 5–60° with a scan speed of 2°/min and a step size of 0.02°/min.
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6

Powder X-ray Diffraction Analysis

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Powder X-ray diffraction measurements of samples were performed using Rigaku Mini Flex 600 (Rigaku Co., Tokyo, Japan) with Bragg–Brentano geometry (θ–2θ), using CuKa radiation (k = 0.154 nm) in the angle 2θ range from 5° to 60°. The slit was 1.25°, the accuracy was ± 0.05° and the scanning speed was 1 min−1.
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7

Characterization of Crystalline Phases by XRD

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X-ray diffraction (XRD) with Cu K α radiation ( λ = 1.54183 Å) was carried out to identify the crystalline phases using Rigaku MiniFlex 600 (Rigaku Co., Tokyo, Japan) at room temperature, using a one-dimensional detector (Rigaku D/teX Ultra 250). The X-ray tube was operated at 40 kV and 15 mA. Additional measurements parameters are 2 θ range 3–80 ° , IHS slit = 10 mm, Soller slits = 2.5 ° , DS slit = 1.25 ° , scanning step size 0.01 ° , and exposure time at each point of 1.67 s without sample rotation.
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8

Characterization of Metallurgical Dross and Residues

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X-ray diffraction (XRD) was used to analyze liquationfeeding furnace dross and leaching residues. XRD patterns were collected using an X-ray diffractometer Rigaku MiniFlex 600 (Rigaku, Tokyo, Japan) with a copper tube Cu Kα (λ = 0.15406 nm), a tube voltage of 40 kV, and a current of 15 mA, using a D/teX Ultra silicon strip detector.
The concentration of germanium and zinc in the solutions was analyzed using ICP-OES (Inductively Coupled Plasma-Optical Emission Spectrometry; Optima 5300 V, PerkinElmer). Solid samples were chemically dissolved before analysis.
Semiquantitative (SQX) analysis of the dross was performed using wavelength-dispersive X-ray fluorescence (WD-XRF) spectrometer Rigaku ZSX Primus (Rigaku, Tokyo, Japan). The sample was pressed into a pellet using boric acid as a matrix.
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9

Quantifying Lactose Crystallinity by XRD

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X-Ray powder diffraction patterns of all the samples were obtained using a Rigaku Miniflex 600 X-ray diffractometer (Rigaku Corporation, Wilmington, MA). The lactose powder samples were firmly pressed to form a thin film (0.2 mm) on the glass sample holders before loading them in the instrument. Operating conditions were set at 40 kV and 15 mA and a step size of 0.02° with a speed of 1.2/min from 2θ scanning range from 5° to 30° with Ni Kβ-filter (x2) and a D/ tex detector. The X-ray diffraction (XRD) data were analyzed by the Origin software (v. 95E) using a peak integration procedure with the Gaussian function. Degree of lactose crystallinity was calculated by dividing total area under the crystalline peaks by total area of the respective diffraction curve. The Scherrer formula was used to calculate average crystallite size (L):
where β is the peak width of the diffraction peak profile at half maximum height resulting from small crystallite size in radians, θ is the Bragg angle, λ is the X-ray wavelength (nm), and K is a constant associated with crystallite shape, generally considered as 0.9 (Scherrer, 1918) .
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10

Detailed Characterization of CaCO3 Microspheres

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The morphological and elemental analysis of CaCO3 microspheres was performed using FE–SEM equipped with energy-dispersive X-ray spectroscopy (EDAX) (TESCAN, Czech Republic). Pt sputtered coating was done before SEM analysis. BET surface area and pore size were obtained using a Tristar II (Micromeritics, United States). Pore-size distributions and pore volume were calculated using the Barett–Joyner–Halenda equation. FT-IR analysis was performed using an FT-IR spectrometer (Jasco, United States) range of 650–4000 cm–1. XRD patterns were analyzed by a Rigaku Mini Flex 600 (Rigaku, Japan) using Cu Kα radiation (λ = 1.5418 Å) at scanning rate of 5.00°min–1. Particle size analysis was performed using laser scatter particle size distribution analyzer LA-960 (Horiba, Japan).
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