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785 nm diode laser

Manufactured by Renishaw
Sourced in United Kingdom

The 785 nm diode laser is a compact and reliable laser source that emits light at a wavelength of 785 nanometers. It is designed for use in a variety of laboratory applications that require a stable and consistent light source in the near-infrared region of the spectrum.

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4 protocols using 785 nm diode laser

1

Raman and SERS Spectral Analysis

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The Raman and SERS spectra were recorded using a Renishaw™ inVia Reflex Raman confocal multilaser spectrometer having a spectral resolution of 0.5 cm−1. The wavelength calibration was performed using an internal silicon reference. All the spectra presented in this paper were acquired using a 100× (N.A = 0.85) objective. A 785 nm diode laser (Renishaw, UK) was used for excitation. The laser power (measured at the sample surface) was ~65 mW for Raman measurements and ~1.95 mW for SERS ones. The acquisition time was set to 10 s. The spectrograph was equipped with a 1200 lines/mm grating and a charge coupled device camera (CCD). WiRE 4.2 software (Renishaw plc, Gloucestershire, UK) was used for data collection and spectral pre-processing, including cosmic ray removal and baseline correction. The latter one was applied to all spectra in order to eliminate the fluorescence background. Each spectrum was an average of 30 spectral acquisitions from different positions of the whole dried sample area.
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2

Raman and SERS Characterization of Analytes

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The Raman measurements were recorded using a confocal Renishaw®inVia microscope (Renishaw plc, Wotton-under-Edge, UK), equipped with a Leica microscope (Leica Microsystems GmbH, Wetzlar, Germany), using a 100× objective (N.A. 0.85). A 785 nm diode laser (Renishaw, Wotton-under-Edge, UK) has been used for excitation. Prior to each set of measurements, a calibration procedure was performed using an internal silicon reference. The laser power (measured at the substrate surface) was ≈65 mW and the acquisition time was set between 3 and 10 s. The spectrograph was equipped with a 1200 lines/mm grating and a charge coupled device camera (CCD, Renishaw, Wotton-under-Edge, UK). The spectral resolution of the spectrometer was 0.5 cm−1.
The SERS measurements performed on liquid solutions were recorded in 1 mL glass vials filled with 540 µL of colloid and 60 µL of analyte (methylene blue solutions of multiple concentrations) in the 200–2000 cm−1 range, using a DeltaNu Advantage spectrometer (DeltaNu, Laramie, WY, USA) equipped with a laser diode emitting at 785 nm. The laser power was 100 mW and the spectral resolution was 5 cm−1. Each SERS spectrum was the average of 10 recordings taken with an acquisition time of 10 s.
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3

Raman Spectroscopy of Carbon Dots

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The Raman spectra were recorded using a Renishaw inVia Reflex Raman confocal multilaser spectrometer possessing a spectral resolution of 1 cm−1. The wavelength calibration was performed using an internal silicon reference. All Raman spectra were acquired using a 50× (NA = 0.75) Leica objective. A 785 nm diode laser (Renishaw, Gloucestershire, UK) was used for excitation. The laser power (measured at the sample surface) was ~63 mW. The exposure time was set to 1 s, and 20 accumulations were used for each measurement.
The spectrograph was equipped with a 600 lines/mm grating and a charge-coupled device camera (CCD). WiRE 4.2 software (Renishaw plc, Gloucestershire, UK) was used for data collection and spectral preprocessing, including cosmic ray removal and baseline correction. The latter was applied to all spectra to eliminate the fluorescence background. Carbon dots spectrum represents an average of 25 spectral acquisitions from different positions of the whole dried ring sample area.
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4

SERS Spectroscopy Protocol with Renishaw inVia

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The SERS spectra were recorded with a Renishaw inVia (Renishaw plc, Wotton-under-Edge, UK) equipped with a microscope Leica DMLM with 10× (N.A. 0.25) and 50× (N.A. 0.75) objectives. Excitation was obtained with a 785 nm diode laser (Renishaw), with an output power of 300 mW (15 mW at the sample), and a 514 nm Ar-ion laser (Modulaser, UK), with an output power of 25 mW (1.25 mW at the sample). The spectrograph was equipped with 1200 lines/mm (for 785 nm excitation) or with a 1800 lines/mm (for 514 nm excitation) grating, respectively, and a charge coupled device (CCD) camera. The frequency calibration for all gratings was performed using the emission lines of a Ne lamp. Before each measurement, calibration was checked using as reference the 520 cm -1 vibrational band of silicon.
Data were acquired using the software WiRE 3.2 (Renishaw). Spectra pre-processing, analysis, and plotting were performed using the freeware software Veusz (http://home.gna.org/veusz/) and hyperSpec package for R (hyperspec.r-forge.r-project.org, Core Team R (2013), R Foundation for Statistical Computing, Vienna, Austria).
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