The morphologies and structures of the products were investigated by field emission scanning electron microscopy (FESEM; JSM-7500F) at 20 kV and transmission electron microscopy (TEM; FEI Tecnai G2 F20) with an accelerating voltage of 200 kV. Energy dispersive X-ray spectrum (EDX) was detected on EDAX TEAM. The X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS) were measured by the multifunctional X-ray photoelectron spectroscopy (AXIS UltraDLD, Kratos Analytical Inc). The binding energy values were calibrated with respect to the C (1 s) peak (284.6 eV). The XRD (Rigaku Ultima IV) was carried out to determine the crystallization and the phase transition with Cu Ka radiation (wavelength = 0.15406 nm) from 20° to 80° at a scanning rate of 4°/min. The diffuse reflectance spectra of all samples were recorded on a UV-Vis spectrophotometer (Shimadzu, model UV 3600) equipped with an integrating sphere in the range of 300 to 800 nm and standard BaSO4 powder was used as a reference.
Model uv 3600
Manufactured by Shimadzu
The Shimadzu Model UV-3600 is a high-performance UV-VIS-NIR spectrophotometer. It is designed to measure the absorbance, transmittance, or reflectance of samples across the ultraviolet, visible, and near-infrared wavelength ranges.
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Lab products found in correlation
Axis ultra dld, by Shimadzu (1 mentions)
Tecnai g2 f20, by Thermo Fisher Scientific (1 mentions)
Jsm 7500f, by Thermo Fisher Scientific (1 mentions)
Ultima 4, by Rigaku (1 mentions)
Invia raman microscope spectrometer, by Renishaw (1 mentions)
Nicolet is50 ft ir, by Thermo Fisher Scientific (1 mentions)
Labx xdr 6000, by Shimadzu (1 mentions)
Spectrum 400, by PerkinElmer (1 mentions)
3 protocols using model uv 3600
1
Comprehensive Characterization of Materials
2
Multimodal Spectroscopic Characterization
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The NIR spectrum was measured by a UV-VIS-NIR spectrophotometer (Shimadzu, Model UV-3600) in the 850-1650 nm spectral range with spectral resolution of 1 nm. The equipment was configured in transmittance mode. Two absorbance spectra were registered per sample at two different points and then they were averaged to obtain a single spectrum. Using a THz spectrometer (Picometrix T-Gauge, Model T-Ray 5000), the transmitted electric field ( ) was measured for a reference signal ( ( ) ), taken without a sample, and for the sample ( ) in the time domain (Nuss and Orenstein 1998) . The data was acquired with a 0.1 ps resolution and 1000 scans/second were taken and averaged. These signals were translated into the frequency domain ( ) through the fast Fourier transform, obtaining a spectrum, , with spectral range from 0.2 to 1.4 Thz.
The FT-IR spectrophotometer with diamond ATR accessory (Thermo scientific, Nicolet Is50 FT-IR) was configured in the spectral range 540-4000 cm -1 with resolution of 4 cm -1 . Raman spectra were measured by a Renishaw InVia microscope Raman spectrometer with an excitation source at 785 nm using a 20X objective (0.4 NA) in the range 800-1650 cm -1 .
The FT-IR spectrophotometer with diamond ATR accessory (Thermo scientific, Nicolet Is50 FT-IR) was configured in the spectral range 540-4000 cm -1 with resolution of 4 cm -1 . Raman spectra were measured by a Renishaw InVia microscope Raman spectrometer with an excitation source at 785 nm using a 20X objective (0.4 NA) in the range 800-1650 cm -1 .
3
Comprehensive Characterization of Crystalline Structure
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The crystal structure was investigated by X-ray diffraction in a scanning range of 2θ = 3° to 75° using an X-ray diffractometer Shimadzu, model Labx-XDR 6000, with Cu-Kα radiation (λ = 1.5406 Å in the Bragg–Betano configuration. Scanning Electron Microscopy (SEM) using a scanning electron microscope with an electron source by field emission FEG (Field Emission Gun), Quanta FEI 250. Spectroscopy in the Fourier Transform Infrared Region (FTIR) was performed on a Perkin Elmer SPECTRUM 400 (FTIR/FT-NIR) spectrometer with a sweep from 4000 to 400 cm−1. The textural properties of the solids were investigated based on the nitrogen adsorption–desorption isotherms using Quantachrome (Autosorb-iQ Instruments) results. The surface area, pore volume, and diameter were calculated using the Brunauer–Emmett–Teller (BET) method based on N2 adsorption–desorption. The material’s bandgap (Eg) was determined using a Shimadzu spectrophotometer Model UV-3600 with a diffuse reflectance accessory monitoring the region of 200 to 800 nm and was calculated through a series of mathematical transformations proposed in the Kubelka–Munk method.
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