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V 570

Manufactured by Hitachi

The V-570 is a UV-Vis-NIR spectrophotometer manufactured by Hitachi. It is designed to measure the absorbance or transmittance of samples across the ultraviolet, visible, and near-infrared wavelength ranges. The instrument features a high-resolution monochromator and a dual-beam optical system for accurate and reliable measurements.

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2 protocols using v 570

1

Characterization of Organic Compounds

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Melting points were measured on a Büchi M-565 apparatus and were uncorrected. NMR spectra were obtained with an AL-400 spectrometer at ambient temperature by using CDCl3 as a solvent and tetramethylsilane as an internal standard for 1H and 13C, unless otherwise indicated. IR spectra were obtained on a Thermo Scientific Nicolet iS5 FT-IR spectrometer with an iD5 ATR diamond plate. UV-vis-NIR and fluorescence spectra were recorded on Jasco V-570 and Hitachi F-4500 spectrophotometers, respectively. Absolute quantum yields were measured with a Hamamatsu Photonics C 9920-03G spectrophotometer. Mass spectra were obtained either with a JEOL JMS-700 (EI, 70 eV; FAB+, p-nitrobenzyl alcohol) or with a JEOL JMS-S3000 (MALDI-TOF). Elemental analyses were performed with a Yanaco MT-5 elemental analyzer at ADRES, Ehime University. Preparative GPC using LC-911 or LC-916 with Jaigel-1H and 2H was performed by Japan Analytical Industry Ltd. Co. Dehydrated solvents were purchased from Kanto Chemical Co. and used without further purification. Commercially available materials were used without further purification.
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2

Spectroscopic Characterization of Compounds

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UV-vis and photoluminescence spectra were recorded on JASCO V-570 and HITACHI F-2700 spectrophotometers, respectively. All UV-Vis measurements were performed in a quartz cuvette with a 10.0 mm optical pathlength. UV-grade dichloromethane was used for the spectroscopic experiments. Fourier transform infrared (FT-IR) spectra were recorded on a VERTEX 70 spectrometer. Neat dry powders were directly analysed. A blank scan was run to cut out the air effects before analysis.
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