Octane elect super sdd detector

The internal morphology of pristine CS sponges was investigated with a Quanta 200 ESEM microscope (FEI Company, Hillsboro, OR, USA), operating in low vacuum mode, at 20 kV, with secondary electrons. The morphology of CS sponges loaded with CCM was investigated with a Verios G4 UC (Thermo Scientific, Brno, Czech Republic) scanning electron microscope operating in high vacuum mode using an Everhart-Thornley Detector (Thermo Scientific, Brno, Czech Republic) at an accelerating voltage of 5 kV. The elemental composition of sponges was evaluated with an energy-dispersive X-ray (EDX) analyzer (Octane Elect Super SDD detector, Ametek, Berwyn, PA, USA). The pore diameter of CS sponges was evaluated from the SEM micrographs using Image J 1.53 v open-source software, by measuring at least 30 pores (voids) for each sample. The pore size distribution was plotted as a function of the percentage frequency (%) [58 (link)].

Attenuated total reflection Fourier transform infrared (ATR-FTIR) spectra of the chitosan-based membranes with or without plant extracts were recorded using a Bruker LUMOS FTIR microscope spectrometer (Bruker Corporation, Karlsruhe, Germany) equipped with an ATR reflection module (Attenuated Total Reflection) and a diamond crystal. The previously prepared samples were cut into small pieces, placed directly on the ATR crystal and subjected to IR investigation. All the spectra were collected in the range 500–4000 cm⁻¹, and the measurements were made by averaging 64 scans at a resolution of 2 cm⁻¹. The spectra were recorded at room temperature.
The surface morphology of the chitosan-based membranes with or without plant extracts was studied by scanning electron microscopy (SEM). The samples were cut into small pieces, mounted on a stub, coated with a thin layer of platinum in a sputtering device and then examined on a Verios G4 UC scanning electron microscope (Thermo Scientific, Waltham, MA, USA) equipped with an energy-dispersive X-ray spectroscopy analyzer (Octane Elect Super SDD detector (AMETEK, Tokyo, Japan)).

The surface morphology, dispersion of the nanoparticles in PU nanocomposites, and elemental composition were evaluated with a Verios G4 UC scanning electron microscope (Thermo Scientific, Waltham, MA, USA) equipped with an energy-dispersive x-ray spectroscopy analyser (Octane Elect Super SDD detector(AMETEK, Tokyo, Japan). Before image acquisition, the samples were coated with 10 nm platinum using a Leica EM ACE 200 Sputter Coater (Leica Microsystems, Vienna, Austria) to provide electrical conductivity and to prevent charge build up during exposure to the electron beam. SEM investigations were performed in High Vacuum mode using a secondary electron detector (Everhart–Thornley detector, ETD) at an accelerating voltage of 5 kV. The pore diameters were determined from SEM images using ImageJ software. From each image, at least 50 different pores were randomly selected, and their diameters were measured to generate an average.