Atomic and magnetic force microscopy measurements were carried out with an Asylum Research MFP-3D AFM (Asylum Research). Commercially available magnetic tips (Nanosensors, PPP-MFMR, resolution <50 nm) were used to record the local magnetic domain configurations. MFM phase images were acquired simultaneously with AFM images using the standard two-pass technique: the first pass was performed to record the topography in intermittent contact mode; the second pass was performed to record the magnetic phase shift by keeping the tip at a selected lift height with respect to the recorded topography. In our study, the magnetic tip was kept at a lift height of 100 nm to avoid topographic artifacts.
Asylum research mfp 3d afm
Manufactured by Oxford Instruments
Sourced in United States
The Asylum Research MFP-3D AFM is an atomic force microscope (AFM) designed for high-resolution imaging and analysis of surface topography and properties at the nanoscale. The instrument utilizes a cantilever-based sensing system to measure the interactions between a sharp probe tip and the sample surface, providing detailed information about the sample's surface features and characteristics.
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Lab products found in correlation
6 protocols using asylum research mfp 3d afm
1
Magnetic Force Microscopy Measurements
2
Atomic Force Microscopy of Crack Topography
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Atomic force microscopy measurements were conducted on an Asylum Research MFP-3D AFM (Asylum Research). AFM imaging was acquired in tapping mode using the high-resolution probes (MikroMasch Hi’Res-C15/Cr-Au) with a nominal tip radius of 1 nm, a typical resonant frequency of 325 kHz, and a force constant of 40 N/m. Owing to the high spatial resolution (typical lateral resolution of ~1 nm, vertical resolution of ~0.1 nm) of the AFM measurements (59 ), 3D topographic information of the cracks after loading was captured with the AFM tip ex situ scanning perpendicular to the crack propagation direction. To gain geometry information inside the crack and topography fluctuation along the crack, scan direction of the AFM tip was adjusted to the crack propagation direction with the sample remaining stationary. Raw AFM data were processed from .ibw files using standard procedures implemented in Gwyddion (60 ).
3
Atomic Force Microscopy of VSMCs
4
Nanoscale Membrane Imaging with AFM
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Atomic force microscopy (AFM) was utilized to observe the membrane surface before and after patterning. Images were taken using an Asylum Research MFP-3D AFM (Oxford Instruments) using MFP3D 14.48.159, Igor Pro 6.37 software. Pt-coated tip (radius 30 nm) cantilevers (NanoAndMore USA Corporation) were used for the non-contact tapping mode measurements. AFM images were taken with a 256 × 256 pixel resolution over 5 µm × 5 µm area at a scan rate of 1 Hz. The section analysis feature of the software was used to determine peak heights. The roughness analysis feature was used to determine membrane surface roughness.
5
Nanostructural Characterization of Films
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The nanostructures of the films were analyzed by Raman spectroscopy: Micro-Raman (LabRam Aramis Horiba Jobin-Yvon), measurements were carried out with 532 nm excitation at 50× magnification, 1.18 μm spot size and 1.800 grating; X-ray diffraction (XRD, Philips MRD diffractometer); Transmission Electron Microscopy (TEM, Jeol 2100) was undertaken at an operating voltage of 200 KV and with a custom-made titanium holder which maintained the sample and the tip apex at specific Z height; Scanning Electron Microscopy (SEM, Jeol 6500F) was carried out at acceleration voltage of 5KV. Further characterization of the AFM tips (topography, current and force measurements) was carried out using the Asylum Research MFP-3D AFM (Oxford Instruments).
6
Nanoindentation of Microgel Mechanics
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Nanoindentation measurements were performed
in MQ water using an Asylum Research MFP 3D AFM (Oxford Instruments,
Santa Barbara, CA) on microgels deposited from the hexane–water
interface onto silicon wafers. A silica microparticle (diameter =
2 μm, Microparticles GmbH) was glued with a two-component epoxy
glue (UHU Plus endfest, UHU GmbH, Germany) to the end of a tipless
cantilever using a home-built micromanipulator. The normal spring
constant (0.14 N·m–1) of the Au-coated cantilever
(CSC-38, Mikromash, Bulgaria) was measured by the thermal-noise method.50 (link) Force versus distance curves
were recorded using the force-mapping mode over an area of 10 ×
10 μm2. The applied force was kept smaller than 2
nN to reduce any substrate effect. Force versus distance
curves recorded at the center of the microgels were then converted
into force versus indentation curves (the indentation
was measured by subtracting the cantilever deflection by the vertical
piezodisplacement) and fitted using the Hertz model: where F is the applied force
and R is the radius of the colloid used. By knowing
the silica probe elastic modulus and the sample Poisson’s ratio
(ν), Young’s modulus E of the microgels
was obtained by applying the Hertz fit function in the dedicated Asylum
Research software (version AR13).
in MQ water using an Asylum Research MFP 3D AFM (Oxford Instruments,
Santa Barbara, CA) on microgels deposited from the hexane–water
interface onto silicon wafers. A silica microparticle (diameter =
2 μm, Microparticles GmbH) was glued with a two-component epoxy
glue (UHU Plus endfest, UHU GmbH, Germany) to the end of a tipless
cantilever using a home-built micromanipulator. The normal spring
constant (0.14 N·m–1) of the Au-coated cantilever
(CSC-38, Mikromash, Bulgaria) was measured by the thermal-noise method.50 (link) Force versus distance curves
were recorded using the force-mapping mode over an area of 10 ×
10 μm2. The applied force was kept smaller than 2
nN to reduce any substrate effect. Force versus distance
curves recorded at the center of the microgels were then converted
into force versus indentation curves (the indentation
was measured by subtracting the cantilever deflection by the vertical
piezodisplacement) and fitted using the Hertz model: where F is the applied force
and R is the radius of the colloid used. By knowing
the silica probe elastic modulus and the sample Poisson’s ratio
(ν), Young’s modulus E of the microgels
was obtained by applying the Hertz fit function in the dedicated Asylum
Research software (version AR13).
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