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Ex 250 system

Manufactured by Horiba
Sourced in Japan

The EX-250 system is a laboratory equipment manufactured by Horiba. The core function of this system is to perform measurements and analyses. No further details can be provided in an unbiased and factual manner without extrapolation.

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9 protocols using ex 250 system

1

Characterization of Se@AM Nanoparticles

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The morphology of Se@AM NPs was characterized by transmission electron microscopy (TEM, H-7650). Elemental composition of Se@AM was determined by energy dispersive X-ray spectroscopy (EDX) (EX-250 system; Horiba, Kyoto, Japan). Zeta potential and size distribution of Se@AM were monitored by Malvern Zetasizer (Malvern Instruments Limited, Manchester, UK) software. Fourier-transform infrared spectroscopy samples were recorded using the potassium bromide-disk method (Equinox 55 IR spectrometer). X-ray photoelectron spectroscopy (XPS) measurement was carried out on ESCALab 250 spectrometer.41 (link)
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2

Particle Elemental Composition Analysis

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For particle’s elements qualitative and quantitative analysis, energy-dispersive X-ray spectroscopy (EDS) was conducted. β-TCP test and control samples elemental composition analysis were performed using the same SEM. For the surface morphology evaluation, a machine that combines SEM and EDS was used (EX-250 SYSTEM, HORIBA, Kyoto, Japan).
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3

Argon Plasma-Treated β-TCP Surface Analysis

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To analyze the surface morphologies of the scaffolds, β-TCP particles treated with argon gas discharge plasma were analyzed and compared with nontreated β-TCP. We used scanning electron microscopy (SEM; EX-250 SYSTEM, HORIBA, Kyoto, Japan) images to observe the microstructure and crystal size of the particles. These images were analyzed using ImageJ version 1.52 (NIH IMAGE, Bethesda, MD, USA). The arithmetical mean value roughness (Ra) was calculated for quantitative analyses.
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4

Elemental Composition Analysis of WP1-SeNPs

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To determine the elemental composition of the WP1-SeNPs, an energy dispersive EX-250 system (HORIBA Ltd., Kyoto, Japan) X-ray spectrometer (EDX, Voyager ш NORAN instruments, Inc., Middletown WI) equipped with a cold field emission system was utilized at 5 kV with an analysis time of 70 live seconds.
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5

Characterization of Nanoparticle Morphology

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The morphology of the NPs was recorded by Hitachi transmission electron microscope (TEM). The elemental composition of the NPs was detected by HRTEM-EDX analysis on an EX-250 system (Horiba). Size distributions and zeta potentials of the NPs were measured by a Nanoparticle analyzer (HORIBA) as previously reported [14 (link)].
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6

Characterization of Silver Nanoparticles

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The morphology of silver nanoparticles was characterized by transmission electron microscope (TEM, Hitachi, H-7650). The size distribution and zeta potential of AgNPs were detected through Zetasizer Nano ZS (Malvern Instruments Limited) particle analyzer. EDX analysis was carried out on an EX-250 system (Horiba) and employed to examine the elemental composition of AgNPs.
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7

Elemental Composition Analysis of DP1-SeNPs

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The elemental composition of DP1-SeNPs was obtained using an energy dispersive EX-250 system (Horiba Ltd, Kyoto, Japan) X-ray spectrometer (EDX; Voyager III, NORAN Instruments, Inc., Middleton, WI). The powder sample of DP1-SeNPs was spread out and then attached to the specimen holder using double-sided adhesive tape and examined by EDX spectrometer.
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8

Synthesis of β-Thujaplicin-Modified Selenium Nanoparticles

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β-Thujaplicin-modified
selenium nanoparticles were prepared as previously reported.36 (link) Stock solution of Na2SeO3 (0.25 mL, 0.1 M) was gradually added into 2 mL stock solution (50
mM) of vitamin C. Then, 10 μL 40 mg/mL of β-thujaplicin
was added into the selenium nanoparticle solution. The excess β-thujaplicin,
vitamin, and Na2SeO3 were removed by dialysis
for overnight. Se@TP nanoparticles were sonicated and then filtered
through 0.2 μm pore size. The concentration of SeNPs and TP
was measured by ICP-AES. The morphology and elemental composition
of Se@TP nanoparticles were characterized by transmission electron
microscopy (TEM, H-7650) and EDX (EX-250 system, Horiba). Malvern
Zetasizer software was used to monitor the zeta potential and size
distribution of Se@TP.
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9

Characterization of Selenium-Loaded OTVs

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The morphology of Se@OTV was characterized by transmission electron microscopy (TEM; H-7650; Hitachi, Tokyo, Japan). Elemental composition of Se@OTV was determined by energy-dispersive X-ray spectroscopy (EX-250 system; Horiba, Kyoto, Japan). Size distribution and ζ-potential of Se@OTV were monitored by Malvern Zetasizer software. Fourier-transform infrared (FTIR) samples were recorded using the KBr-disk method on an Equinox 55 IR spectrometer. X-ray photoelectron spectroscopy was carried out with an Escalab 250.43 (link)
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