Spectrum gx ftir spectrometer

The film dressing (1 cm × 1 cm) was prepared. The Fourier Transform Infrared Spectroscopy (FTIR) spectra were recorded using a Spectrum GX FTIR spectrometer (PerkinElmer, United States of America) in the 650–4,000 cm⁻¹ range.

The extracted polymer was mixed with KBr spectra was noted in 4000 – 400 cm^–1 range with PerkinElmer spectrum GX FTIR spectrometer in by mixing the extracted polymer with.

A Perkin Elmer Spectrum GX FTIR spectrometer (Waltham, MA, USA) operating in attenuated total reflection mode, in a wave number range of 4000 to 650 cm⁻¹. Thirty-two (32) cycles of scanning, and a resolution of 2 cm⁻¹ was used to record the Fourier transform infrared (FTIR) spectra of pure MVR, PVAc, PHEMA homopolymers, and VAC-HEMA copolymer. The samples were analyzed in the form of thin transparent films except that of MVR which was analyzed as powder diluted in dehydrated KBr.

Woodchips, grains of feed barley (Hordeum vulgare L.), and peanut (Arachis hypogaea) shells were studied as potential carbon sources. Woodchips were obtained from untreated pine (Pinus sylvestris). According to screen analysis, 85.5% of the woodchips were retained over a 2 mm mesh sieve, while 10.4% passed through a 2 mm mesh sieve but were retained over a 1 mm mesh sieve. The remaining fraction (4.1%) passed through a 1 mm mesh sieve but was retained over a 0.6 mm mesh sieve. Barley grains (0.6 ± 0.05 cm) and peanut shells (3.2 ± 0.47 cm) were obtained, respectively, from Apan and Temascalapa, both in the State of Hidalgo, Mexico. All foreign matter (such as stones, dust, or stalks) and damaged kernels were removed from barley by hand.
Elemental composition and Fourier Transform Infrared (FT-IR) analyses were made on 1.5–3.0 mg samples of the natural materials previously ground to a homogeneous fine powder and dried at 105°C for 24 h using a 2400 Series II CHNS Elemental Analyzer and a Spectrum GX FT-IR spectrometer (both from Perkin-Elmer, Waltham, MA, USA), respectively. The IR spectra were obtained from KBr pellets (1 : 100 weight ratio of sample/KBr). The spectrometer was set to scan from 4000 to 400 cm⁻¹.

X-ray diffraction patterns were obtained using an Ultima IV multipurpose XRD system (Rigaku, The Woodland, TX, USA) at 40 kV and 40 mA, with a scanning speed of 0.1°/min. Functionalized surfaces were investigated using the ATR method of FT-IR; specifically, the Spectrum GX FT-IR Spectrometer (PerkinElmer Inc., Waltham, MA, USA) was used.