The infrared spectrum was acquired utilizing a PerkinElmer FT-IR 1000 spectrometer with the sample compressed into a KBr pellet within the 400–3500 cm−1 range.
1000 ft ir spectrometer
Manufactured by PerkinElmer
Sourced in United States, United Kingdom
The 1000 FT-IR spectrometer is a laboratory instrument designed for the analysis of materials using Fourier Transform Infrared (FT-IR) spectroscopy. The core function of this spectrometer is to measure the absorption or transmission of infrared radiation by a sample, providing information about the molecular structure and composition of the material.
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Lab products found in correlation
D2 phaser x ray diffractometer, by Bruker (2 mentions)
D2 phaser, by Bruker (2 mentions)
Jem 2100f, by JEOL (2 mentions)
Dma q800 analyzer, by TA Instruments (1 mentions)
Jms 600h spectrometer, by JEOL (1 mentions)
Lambda 35, by PerkinElmer (1 mentions)
500 mhz spectrometer, by JEOL (1 mentions)
Aa 7000 series, by Shimadzu (1 mentions)
Jsm 7610f, by JEOL (1 mentions)
Axis ultra, by Shimadzu (1 mentions)
D max 2550, by Rigaku (1 mentions)
Jsm 7401f, by JEOL (1 mentions)
Dektakxt surface profiler, by Bruker (1 mentions)
Lambda 35 uv vis spectrophotometer, by PerkinElmer (1 mentions)
Tem model jem 1011, by JEOL (1 mentions)
Phi 5600 multi technique xps, by Physical Electronics (1 mentions)
Raman microscope, by Renishaw (1 mentions)
Graphite powder, by Thermo Fisher Scientific (1 mentions)
Jnm ecp 400 nmr spectrometer, by JEOL (1 mentions)
Amx 300 spectrometer, by Bruker (1 mentions)
12 protocols using 1000 ft ir spectrometer
1
Infrared Spectroscopy of KBr Pellets
2
Thermal Analysis and IR Spectroscopy of (C6H7NBr)3[CdBr5]
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The thermal analyses of (C6H7NBr)3[CdBr5] were performed on raw powders with a TGA/DTA ‘SETSYS Evolution’ (Pt crucibles, Al2O3 as a reference) under N2 flow (100 ml min−1). The thermograms were collected on 11.5 mg of the samples in a maximum temperature of 600 °C (heating speed of 5 °C min−1).
The IR spectrum was recorded in the frequency range 4000–450 cm−1 at room temperature using a PerkinElmer FT-IR 1000 spectrometer. Sample was prepared as pellets with KBr as a dispersant.
The IR spectrum was recorded in the frequency range 4000–450 cm−1 at room temperature using a PerkinElmer FT-IR 1000 spectrometer. Sample was prepared as pellets with KBr as a dispersant.
3
Characterization of Polymer Nanocomposites
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Fourier transform infrared (FTIR) analysis was performed on a PerkinElmer 1000 FTIR spectrometer (PerkinElmer, Waltham, MA USA) at room temperature with a resolution of 1 cm−1 in a transmission mode. The number of the scan was 10. The mechanical test of the nanocomposites was carried out in a universal testing machine (Hounsfield H10KS, Redhill, UK) with a cross head speed of 100 mm/min. Thin films (60 mm × 10 mm × 0.2 mm) were used for mechanical tests. A dynamic mechanical analysis (DMA) of the WPUs and the nanocomposites was carried out in a Q800 DMA analyzer (TA Instruments, New Castle, DE, USA) at a heating rate of 2 °C from −50 to 150 °C. The test mode was a single cantilever with a frequency of 1 Hz and amplitude of 5%.
4
Synthesis and Characterization of Pt(II) Complex
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Chemicals were purchased from Sigma–Aldrich (Chemie GmbH, 82024 Taufkirchen, Germany). The CHN analyses were determined using Perkin–Elmer 2400 instrument (PerkinElmer, Inc.940 Winter Street, Waltham, MA, USA). Pt content was determined using a Shimadzu atomic absorption spectrophotometer (AA-7000 series, Shimadzu, Ltd., Japan). FT-IR spectrum was assessed on a Perkin–Elmer 1000 FT-IR spectrometer, Waltham, MA, USA (Figure S1 ). The UV–Vis electronic spectrum of the Pt(II) complex at 3.0 × 10−4 mol L−1 in absolute ethanol as solvent was carried out using a UV–Vis spectrophotometer (Perkin–Elmer Lambda 35, Waltham, MA, USA) in 1 cm cell in the spectral range of 200–500 nm. Mass spectrum was recorded on JMS-600 H JEOL spectrometer (JEOL Ltd., Tokyo, Japan). 1H and 13C NMR spectra of [Pt(Triaz)Cl] were recorded on DMSO-d6 using a JEOL 500 MHz spectrometer (JEOL Ltd., Tokyo, Japan) at room temperature.
5
Nanoparticle Characterization Techniques
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The synthesized nanoparticles were characterized for size and physicochemical properties using high resolution transmission electron microscopy (JSM-7610F, JEOL, Tokyo, Japan), X-ray diffraction analysis (D2 Phaser X-ray diffractometer, Bruker, Ettlingen, Germany) and FT-IR spectroscopy (Perkin Elmer 1000 FT-IR spectrometer, Waltham, MA, USA).
6
Comprehensive Materials Characterization of SEBS Nanocomposites
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The Fourier transformed
infrared spectroscopy (FTIR) test of SEBS, MA-g-SEBS,
and their nanocomposites were conducted on a Perkin-Elmer 1000 FTIR
spectrometer. Raman spectra were measured on a ThermoFisher/DXR. The
X-ray diffraction (XRD) measurement was carried out on a Rigaku D/Max
2550 (Cu Kα, λ = 1.5418 Å) with a 2θ scan configuration
in the range of 5°–40°. X-ray photoelectron spectroscopy
(XPS) experiment was performed on a Shimadzu-Kratos (AXIS Ultra).
Typical tapping-mode atomic force microscope (AFM) measurements were
taken on a SIINT NanoNavi E-Sweep, with which not only the single-layer
GO platelets were observed but also the microscopic surface roughness
of the hybrid films was measured. Macroscopic surface roughness of
the films was obtained from a Bruker DektakXT Surface Profiler. The
sandwich structure of the LBL assembled films was observed using a
JEOL JSM-7401F scanning electron microscope at an acceleration voltage
of 5 kV, and all the samples were fractured after immersion in liquid
nitrogen for a few minutes. Dynamic mechanical analysis (DMA) was
carried out using a NETZSCH DMA 242 C/1/G instrument. The tensile
tests were conducted on a MTS Criterion Model 43 universal testing
machine, with a crosshead speed of 500 mm/min at the temperature of
25 °C.
infrared spectroscopy (FTIR) test of SEBS, MA-g-SEBS,
and their nanocomposites were conducted on a Perkin-Elmer 1000 FTIR
spectrometer. Raman spectra were measured on a ThermoFisher/DXR. The
X-ray diffraction (XRD) measurement was carried out on a Rigaku D/Max
2550 (Cu Kα, λ = 1.5418 Å) with a 2θ scan configuration
in the range of 5°–40°. X-ray photoelectron spectroscopy
(XPS) experiment was performed on a Shimadzu-Kratos (AXIS Ultra).
Typical tapping-mode atomic force microscope (AFM) measurements were
taken on a SIINT NanoNavi E-Sweep, with which not only the single-layer
GO platelets were observed but also the microscopic surface roughness
of the hybrid films was measured. Macroscopic surface roughness of
the films was obtained from a Bruker DektakXT Surface Profiler. The
sandwich structure of the LBL assembled films was observed using a
JEOL JSM-7401F scanning electron microscope at an acceleration voltage
of 5 kV, and all the samples were fractured after immersion in liquid
nitrogen for a few minutes. Dynamic mechanical analysis (DMA) was
carried out using a NETZSCH DMA 242 C/1/G instrument. The tensile
tests were conducted on a MTS Criterion Model 43 universal testing
machine, with a crosshead speed of 500 mm/min at the temperature of
25 °C.
7
Photocatalyst Characterization Techniques
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The identities of the obtained photocatalysts were confirmed through a number of characterization techniques. Powder XRD patterns were recorded using a Bruker diffractometer (Cu Kα (λ = 1.5406 Å) X-ray source) (D2-Phaser, Bruker, Mannheim, Germany). SEM, TEM, and energy-dispersive X-ray (EDX) spectroscopy were performed on a Jeol, JED-2200 series (Akishima, Tokyo 196-8558, Japan) and a Jeol TEM model JEM-1011 (Japan) at 100 keV, respectively. XPS spectra were measured on a PHI 5600 Multi-Technique XPS (Physical Electronics, Lake Drive East, Chanhassen, MN, USA) using monochromatized Al Ka at 1486.6 eV. Peak fitting was performed using CASA XPS Version 2.3.14 software, Wilmslow, Cheshire, UK. FT-IR analysis was performed for the identification of functional groups on a PerkinElmer, 1000, FT-IR spectrometer, Waltham, MA, USA. The optical study and photocatalytic activity were studied with a Lambda 35 UV–Vis spectrophotometer (PerkinElmer, Waltham, MA, USA) in quartz cuvettes (with a path length of 1 cm) using distilled water as the reference solvent.
8
FTIR Spectroscopic Analysis of Membranes
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2.2.2.1. Fourier transform infrared spectroscopy (FTIR). FTIR spectra of membranes were obtained for spectroscopic investigation. All FTIR spectra were recorded by using Perkin Elmer 1000 FT-IR spectrometer (Perkin-Elmer, Ltd., Buckinghamshire, UK). 32 scans were taken with 4 cm -1 resolution in the range of 4000-400 cm -1 .
9
Comprehensive Graphene Oxide Characterization
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The graphene oxide nanolayers (GRO-NLs) crystalline structure evaluation was performed using an X-ray diffractometer (Bruker D2 Phaser, Bruker, Germany). The GRO-NLs were further characterized for FT-IR spectra using a Perkin Elmer 1000 FT-IR spectrometer (Waltham, MA, USA). The GRO-NLs TGA was quantitated by heating the samples with a N2 flow (10 °C/min) (Perkin-Elmer TGA 7, Waltham, MA, USA). Transmission electron microscope (TEM) imaging of the GRO-NLs was conducted using a JEM 2100F, JEOL, Tokyo, Japan. GRO-NLs was further characterized by measuring Raman spectra using a Raman microscope (Renishaw, Gloucestershire, UK), equipped with excitation source of argon ion laser (514.5 nm). Data acquisition time was 20s with laser power of 8 mW at the sample.
10
Synthesis of Graphene Oxide-based Materials
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All reactants and solvents were purchased from commercial suppliers (Sigma-Aldrich) and used without any further purification (extra purified chemicals are specifically indicated in the main text). Graphite powder (99.999%, −200 mesh) was purchased from Alfa Aesar. Other materials used are 1-aminopyrene (1-AP, 97%), sodium tetrachloropalladate (II) (99.9%), concentrated sulfuric acid (H2SO4, 98%), potassium permanganate (KMnO4, 99%), sodium nitrate (NaNO3, 99%), hydrogen peroxide (H2O2, 30 wt%), Acrylic acid, n-butylacrylate, 4-bromoanisol, sodium dodecyl sulfate (SDS, 98%), K3PO4 etc. FT-IR spectra were measured on Perkin Elmer 1,000 FT-IR spectrometer from 400 to 4,000 cm−1 by using KBr pellets. 1H and 13C spectra were obtained on a JEOL JNM-ECP 400 NMR spectrometer. Powder XRD patterns were recorded on D2 Phaser X-ray diffractometer (Bruker, Germany), Cu Kα radiation (k = 1.5418 A°). High-resolution transmission electron microscopy (HRTEM) images and EDX were measured on JEM 2100F (JEOL, Tokyo, Japan)). HPLC analysis on a Shimadzu LC-20A Prominence instrument (Shi-madzu, Kuoto, Japan). Column used: Daicel Chiralcel OD-H columns (Chiral Technologies Europe, Illkirch Graffenstaden, France) (80–95% n-hexane/iso-propanol).
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