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Zetasizer 3000hs analyzer

Manufactured by Malvern Panalytical
Sourced in United Kingdom

The Zetasizer 3000HS analyzer is a lab equipment product manufactured by Malvern Panalytical. It is designed to measure the size, zeta potential, and molecular weight of particles and molecules in a sample. The Zetasizer 3000HS uses a combination of dynamic light scattering and electrophoretic light scattering techniques to provide accurate and reliable data on the properties of a wide range of materials, including polymers, proteins, and nanoparticles.

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2 protocols using zetasizer 3000hs analyzer

1

Nanofibrous Morphology Characterization

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Different samples of nanofibers were plated with platinum with an ion coater (E-1045, HITACH, Tokyo, Japan); the condition was set at 10 mA 120 s later. The morphology and shape of each sample was observed by a scanning electron microscope (Hitachi S4700, Hitachi, Tokyo, Japan). The diameter of each sample was calculated by image j software. A Zetasizer 3000HS analyzer (Malvern, Worcestershire, UK) was used to measure the particle size of OAnf. The particle size of OA and OAnf were measured at a concentration of 1 mg/mL and 0.1 mg/mL, respectively. In addition, we also observed the uniformity of the morphology of OAnf after dissolving in water using a transmission electron microscope (TEM, JEM-2000EXII instrument, JEOL Co., Tokyo, Japan). The test sample was adjusted to 1 µg/mL of OA in deionized water and then dripped into the copper mesh, and then 0.5% (w/v) phosphotungstic acid was immediately dripped. After drying, each sample was placed on the TEM for observation.
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2

Comprehensive Characterization of Particle 734N

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The mean particle size of 734N was determined using a Zetasizer 3000 HS analyzer (Malvern Instruments, Malvern, UK). The 734N solution was diluted tenfold with distilled water and placed in a cuvette for particle analysis. The experiments were performed in triplicate. In addition, the morphology of 734N was observed by transmission electron microscopy (TEM) analysis (JEM-2000EXII instrument, JEOL Co., Tokyo, Japan). 734N was diluted 50-fold in pure water, placed onto a carbon-coated copper grid, and immediately stained with 0.5% (w/v) phosphotungstic acid. The sample was stored in a moisture-proof container until analysis. In addition, the shape and surface characteristics of lyophilized powder of 734THIF and 734N were observed using a scanning electron microscope (SEM; Hitachi S4700, Hitachi, Tokyo, Japan). Each sample was sputter-coated with gold–palladium under an argon atmosphere using a gold sputter module in a high-vacuum evaporator and then immediately determined using SEM set at 15 kV.
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