S4160 field emission scanning electron microscope
The S4160 is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It provides high-resolution imaging of samples by using a field emission electron source and advanced electron optics. The S4160 is designed for detailed analysis and characterization of a wide range of materials and surfaces at the micro and nanoscale level.
Lab products found in correlation
2 protocols using s4160 field emission scanning electron microscope
Characterizing GelMA Nanoparticles and Cell Seeding
Synthesis and Characterization of Novel Compounds
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