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S4160 field emission scanning electron microscope

Manufactured by Hitachi

The S4160 is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It provides high-resolution imaging of samples by using a field emission electron source and advanced electron optics. The S4160 is designed for detailed analysis and characterization of a wide range of materials and surfaces at the micro and nanoscale level.

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2 protocols using s4160 field emission scanning electron microscope

1

Characterizing GelMA Nanoparticles and Cell Seeding

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The GelMA nanoparticles were dispersed into water using stirring and sonication for 30 s. The dispersions were then applied on a clean glass slide, dried, and then vacuum-coated with gold. Digital images of the samples were acquired with a Hitachi S4160 field emission scanning electron microscope operating at 20 kV. Both scaffolds (i.e., PolyHIPE–GelPEG and X-PolyHIPE–GelPEG) were vacuum-coated with gold and then imaged. The pore size distribution of the scaffold was obtained by the manual measurement of the pore size using JMicrovision 1.2.7 software followed by a Gaussian fitting to the data. For each sample, at least 100 pores were evaluated and sized. Also, 5 × 104 cells were seeded on the scaffolds in a 24-well plate and incubated. 48 h after seeding, the scaffolds were taken out from wells and fixed with 70% ethanol. The scaffolds were placed on glass slides and then vacuum-coated with gold.
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2

Synthesis and Characterization of Novel Compounds

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All chemicals were either prepared in our laboratory or were purchased from Merck and Fluka. Reaction monitoring and purity determination of the products were accomplished by GLC or TLC on silica-gel polygram SILG/UV 254 plates. Gas chromatography was carried out on Shimadzu GC 14-A. IR spectra were obtained by a Shimadzu model 8300 FT-IR spectrophotometer. 1 (link) H NMR spectra were recorded on 400 MHz spectrometer in CDCl 3 . TGA was carried out on a Stanton Redcraft STA-780 with a 20 °C/min heating rate. Melting points were determined on a Fisher-Jones melting-point apparatus. XRD patterns were recorded by a Phillips X-ray diffractometer using graphite monochromatized Cu Kα radiation. A morphological study of the synthesized products was carried out directly by a Hitachi S4160 field emission scanning electron microscope (FESEM). Room temperature magnetic properties were investigated by Lakeshore device in an applied magnetic field sweeping between ±8000 Oe.
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