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Leo 1530 gemini sem

Manufactured by Zeiss
Sourced in Germany

The LEO 1530 Gemini SEM is a scanning electron microscope (SEM) designed for high-resolution imaging and material analysis. It features a Gemini electron column that provides a stable electron beam, enabling detailed observations of a wide range of samples. The SEM is equipped with various detectors to capture different types of signals, allowing for comprehensive characterization of the sample's surface and composition.

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7 protocols using leo 1530 gemini sem

1

Platinum Sputtering for SEM Imaging

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SEM images were taken with a Zeiss LEO 1530 Gemini SEM at gun voltages of 3 kV using the in-lens detector. To avoid charging, samples were sputtered with Pt before measurement using a Bal-Tec MED 020 modular high vacuum coating system (with an argon pressure of 2 × 10−5 bar and a current of 30 mA, 7-nm Pt).
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2

Comprehensive Characterization of LPEI/Silica Composites

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Thermogravimetric analysis (TGA) was performed with a TA Instruments Q500 Thermogravimetric Analyzer. Nitrogen gas sorption isotherms of LPEI/silica composite particles at 77 K were recorded with a Quantachrome NOVA 2000 Series instrument. Prior to measurements, the samples were heated for 2 h in vacuum at 110 °C (LPEI/silica hybrid particles) and 150 °C (calcined silica nanotubes), respectively. Energy-dispersive X-ray spectroscopy (EDX) was performed with a XL30 FEG ESEM (environmental scanning electron microscope, FEI/Philips) equipped with an EDAX SiLi detector. The ESEM was used for electron micrographs in low-vacuum mode (0.6 mbar) and a Leo 1530 Gemini SEM (Zeiss) was used for recording scanning electron micrographs in high-vacuum mode, in all cases without sputtering the samples. TEM investigations were performed using a JEOL 2100F microscope with a FEG electron source operated at 200 kV. The microscope is equipped with a Gatan image filter. Holey carbon-coated copper grids were used for sample preparation. Atomic force topographic images were sampled by means of an Agilent 5500 AFM with MAC III controller operating in tapping mode. A polynomial background subtraction was applied for image processing.
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3

Morphology and Optical Characterization

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The morphology of the samples was characterized using an S-4800N SEM (Hitachi, Japan) and an LEO 1530 Gemini SEM (Zeiss, Germany), and a Multimode-8 atomic force microscope (Bruker, USA). UV-vis transmittance spectra were collected on an HR2000+ ultraviolet/visible/near-infrared spectrometer (Ocean Optics, USA). All transmittance values presented in this paper were normalized to the absolute transmittance through the bare COC film substrate. Raman spectra were collected on a QE65 Pro Raman spectrometer (Ocean Optics, USA) using a 785 nm laser source. X-ray diffraction (XRD) spectra were recorded on a SmartLab X-ray diffractometer (Rigaku, Japan). The sheet resistance was measured by a Keithley 2400 source meter with a four-probe tester.
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4

Transmission Electron Microscopy Sample Preparation

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The diluted (1:10 or 1:5) sample was sonicated for 4 min at room temperature (Elmasonic P, Elma Schmiedhauer GmbH, Germany, 37 kHz, 50% power) and 5 µl sample was then placed on a copper grid (Quantifoil R, 1.2/1.3, Quantifoil Micro Tools GmbH, Germany). The sample was rinsed with a small amount of Tris buffer before being air-dried on top of a filter paper. The copper grid was then placed on an aluminum SEM specimen stub and coated with 7-nm platinum layer (CCU-010, Safematic GmbH, Switzerland). The samples were examined in a LEO 1,530 Gemini SEM (Carl Zeiss GmbH Jena, Germany) operated at 4 kV acceleration voltage. Images were acquired by the InLens detector.
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5

PTFE Surface Modification Characterization

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Fourier transform infrared (FTIR) spectra were recorded in transmittance mode to verify the modifications using a Bruker Tensor 27 spectrometer in the range of 4000–600 cm−1, with a resolution of 4 cm−1. X-ray photoelectron spectroscopy (XPS) measurements of different modified PTFE samples were performed on an X-ray photoelectron spectrometer with a focused, monochromatic K-alpha X-ray source and a monoatomic/cluster ion gun (Thermo Scientific). The C1s core-level signal spectra were Gaussian fitted and the proportion of each bond was determined from the peak area ratios. Scanning electron microscopy (SEM) was used to characterize the morphological properties. Samples were first coated with a thin layer of gold and then imaged using a fully digital LEO GEMINI 1530 SEM (Zeiss, Germany) at a voltage of 3 kV. The surface topography of different modified PTFE samples was analyzed using a Bruker BioScope Catalyst atomic force microscope (AFM) in tapping mold. The wettability of the modified PTFE samples was measured by a video contact angle instrument (Dataphysics, OCA 15) using 7 μL of DI water droplets with the sessile drop method.
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6

Characterizing Scaffold Porous Structure via SEM

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Scanning electron microscopy (SEM) was used to characterize the morphological properties. Scaffolds were cryofractured in liquid nitrogen to expose undamaged porous structures and coated with a thin layer of gold, then imaged using a fully digital LEO GEMINI 1530 SEM (Zeiss, Germany) at a voltage of 3 kV. The pore sizes and pore densities of the scaffolds were measured from SEM images using the Image Pro-Plus software. The average pore diameter was calculated using Equation 1 to convert the surface average diameter to the volume average diameter.[42 ]
D3=1Ni=1NDi3
Equation 2 was used to calculate the volumetric pore density,
Poredensity=(NA)32 where Di is the diameter of an individual pore, N is the number of pores, and A is the area of the SEM image.
The porosities of the scaffolds were measured using a solvent replacement method.[43 (link)] Dried scaffolds were immersed in absolute ethanol for 2 h and weighed after excess ethanol on the surface was blotted. The porosity was calculated using Equation 3,
Porosity=(M2M1)/ρV where M1 and M2 are the mass of scaffolds before and after soaking in absolute ethanol, respectively; ρ is the density of absolute ethanol, and V is the volume of the scaffolds.
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7

Characterizing Electrospun Membrane Morphology

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The morphology of the electrospun membranes was observed using scanning electron microscopy (SEM). The electrospun membranes were wrapped on a cover slip and coated with a thin film of gold for 40 s. The samples were observed on a fully digital LEO GEMINI 1530 SEM (Zeiss, Germany) at a voltage of 3 kV. The orientation angle and diameter of the fibers were measured from SEM images using the Image Pro-Plus software. The angle between fibers and the vertical direction was measured as the fiber orientation angle; 50 fibers were measured for each sample. The fiber diameter was the average value of at least 50 fibers.
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