Scanning electron microscopy (SEM) images were obtained using a TESCAN MIRA3 microscope (TESCAN Ltd, Czech Republic). X-ray diffraction (XRD) patterns were recorded with a SmartLab X-ray diffractometer (Rigaku Co., Japan, via a Cu Kα radiation source). Raman spectroscopy was recorded by the ANDOR Kymera-328i apparatus (Andor Tech. Ltd., United Kingdom, at 532 nm excitation wavelength with 50 × objective, in the range of 100–2000 cm−1). Transmission electron microscopy (TEM) and TEM-based elemental mapping and electron dispersive spectroscopy (TEM-EDS) were all recorded by a JEOL 2100 instrument coupled to an energy-dispersive X-ray analyser (EDX, JEOL Ltd, Japan).
Mira3 microscope
Manufactured by TESCAN
Sourced in Czechia
The TESCAN Mira3 is a scanning electron microscope (SEM) that provides high-resolution imaging capabilities. It is designed to deliver detailed, high-quality images of a wide range of samples. The Mira3 offers advanced features and functionalities to support various research and analysis applications.
Automatically generated - may contain errors
Lab products found in correlation
Mini 2, by Microtrac (2 mentions)
Sigma 300, by Zeiss (2 mentions)
Smartlab x ray diffractometer, by Rigaku (1 mentions)
Sigma 500 vp, by Zeiss (1 mentions)
Tecnai f30, by Philips (1 mentions)
D5000, by Siemens (1 mentions)
Tensor 27 spectrophotometer, by Bruker (1 mentions)
5973 mass spectrometer, by Agilent Technologies (1 mentions)
Jem 2100 plus electron microscope, by JEOL (1 mentions)
Uv vis spectrophotometer, by PerkinElmer (1 mentions)
Tcs sp5 microscope, by Leica (1 mentions)
Leo 906, by Zeiss (1 mentions)
Novaa 400, by Analytik Jena (1 mentions)
Tensor 27, by Bruker (1 mentions)
X flash 6 30 detector, by Bruker (1 mentions)
Empyrean diffractometer, by Malvern Panalytical (1 mentions)
S 4160, by Hitachi (1 mentions)
Pvp 25000, by Merck Group (1 mentions)
Uv 2550, by Shimadzu (1 mentions)
Single reflectance atr instrument, by Specac (1 mentions)
17 protocols using mira3 microscope
1
Characterization of Nanomaterials Using Advanced Spectroscopy
2
Comprehensive Analysis of Red Mud Composition
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The analysis of red mud’s composition was carried out by X-ray fluorescence (XRF) spectrometer (Philips, Netherland) based on ISO/IEC 17025:2005 standard. Philips Expert System X-ray diffractometer (XRD) was employed for the mineralogical study with CuKa radiation and Ni-filter at 40 kV and 30 mA, at 2Ɵ range of 5°–80° with a scanning rate of 2°/min, an anti-scatter and receiving slit of 1° and 0.01 mm, respectively. Dynamic light scattering (DLS) technique was employed to find the distribution of particle size of red mud, using a scatteroscope I device (DLS, Nanotrac Wave from Microtrac Company). To study the morphology of samples, FESEM (SIGMA VP-500, ZEISS, Germany) was applied at an accelerating voltage of 15 kV. The elemental mapping and energy-dispersive X-ray spectroscopy (EDX) spectra were accomplished using Energy Dispersive X-ray Spectroscopy probe (Oxford Instruments, England). Transmission electron microscopy (TEM, Tecnai F30, Philips, Netherland) and scanning electron microscopy (SEM, TESCAN MIRA3 Microscope, Netherland) were utilized to investigate the morphology. The specific surface area and porosity of red mud, γ-Al2O3 and α-Fe2O3 were determined by nitrogen sorptometry analysis at 77 K performed with the BELSORP MINI II, Japan. Before any nitrogen sorptometry test, the samples were degassed at 180 °C for 3 h.
3
Comprehensive Materials Characterization
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The morphology of materials was studied through the SEM using a Tescan Mira3 microscope (Czech Republic) equipped with EDS and elemental mapping. The crystallographic properties were measured by an X-ray powder diffractometer (Siemens, D5000, Germany). The functional groups on the surface of the synthesized materials were detected by FTIR analysis using a Bruker Tensor 27 spectrophotometer (KBr disk, Germany). Additionally, an atomic absorbance spectrometer (ASS) was used to measure leached Cu amounts in solution using an Analytik Jena novAA® 400 (Germany).
4
Comprehensive Material Characterization Protocol
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For morphological and elemental composition examinations, the FE-SEM images and the EDX spectra were collected using a Tescan Mira3 microscope (Czech Republic) at an acceleration voltage of 15 kV. By exposing the sample to Cu K radiation at 40 kV and 100 mA, the XRD patterns were obtained on a powder X-ray diffractometer (Siemens, Germany). To record the HRTEM pictures, a JEM-2100 Plus electron microscope was used (JEOL, Japan). The Thermo Scientific Escalab 250 Xi Plus XPS spectrometer (UK) was used in order to carry out the XPS measurements. By analyzing the N2 adsorption and desorption isotherms at 77 Kelvin using the Belsorp Mini II (Japan), isotherm of the powder was recorded, and the specific surface area of the sample was determined using BET method. With barium sulfate serving as a standard, UV-DRS measurement was performed using an UV-vis spectrophotometer (PerkinElmer, USA). As part of the analysis of the intermediates formed during the oxidation of OTC, a gas chromatography instrument with an Agilent 5973 mass spectrometer was used (Palo Alto, California).
5
Nanomaterial Structural Characterization
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Analysis of nanomaterial structures was done with field emission scanning electron microscopy (FESEM) and energy dispersive X-ray (EDX) techniques with a FESEM, TESCAN MIRA3 microscope. A high-resolution transmission electron microscope (HRTEM) with the Zeiss Libra model was used to examine the morphology of nanocomposite and nanoparticles. Further analyses were conducted on the nanomaterials used in the preparation of the immunosensor with XRD (X-pert pro analytical model) and FTIR (Thermo-Avatar spectrometer). Electrochemical experiments were performed by the conventional three-electrode system.
6
Microscopic Analysis of Emulsions and Microcapsules
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Confocal scanning laser microscopy. Confocal scanning laser microscopy served to observe initial RPE/O/W DEs and rehydrated microcapsules using Leica TCS SP5® microscope (Leica Microsystems GmbH, Wetzlar, Germany) according to Su et al. (29 (link)) with certain modifications. A volume of 1 mL of the emulsion was firstly transferred to a concave glass slide and stained with Nile blue (0.1 mL of 1%, m/V, in distilled water). Slides were covered with cover slide and images of emulsions were captured with a 100× magnification lens at wavelength of 488 nm by using Ar and He/Ne lasers.
Scanning electron microscopy. The microstructure of spray-dried microcapsules containing rosemary polyphenols was captured by scanning electronic microscopy (SEM) analysis, and evaluated using a TESCAN Mira3 microscope (Brno, Czech Republic). Microcapsules were attached to SEM stubs using a two-sided adhesive tape, and specimens were coated with a gold layer (50 nm). Images were scanned using an acceleration voltage of 5 kV.
Scanning electron microscopy. The microstructure of spray-dried microcapsules containing rosemary polyphenols was captured by scanning electronic microscopy (SEM) analysis, and evaluated using a TESCAN Mira3 microscope (Brno, Czech Republic). Microcapsules were attached to SEM stubs using a two-sided adhesive tape, and specimens were coated with a gold layer (50 nm). Images were scanned using an acceleration voltage of 5 kV.
7
Comprehensive Characterization of Materials
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XRD (Tongda-TD-3700, China, Cu Kα radiation: λ = 1.5406 A0; 30 kV, 20 mA) was performed to analyze the crystallographic characteristics of the samples. SEM images were obtained using a Tescan Mira3 microscope (Czech Republic). Transmission electron microscopy (TEM) (Leo 906 Zeiss, Germany) was performed at 100 kV. Functional groups of the samples were investigated using an FTIR spectrometer (400–4000 cm−1, Tensor 27, Bruker, Germany) using a KBr disk. DRS spectra were obtained using an Analytik Jena spectrophotometer (S 250, Germany) to determine the band gap. The surface area of the samples was tested by the Brunauer-Emmett-Teller (BET) method using Brunauer-Emmett-Teller Surface Area & Porosity Analyzer (Belsorp Mini II, Japan). Atomic absorption spectroscopy (AAS; NovAA 400, Analytik Jena, Germany) was performed to evaluate the amount of Zn leached into the solution. GC–MS (6890 N/5973 N, Agilent, USA) was used to identify the intermediates generated during the degradation of pollutants. Mot-shotky test weas conducted by Origa Flex-OGF 01A Potentiostate/Galvanostate using a three-electrode setup in 0.5 M Na2SO4 solution (electrolyte).
8
Characterization of Silver Nanoparticles
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The absorption spectra of Ag colloids and selected decolorization experiments were recorded using a UV/Vis spectrometer (CE 204, CECIL, Buck Scientific, Norwalk, CT, USA) from 300 to 1000 nm.
For the study of the size and morphology of the silver nanoparticles (AgNPs), a FEI Spirit Twin with LaB6 filament transmission electron microscope (TEM) was used operating at a voltage of 80 kV.
Materials surface analysis was developed in a Tescan Mira 3 microscope equipped with a Schottky Field Emission Gun (Schottky FEG-SEM) that allows us to obtain a resolution of 1.2 nm at 30 keV. The elemental analysis was obtained by Energy Dispersive Spectroscopy (EDS), which was performed on the SEM chamber at 30 kV using a Bruker X-Flash 6|30 detector, with a 123 eV resolution at Mn Kα.
The crystallographic structure was determined by X-Ray Diffractometry (XRD). The XRD was carried out using an Empyrean diffractometer from PANalytical operating in a θ–2θ configuration (Bragg-Brentano geometry) and equipped with a Cu X-ray tube (Kα radiation λ = 1.54056 Å) operating at 40 kV and 40 mV.
For the study of the size and morphology of the silver nanoparticles (AgNPs), a FEI Spirit Twin with LaB6 filament transmission electron microscope (TEM) was used operating at a voltage of 80 kV.
Materials surface analysis was developed in a Tescan Mira 3 microscope equipped with a Schottky Field Emission Gun (Schottky FEG-SEM) that allows us to obtain a resolution of 1.2 nm at 30 keV. The elemental analysis was obtained by Energy Dispersive Spectroscopy (EDS), which was performed on the SEM chamber at 30 kV using a Bruker X-Flash 6|30 detector, with a 123 eV resolution at Mn Kα.
The crystallographic structure was determined by X-Ray Diffractometry (XRD). The XRD was carried out using an Empyrean diffractometer from PANalytical operating in a θ–2θ configuration (Bragg-Brentano geometry) and equipped with a Cu X-ray tube (Kα radiation λ = 1.54056 Å) operating at 40 kV and 40 mV.
9
Synthesis and Characterization of Nanostructured Copper Chromite
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All the chemicals applied for the synthesis of nanostructured copper chromite including CrCl3.6H2O, Cetyltrimethylammonium bromide (CTAB), CuCl2.2H2O, sodium dodecyl sulphate (SDS), zinc granule, ethylenediamine (en), HCl, polyvinylpyrrolidone (PVP-25000) and methanol were purchased from Merck Company and were applied as received. Morphological characteristics of the copper chromite samples were studied by a Hitachi S-4160 field emission scanning electron microscope (FESEM). The energy dispersive spectrometry (EDS) analysis was investigated by Tescan mira3 microscope. Fourier transform infrared spectra of the as-synthesized samples were obtained applying KBr pellets on an FT-IR spectrometer (Magna-IR, 550 Nicolet) in the 400–4000 cm-1 range. TEM micrographs of as-prepared nanostructured copper chromite were obtained on a JEM-2100 with an accelerating voltage of 200 kV equipped with a high resolution CCD Camera. Powder X-ray diffraction (XRD) patterns of as-synthesized products were collected from a Philips diffractometer applying X’PertPro and the monochromatized Cu Ka radiation (l = 1.54 Å). The UV-vis diffuse reflectance spectra of the as-produced nanostructured copper chromite were obtained on a UV-vis spectrophotometer (Shimadzu, UV-2550, Japan).
10
Comprehensive Material Characterization Techniques
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Elemental analysis
and thermogravimetric
analysis (TGA with a heating rate of 10 °C/min under nitrogen
from 30 to 600 °C) were performed by the University of Manchester,
Department of Chemistry microanalytical laboratory. Powder X-ray diffraction
(p-XRD) was performed using Bruker D8 Advance diffractometer. All
samples were scanned between 10° to 80° using Cu Kα
radiation (λ = 1.5406 Å) with step 0.02° and integration
time of 3 s. Infrared spectra were recorded on a Specac single reflectance
ATR instrument (4000–400 cm–1, resolution
4 cm–1). Scanning electron microscopy (SEM) was
carried out using a TESCAN Mira3 microscope. Energy-dispersive X-ray
(EDX) spectroscopy was performed with an LC FEGSEM + OI EBSD + EDX
instrument.
and thermogravimetric
analysis (TGA with a heating rate of 10 °C/min under nitrogen
from 30 to 600 °C) were performed by the University of Manchester,
Department of Chemistry microanalytical laboratory. Powder X-ray diffraction
(p-XRD) was performed using Bruker D8 Advance diffractometer. All
samples were scanned between 10° to 80° using Cu Kα
radiation (λ = 1.5406 Å) with step 0.02° and integration
time of 3 s. Infrared spectra were recorded on a Specac single reflectance
ATR instrument (4000–400 cm–1, resolution
4 cm–1). Scanning electron microscopy (SEM) was
carried out using a TESCAN Mira3 microscope. Energy-dispersive X-ray
(EDX) spectroscopy was performed with an LC FEGSEM + OI EBSD + EDX
instrument.
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