The largest database of trusted experimental protocols

Cu kα radiation

Manufactured by Rigaku
Sourced in Japan

Cu Kα radiation is a type of X-ray radiation generated by a copper (Cu) target in an X-ray tube. It is a commonly used X-ray source in various analytical techniques, such as X-ray diffraction (XRD) and X-ray fluorescence (XRF). The Cu Kα radiation has a well-defined energy spectrum, with the primary peak at a wavelength of approximately 1.54 Å, which makes it a useful tool for materials characterization and structural analysis.

Automatically generated - may contain errors

26 protocols using cu kα radiation

1

Thermal, Spectroscopic, and Structural Analysis

Check if the same lab product or an alternative is used in the 5 most similar protocols
The simultaneous thermal analysis (TG-DSC) was performed with a type of STA 449C (NETZSCH, Selb, Germany) to measure the mass changes and caloric data. It was operated at a constant ramping rate of 10 ℃/min. A dual atmosphere was proposed, first in an oxidizing atmosphere until 420 °C was reached and then in pure nitrogen to 1000 °C, with the purge gas at a flow rate of 50 mL/min. Crucibles were made of aluminum oxide.
The Fourier transform infrared spectrum (FT-IR) characterization was performed at room temperature with an Equinox 55 spectrometer (Rosenhiem, Germany).
The X-ray diffraction (XRD) measurements were carried out on a diffractometer using Cu Kα radiation at a generation rate of 40 KV and a current of 250 mA (Rigaku, Japan).
The scanning electron microscopy (SEM) was performed on a Quanta 200 (FEI, Fremont, CA, USA) at an accelerating voltage of 15 kV. The samples were sputtered with thin layers of Au.
+ Open protocol
+ Expand
2

Comprehensive Characterization of Organic Compounds

Check if the same lab product or an alternative is used in the 5 most similar protocols
One-dimensional and two-dimensional NMR spectra were acquired in CDCl3 with a Bruker Avance 400 MHz NMR spectrometer (Fällanden, Switzerland). HR–ESI–MS data were measured using a maXis Q-TOF mass spectrometer in positive ion mode (Bruker, Fällanden, Switzerland). UV and CD spectra were acquired using a JASCO J-810 circular dichroism spectrometer (JASCO International Co. Ltd., Hachioji, Tokyo, Japan). X-ray diffraction intensity data were recorded on an XtalLAB PRO single-crystal diffractometer, using Cu-Kα radiation (Rigaku, Japan). The data were corrected for absorption, using CrysAlisPro 1.171.39.33c (Rigaku Oxford Diffraction, 2017). Optical rotations were acquired using an MCP-500 polarimeter with a 1.0 mL cell (Anton, Austria). HPLC was performed on the Hitachi Primaide with the YMC ODS SERIES column (YMC-Pack ODS-A, YMC Co. Ltd., Kyoto, Japan, 250 × 10 mm I.D., S-5 μm, 12 nm). Column chromatography (CC) was carried out on silica gel (200–300 mesh, Qingdao Marine Chemical Factory, Qingdao, China) and Sephadex LH-20 (40–70 μm, Amersham Pharmacia Biotech AB, Uppsala, Sweden). TLC plates with silica gel GF254 (0.4–0.5 mm, Qingdao Marine Chemical Factory, Qingdao, China) were used for the analyses.
+ Open protocol
+ Expand
3

Characterization of Gel Polymer Electrolytes

Check if the same lab product or an alternative is used in the 5 most similar protocols
Fourier transform infrared spectra (FT-IR) of the electrolytes were obtained with a FT-IR spectrometer (Nicolet iS5, ThermoFisher Scientific, Waltham, MA USA.) and X-ray diffraction spectroscopy was done using X-ray diffractometer (Cu-Kα radiation, Rigaku Corporation, Tokyo, Japan). Differential scanning thermograms were obtained with a Differential scanning calorimeter (model DSC6000, PerkinElmer, Waltham, MA USA.) instrument at the heating rate of 5 °C min−1. All electrochemical measurements were conducted using an electrochemical analyser (AUTOLAB12/FRA2, Metrohm, Herisau, Switerland). The conductivity of the gel polymer electrolytes was determined by electrochemical impedance spectroscopy (EIS) by sandwiching the electrolyte between two platinum-coated conductive FTO glasses at a distance of about 50 µm, and the conductive side of one plate was properly masked with an insulating tape, leaving an open area of 1 cm2. The photovoltaic properties of the fabricated solar cells were determined by illuminating under a solar simulator from a 150 W Xe light source in combination with standard AM1.5 (85 mW cm−2). The electrochemical impendence spectra of the cells were obtained by forward bias at open circuit voltage in dark conditions from 1 Hz to 106 MHz with a perturbation voltage of 10 mV.
+ Open protocol
+ Expand
4

Multimodal Characterization of Materials

Check if the same lab product or an alternative is used in the 5 most similar protocols
Transmission electron microscopy (TEM) images of materials were observed from a JEOL-2010 high-resolution transmission electron microscope (JEOL Ltd., Japan). XRD tests were performed on Rigaku TTR-III with Cu Kα radiation (Rigaku Corp., Japan). Raman spectra were collected on LABRAM-HR Raman spectrometer (JY Co., France) with an excitation wavelength of 514.5 nm generated by an Agon laser. XPS was determined by using ESCALAB 250 with a monochromatic Al Kα X-ray source (Thermo-VG Scientific Inc., USA).
+ Open protocol
+ Expand
5

Powder X-ray Diffraction Analysis

Check if the same lab product or an alternative is used in the 5 most similar protocols
Bulk samples were analyzed on a Rigaku D/max−2550 diffractometer at 40 kV and 150 mA using Cu-Kα radiation (λ = 1.54187 Å) (Rigaku, Tokyo, Japan) to obtain PXRD patterns. The measurements were performed at a continuous scan rate of 8° min−1 over a 2θ range of 3° to 40°. The data were further analyzed and imaged using Jade 6.5 software [61 ]. The simulated PXRD patterns were obtained using the Mercury program [62 (link)] based on the SCXRD data.
+ Open protocol
+ Expand
6

Multimodal Characterization of Materials

Check if the same lab product or an alternative is used in the 5 most similar protocols
X-ray diffraction (XRD) patterns were acquired with a Rigaku D/MAX using Cu-Kα radiation (Rigaku Corporation, Japan). The sample morphologies were imaged with scanning electron microscopy (SEM, Quanta FEG-250, FEI Co. Ltd., USA) and transmission electron microscopy (TEM, TecnaiG220S-Twin, USA). X-ray photoelectron spectra (XPS) were acquired with a Thermo Escalate 250Xi XPS spectrometer (Thermo Scientific, USA). RR spectra were acquired with a confocal Raman spectrometer (Horiba Lab Ram HR evolution, Japan). Vibrating sample magnetometry measurements were performed with a 736-VSM Controller (Ohio, USA).
+ Open protocol
+ Expand
7

Comprehensive Bioceramics Characterization

Check if the same lab product or an alternative is used in the 5 most similar protocols
The XRD patterns of different bioceramics were determined using a glancing angle X-ray diffractometer with Cu-Kα radiation (Rigaku, Japan). The XRD was performed at 35 kV and 35 mA with a step size of 0.02° (2θ).
The composition of different bioceramics was investigated through XPS (PE PHI-5300, USA) experiments using focused monochromatized Al K radiation (hv = 1486.6 eV). A hemispherical analyzer was used for the analysis of the generated photoelectrons and the core level XPS spectra for O1s, S2p, N1s, and C1s was measured.
Fourier transform infrared spectroscopy (FTIR) (Nicolet 6700, Thermo Scientific, USA) from 4000 to 550 cm−1 using KBr pellets was also used to determine characteristic functional groups on the surfaces of different BCP ceramics.
+ Open protocol
+ Expand
8

Structural and Electrochemical Analysis of Ruthenium Oxide Quantum Dots

Check if the same lab product or an alternative is used in the 5 most similar protocols
X-ray diffraction (XRD) patterns were performed on a Rigaku Smart-lab diffractometer at a scanning rate of 4° per min in the twoθ ranges from 10° to 70° with Cu-Kα radiation (λ = 0.15405 nm) (Rigaku, Tokyo, Japan). Microscope images were recorded digitally with either a scanning electron microscope (SEM, JSM-6480A) (JEOL, Tokyo, Japan) or a transmission electron microscope (TEM, FEI Tecnai F 30) (FEI, Hillsboro, USA). Software (Image pro plus) measured the average size and size distribution of ruthenium oxide quantum dots. In the representative TEM images, 100 particles of different sizes were randomly selected in the region for statistical analysis. N2 adsorption/desorption isotherms were obtained on a Micromeritics ASAP Tristar II 3020 apparatus at 77K (ULVAC-PHI, Tokyo, Japan). Pore size distribution was calculated by the density functional theory (DFT) method. X-ray photoelectron spectra (XPS) measurements were carried out on a VG ESCALAB MK II electron energy spectrometer using Mg KR (1253.6 eV) as the X-ray excitation source. Raman spectra were acquired with a confocal laser micro-Raman spectrometer (LABRAMHR, London, UK). The electrochemical measurements were carried out with a Zahner electrochemical workstation. All measurements were performed at room temperature.
+ Open protocol
+ Expand
9

Comprehensive Material Characterization

Check if the same lab product or an alternative is used in the 5 most similar protocols
The morphological of all samples was observed by a Supra 55 scanning electron microscopy (SEM). The X-ray diffraction (XRD) patterns were recorded by a D/max 2500 PC diffractometer with a Cu Kα radiation (wavelength = 1.54056 Å, Rigaku, Japan) at room temperature. The microscopic features were executed using transmission electron microscope (TEM, JEOL 2100F) at 200 kV. Raman spectroscopy was conducted by using a JY-HR800 micro-Raman spectrometer with a × 50 objective and 532 nm excitation light emitted from a He–Ne laser. Nitrogen adsorption–desorption isotherms of the samples was performed with nitrogen cryosorption Micromeritics QuadraSorb Station 1, and the surface area was measured by Brunauer–Emmett–Teller (BET) method.
+ Open protocol
+ Expand
10

Comprehensive Materials Characterization

Check if the same lab product or an alternative is used in the 5 most similar protocols
Optical absorption spectra and reflectance spectra of the samples were recorded using an ultraviolet-to-visible (UV-Vis) spectrophotometer (UV-4100). The Raman spectra of the samples were recorded using a Raman spectrometer (Renishaw InVia) at 532 nm. The particle size was measured using a laser diffraction particle size analyser (Mastersizer 3000, Malvern Panalytical Ltd., UK). Scanning electron microscopic (SEM) images and energy-dispersive spectroscopy (EDS) mappings were recorded using a Hitachi SU8010 scanning electron microscope equipped with an EMAX Energy Dispersive Spectrometer. The X-ray diffraction patterns of samples were recorded using a powder X-ray diffractometer (Rigaku Smartlab, Cu-Kα radiation) at a scanning speed of 2° per min. Fourier transform infrared (FT-IR) spectra of the samples were also recorded (PerkinElmer Frontier). Thermogravimetric analysis (TGA) of the samples was performed using a Netzsch TGA209F1 in the temperature range of 20–1000 °C at a speed of 30 °C min−1 in the ambient atmosphere. The composition was determined by X-ray photoelectron spectroscopy (XPS, ESCALAB 250XI, Thermo). The dispersion stability of inks was determined using a multisample analytical centrifuge – LUMiSizer® (L.U.M. GmbH, Berlin, Germany) employing the STEP™-Technology (Space and Time resolved Extinction Profiles).
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!