The SERS measurements were carried out using a Senterra dispersive Raman microscope (BRUKER). Confocal Raman spectroscopy was used to acquire SERS of the molecule-BO samples. Raman scattering was detected using a Peltier-cooled (−70°C) CCD camera (255 × 1024 pixels), focusing only within the fingerprint regions (500 to 1800 cm−1). Detection was carried out using 180° geometry and a near-infrared diode laser (785 nm) for the excitation. The spectrometer was equipped with a diffraction grating (1200 grooves/mm), and the slit provided a spectral resolution of 2 cm−1. The laser power at the sample ranged from 1 to 10 mW, and the acquisition time ranged from 1 to 5 s. The area of the laser spot on the samples was approximately 1 μm in diameter. The molecular markers with 1 μM concentration in ethanol were drop-casted on the BO sample surface before the measurement. The setup was calibrated using built-in templates and internal Raman standards.
Senterra dispersive raman microscope
Manufactured by Bruker
Sourced in Germany
The Senterra dispersive Raman microscope is a laboratory instrument designed for high-resolution Raman spectroscopy analysis. It provides precise, non-destructive characterization of a wide range of materials and samples. The Senterra utilizes a dispersive optical design to acquire Raman spectra, enabling efficient data collection and analysis.
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Lab products found in correlation
Frontier ft ir, by PerkinElmer (1 mentions)
Tecnai t12 microscope, by Thermo Fisher Scientific (1 mentions)
Vhx 5000, by Keyence (1 mentions)
Dimension fastscan microscope, by Bruker (1 mentions)
Jsm 7610f, by JEOL (1 mentions)
Opus version 6, by Bruker (1 mentions)
Opus version 7, by Bruker (1 mentions)
10 protocols using senterra dispersive raman microscope
1
SERS Characterization of Molecule-BO Samples
2
Comprehensive Characterization of Synthesized Samples
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The morphology
of the as-synthesized
samples was characterized using FE-SEM and TEM. The structural properties
were characterized using Raman spectra (Senterra dispersive Raman
microscope, Bruker) and XRD (PANalytical with Cu Kα radiation,
λ = 1.54056 Å) techniques. The functional groups on the
surfaces of the as-synthesized materials were determined by an FTIR
spectrometer (Frontier FT-IR, PerkinElmer). The surface area and porous
structures of the samples were measured by an N2 adsorption/desorption
technique (Autosorb 1 MP, Quantachrome). The BET model was used to
calculate the specific surface area of the sample.
of the as-synthesized
samples was characterized using FE-SEM and TEM. The structural properties
were characterized using Raman spectra (Senterra dispersive Raman
microscope, Bruker) and XRD (PANalytical with Cu Kα radiation,
λ = 1.54056 Å) techniques. The functional groups on the
surfaces of the as-synthesized materials were determined by an FTIR
spectrometer (Frontier FT-IR, PerkinElmer). The surface area and porous
structures of the samples were measured by an N2 adsorption/desorption
technique (Autosorb 1 MP, Quantachrome). The BET model was used to
calculate the specific surface area of the sample.
3
Multimodal Characterization of Polymer Substrates
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Dispersive
Raman analysis was performed on the cryo-cut cross sections
of the pretreated PC substrates with a Bruker SENTERRA dispersive
Raman microscope, using a 532 nm laser (20 and 10 Mw) and a 100× objective. Attenuated total
reflection Fourier transform infrared (ATR–FTIR) mapping was performed on a PerkinElmer Spotlight 400 FTIR-imaging system
with a germanium ATR crystal. A 200 × 200 μm2 area was measured by individual points with a 1.5 μm distance
and a 3 μm spatial resolution. Optical microscopy (OM)
imaging was carried out with an Olympus BX60 or Keyence VHX
5000 microscope. The images were viewed using UV illumination to localize
BP. UV–vis spectroscopy was performed on a
PerkinElmer LAMBDA 750 spectrometer equipped with a 150 mm integrating
sphere. The transmission electron microscopy (TEM)
images of the ultratomed (at −120 °C) cross sections of
PC substrates coated with Ch-LCs were observed using a FEI Tecnai
T12 microscope, with an operating voltage of 100 kV. For atomic
force microscopy (AFM) analysis, the
PC substrates coated with LCN were cut to size, held between holders,
and microtomed at RT, and the cross sections were characterized with
a Bruker Dimension FastScan microscope, using a quantitative nanoscale
mechanical (QNM) mode, at 1 and 0.5 Hz, RT.
Raman analysis was performed on the cryo-cut cross sections
of the pretreated PC substrates with a Bruker SENTERRA dispersive
Raman microscope, using a 532 nm laser (20 and 10 Mw) and a 100× objective. Attenuated total
reflection Fourier transform infrared (ATR–FTIR) mapping was performed on a PerkinElmer Spotlight 400 FTIR-imaging system
with a germanium ATR crystal. A 200 × 200 μm2 area was measured by individual points with a 1.5 μm distance
and a 3 μm spatial resolution. Optical microscopy (OM)
imaging was carried out with an Olympus BX60 or Keyence VHX
5000 microscope. The images were viewed using UV illumination to localize
BP. UV–vis spectroscopy was performed on a
PerkinElmer LAMBDA 750 spectrometer equipped with a 150 mm integrating
sphere. The transmission electron microscopy (TEM)
images of the ultratomed (at −120 °C) cross sections of
PC substrates coated with Ch-LCs were observed using a FEI Tecnai
T12 microscope, with an operating voltage of 100 kV. For atomic
force microscopy (AFM) analysis, the
PC substrates coated with LCN were cut to size, held between holders,
and microtomed at RT, and the cross sections were characterized with
a Bruker Dimension FastScan microscope, using a quantitative nanoscale
mechanical (QNM) mode, at 1 and 0.5 Hz, RT.
4
Comprehensive Characterization of As-Prepared Samples
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The morphology and element of the as-prepared samples were characterized by Field Emission Scanning Electron Microscopy (FESEM) and Energy-dispersive X-ray spectroscopy (EDX) using JEOL (JSM-7610F) instrument operated at 1 kV. The structure of all samples was examined by RAMAN using a Senterra Dispersive Raman Microscope (Bruker) with an excitation wavelength of 532 nm, Fourier transform infrared spectroscopy (FTIR) using PerkinElmer instrument, and powder X-ray diffraction (PXRD, Bruker, Germany) using a monochromatic Cu Kα radiation (λ = 0.15405 nm). The as-tested electrodes and interlayers disassembled were washed several times with a DOL/DME mixture in a volume ratio of 1:1 and dried in a vacuum oven at 60 °C overnight prior to the ex situ FESEM-EDX, RAMAN, and XRD measurement.
5
Benzenethiol Self-Assembled Monolayer on Quasi-3D PCs
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A self-assembled monolayer of benzenethiol on top of the quasi-3D PCs was prepared by immersing them in a 15 mM benzenethiol ethanolic solution for 12 h, rinsing thoroughly with ethanol, and then drying with a stream of nitrogen gas. SERS measurements were made using a SENTERRA dispersive Raman microscope (Bruker Optics) with an excitation laser wavelength of 785 nm, an excitation power of ≈5 mW, focal length of 45 mm and acquisition time of 30 s. Raman spectra were collected over a Raman shift range of 500–1800 cm−1.
6
Raman Spectroscopy of Materials under Cryogenic Conditions
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Raman spectra were recorded with a Bruker Senterra Dispersive Raman microscope equipped with a Neon lamp and using a Nd:YAG laser with excitation at λ = 785 nm and 10 mW power at sample point. The microscope is coupled with a CCD 1 × 1 camera thermoelectrically cooled to −50 °C. A 40× magnification objective (Olympus) was employed and the laser spot size on sample was 1 μm. Each Raman spectrum was the average of 20 scans (4 accumulations of 10 seconds each) with a 3–5 cm−1 resolution. Sample integrity was checked after each measurement and spectra were registered at different temperatures, from 300 K to liquid N2 temperature, using a Linkam variable temperature sample cell. Samples were measured directly in the holder, in bulk and without previous preparation. Baseline correction was performed with OPUS 6.5 software.
7
Micro-Raman Spectroscopy for Residual Stress Mapping
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Micro-Raman spectroscopy is capable of characterizing types of stresses (Tensile/Compressive) within a small measurement spot size, below 5 μm in diameter, and a submicron spatial resolution30 . Although Micro-Raman spectroscopy was mostly being used in chemical composition studies as a complementary technique to other methods, deducing crystallinity information is advantageous to this technique as a non-destructive method to measure residual stress29 . Raman spectra were obtained using a Bruker SENTERRA, Dispersive Raman Microscope having a central wavelength of 532 nm as an excitation source. The Raman shift measurements were taken perpendicularly along the IRS of several samples at 10 μm intervals. Through the known relationship between the Raman shift and stress, the stress distributions on the laser-treated samples were determined.
8
Raman Analysis of Isomeric Compounds
9
Raman Spectroscopy for Drug Interaction Analysis
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Raman technique was used to evaluate drug interactions and changes in the formulations. For each given sample, 2 cm × 2 cm area of lyophilized powder was transferred onto microscopic glass and then pressed by hand to get a flat surface of the material. Powder chemical analysis was done by Raman point-by-point mapping experiments using a Senterra dispersive Raman microscope (Bruker Optics, Germany) equipped with a 785 nm laser using maximum laser power (100 mW). Integration time was set to 10 s per spectrum with 2 co-additions. Mapping spectra were extracted directly from the experiment as the average of 2 spectra of each point. The objective used was a 20× confocal objective (Olympus Microscope, Japan) with a 50 µm pinhole. The analyzed surface was 800 µm × 1050 µm with step size in x-axis 20 µm and in y-axis 21 µm, which gave a total of 2091 points (spectra). The most representative spectra were chosen and acquired in an area from 1800 to 450 cm -1 . All the data were acquired and manipulated by Bruker Optics software OPUS version 7.5.
10
Confocal Raman Spectroscopy of Bacteria-Nanoparticles
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The measurements were made on a Senterra dispersive Raman Microscope (BRUKER, Sweden).
Confocal Raman spectroscopy was used to acquire Raman and SERS spectra of bacteria-nanoparticles samples. Raman spectra were obtained using a near-infrared diode laser (785 nm) as an excitation and collecting the Raman scattering in 180° geometry by a Peltier cooled (-70 °C) charge-coupled device (CCD) camera (255×1024 pixels), focusing only within the fingerprint regions (400-2000 cm -1 ). For all biological samples, a near-IR (785 or 800 nm) laser is a superior light source in order to avoid fluorescence and photodecomposition interference observed with all visible range excitation sources. The spectrometer was equipped with a diffraction grating of 1200 grooves/mm and the slit gave a spectral resolution of 2 cm -1 . The laser power at the sample ranged from 1 to 10 mW and the acquisition time ranged from 1 to 5 seconds. Microscope objectives (20, 50 and 100x, NA 0.40, 0.75 and 0.9) were used to focus the laser light on the sample, which consisted of 20 to 50 µL drop of mixed sample on a cleaned microscopic slide. The area of the laser spot on the samples was approximately 1 µm in diameter (when using 100x objective). The system was calibrated using built-in templates and internal Raman standards.
Confocal Raman spectroscopy was used to acquire Raman and SERS spectra of bacteria-nanoparticles samples. Raman spectra were obtained using a near-infrared diode laser (785 nm) as an excitation and collecting the Raman scattering in 180° geometry by a Peltier cooled (-70 °C) charge-coupled device (CCD) camera (255×1024 pixels), focusing only within the fingerprint regions (400-2000 cm -1 ). For all biological samples, a near-IR (785 or 800 nm) laser is a superior light source in order to avoid fluorescence and photodecomposition interference observed with all visible range excitation sources. The spectrometer was equipped with a diffraction grating of 1200 grooves/mm and the slit gave a spectral resolution of 2 cm -1 . The laser power at the sample ranged from 1 to 10 mW and the acquisition time ranged from 1 to 5 seconds. Microscope objectives (20, 50 and 100x, NA 0.40, 0.75 and 0.9) were used to focus the laser light on the sample, which consisted of 20 to 50 µL drop of mixed sample on a cleaned microscopic slide. The area of the laser spot on the samples was approximately 1 µm in diameter (when using 100x objective). The system was calibrated using built-in templates and internal Raman standards.
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