The lyophilized cakes were investigated with an RINT-2000 X-ray diffractometer (Rigaku, Tokyo, Japan) equipped with a copper anode (40 kV, 40 mA). The samples were measured from 5 to 40° at a step rate of 2θ = 0.02° with 0.12 s measurement time per step.
Rint2000 x ray diffractometer
Manufactured by Rigaku
Sourced in Japan
The RINT2000 X-ray diffractometer is a laboratory instrument designed for the analysis of crystalline materials. It uses X-ray diffraction techniques to identify and characterize the atomic and molecular structure of solid samples. The RINT2000 can perform various measurements, including phase identification, quantitative analysis, and structural characterization of a wide range of materials.
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Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Ve 8800 scanning electron microscope, by Keyence (1 mentions)
Jsm 6390lv sem, by JEOL (1 mentions)
Biovia materials studio 2020, by Dassault Systèmes (1 mentions)
Uv 2500, by Shimadzu (1 mentions)
Jem 2100f, by JEOL (1 mentions)
S 4800, by Hitachi (1 mentions)
11 protocols using rint2000 x ray diffractometer
1
X-Ray Diffraction Analysis of Lyophilized Cakes
2
X-ray Diffraction Analysis of Anaerobic Culture Sediments
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X-ray diffraction (XRD) specimens of culture sediments were prepared anaerobically as described previously (Igarashi et al., 2016 (link)). XRD spectra were obtained with a RINT2000 X-ray diffractometer (Rigaku, Tokyo, Japan) for CuKα1,2 radiation scanning at a step interval of 0.02° 2θ and counting time of 2 s with a 2θ range of 20°–60°, operating at an accelerating voltage of 40 kV at 30 mA.
3
Structural Characterization of Ag/TiO2-Coated Cicada Wings
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X-ray diffraction (XRD) measurements were performed on a RINT 2000 X-ray diffractometer (Rigaku Corporation, Tokyo, Japan), using Cu Kα radiation working at 40 kV and 40 mA. The crystallite size, d, of the samples was estimated using the Scherrer equation: d = 0.9λ/βcosθ, where λ is the wavelength of X-ray source (0.154059 nm) and β is the full width at half maximum (FWHM) of the X-ray diffraction peak at the diffraction angle θ. Scanning electron microscopy (SEM) analysis of the bare cicada wings, Ag/wings, Ag/TiO2-coated wings and Ag films was carried out using a VE-8800 scanning electron microscope (Keyence Corporation, Osaka, Japan) at an acceleration voltage of 15 kV and a working distance of 4 to 12 mm.
4
Characterization of Prepared Samples
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All the prepared samples were characterized by using Scanning Electron Microscopy (SEM) JSM-6390LV SEM from JEOL equipped with Inka-act Energy Dispersive X-ray Analysis (EDX) system from Oxford and X-ray Diffraction (XRD) using using a Rigaku RINT-2000 X-ray diffractometer. XRD patterns were recorded from 30° to 70° 2θ angles using CuKα1 radiation with a monochromatic wavelength of 1.5405 Å operated at 40 kV and 82 mA. Photoluminescence (PL) spectroscopy using a He-Cd, cw laser at 325 nm with full power 35 mW was also performed. The samples were placed in a high vacuum cryostat, which was cooled down to change the temperature from 300 K to 13 K. The emission spectrum was measured using a very sensitive, LN2 cooled CCD camera.
5
Structural Characterization of Materials
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X-ray diffraction (XRD) studies were carried out using a RINT2000 X-ray diffractometer (Rigaku, Tokyo, Japan) using a Cu Kα source. Fourier-transform infrared (FT-IR) spectra were recorded on Perkin Elmer Frontier in the wavenumber range of 400–4000cm−1 (Waltham, MA, USA).
6
Structural Characterization of Materials
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X-ray diffraction (XRD) studies were carried out using a RINT2000 X-ray diffractometer (Rigaku, Tokyo, Japan) using a Cu Kα source. Fourier-transform infrared (FT-IR) spectra were recorded on Perkin Elmer Frontier in the wavenumber range of 400–4000cm−1 (Waltham, MA, USA).
7
Comprehensive Characterization of Catalyst
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XRD data was collected by using a RIGAKU Rint-2000 X-ray diffractometer (graphite monochromatized Cu-Kα radiation with λ = 1.54184 Å). X-ray photoelectron spectroscopy (XPS) was measured by Thermo ESCALAB 250XI. FTIR measurements were performed by the Thermo iS50. The thermogravimetric experiments were conducted on TG 209 F3 Tarsus under the air atmosphere from the room temperature to 900 °C with heating rate of 10 °C min−1. Scanning electron microscopy (SEM) was measured by a Quanta 200 field-emission SEM system. The transmission electron microscopy (TEM) images were achieved on Tecnai G2 F20. The 57Fe Mössbauer spectra were achieved by using an MS-500 instrument (Germany, Wissel) in transmission geometry with constant acceleration mode at room temperature. The O2-TPD of the samples was measured using AutoChem II 2920 apparatus. The catalyst (100 mg) was pretreated at 150 °C and purged with helium (He) for 2 h, and then cooled down to room temperature. And then, the catalyst was purged with 5% O2/He at 25 °C for 2 h. Finally, the desorption profile of O2 was recorded online under the atmosphere of He.
8
PXRD Analysis of Crystalline Samples
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PXRD patterns were detected using a RINT 2000 X-ray diffractometer (Rigaku Co., Tokyo, Japan) with Cu-Kα as the X-ray source. The voltage and strength of the electric current were 40 kV and 40 mA, respectively. The samples were analyzed by a parallel beam method using cross-beam optics in a 2θ range of 5–40° at a scanning velocity of 0.02 steps.
9
Polymorph Identification of Indomethacin via XRPD
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XRPD pattern measurements were performed using a RINT 2000 X-Ray Diffractometer (Rigaku Co., Tokyo, Japan), with a Cu Kα radiation source and a Ni filter as the X-ray source, at a voltage of 40 kV and a current of 40 mA. The X-ray irradiation followed the parallel-beam method in the 2θ range from 5° to 40°, with a scanning velocity of 0.02 steps. The presented spectra are the average of five scans, and the scanning was conducted in triplicate or more replicates. The INM crystals were crushed in an agate mortar using a pestle, and the resulting powders were mixed. Mixtures of α- and γ-form crystals with various molar ratios were prepared using a metal needle, without applying any pressure. The samples were prepared immediately before use. To identify the polymorphs, the diffractograms of the INM single-crystal structures were compared with published diffractograms. The reproduced diffractogram was calculated from the 3D crystalline structure published in the Reflex Module of Powder Diffraction in BIOVIA Materials Studio 2020 (Dassault Systems). The 3D crystalline structures of the γ-form (reference code: INDMET) and α-form (reference code: INDMET04) were retrieved from the Cambridge Crystallographic Data Centre (CCDC).
10
X-ray Diffraction Analysis of Films
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The X-ray diffraction (XRD) analysis was performed according to Li [53 (link)] using an RINT 2000 X-ray diffractometer (Rigaku, Tokyo, Japan). The films were analyzed between 3° and 60° ((2θ) being the angle of diffraction) with a step size of 0.02° using a Cu-Kα, λ = 0.154 nm, radiation at 50 kV and 30 mA.
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