Seeds and pollen samples were dry-mounted on aluminum stubs, covered by a 10 nm coat with palladium in a sputter coater (Anatech HUMMER 6.2 Sputtering System), and observed using a scanning electron microscope (SEM JEOL JSM-6390, HV/LV Tungsten/LaB6, Jeol USA Inc. 2012) equipped with an Energy Dispersive X-ray Spectroscopy (EDS) detector, with an accelerating voltage of 15 kV. Photographs were taken using SEM Control User Interface version 8.5 software at the Institute for Corrosion and Multiphase Technology, Ohio University. Every genotype was examined in three independent groups of roughly 20 seeds and pollen each.
Hv lv tungsten lab6
Manufactured by JEOL
Sourced in United States
The HV/LV Tungsten/LaB6 is a high voltage and low voltage electron source for scanning electron microscopes. It is available in two filament types: Tungsten and Lanthanum Hexaboride (LaB6). The filament is the source of electrons that are accelerated and focused by the electron optics of the microscope to create an electron beam used for imaging and analysis.
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Lab products found in correlation
2 protocols using hv lv tungsten lab6
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Seeds and Pollen SEM Microscopy
2
Scanning Electron Microscopy of Seeds and Pollen
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Seeds and pollen samples were dry-mounted on aluminum stubs, covered by a 10nm coat with palladium in a sputter coater (Anatech HUMMER 6.2 Sputtering System), and observed using a scanning electron microscope (SEM JEOL JSM-6390, HV/LV Tungsten/LaB6, Jeol USA Inc. 2012) equipped with an Energy Dispersive X-ray Spectroscopy (EDS) detector, with an accelerating voltage of 15 kV. Photographs were taken using SEM Control User Interface version 8.5 software at the Institute for Corrosion and Multiphase Technology, Ohio University. Every genotype was examined in three independent groups of roughly 20 seeds and pollen each.
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