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Cary 610 670 micro infrared spectrometer

Manufactured by Agilent Technologies
Sourced in United States

The Cary 610/670 micro-infrared spectrometer is a laboratory instrument designed for infrared spectroscopy analysis. It is capable of performing microscopic analysis of small samples. The core function of this product is to provide high-resolution infrared spectral data for identification and characterization of materials.

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3 protocols using cary 610 670 micro infrared spectrometer

1

Foamed Lightweight Soil Paste Characterization

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Foamed lightweight soil pastes with varying foam contents were prepared, the w/c was set as 0.45, and a cuboid specimen measuring 40 mm × 40 mm × 160 mm was formed; six samples were tested per group. The wet bulk density weight is the weight per unit volume of freshly mixed foamed lightweight soil. According to the relevant criterion of the specification requirements, its wet bulk density should be less than 1100 kg/m3. The fluidity was tested according to GB/T17671-2021, the dry density was tested according to GB/T 5486-2008. Water absorption was tested in accordance with JG/T 266-2011, and unconfined compressive strength in accordance with CECS 249-2008.
The infrared spectrum is primarily used to examine the composition and structure of foamed lightweight soil pastes. Cary 610/670 micro-infrared spectrometer produced by Varian in the United States is used for infrared spectrum testing. Carl Zeiss’ Gemini SEM 300 ZEISS field emission scanning electron microscope system was used.
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2

Multimodal Characterization of Novel Materials

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XRD patterns, Raman, UV-vis and FTIR spectra were inspected by powder X-ray diffractometer (Bruker AXS, German), inVia Raman spectrometer (Renishaw, Britain), Cary 5000 spectrophotometer (Varian, USA) and Cary 610/670 micro infrared spectrometer (Varian, USA), respectively. The SEM, TEM and HRTEM images were recorded by a S-4800II field-emission scanning electron microscope (Hitachi, Japan), a Tecnai 12 transmission electron microscope (Philips, Netherlands) and a Tecnai G2 F30 S-TWIN field-emission transmission electron microscope (FEI, USA), respectively. The AFM analysis was conducted on a Nanoscope (Digital Instruments, USA). The wear scar micrographs were obtained using a LSM 700 3D laser scanning microscope (CARL ZEISS, Germany).
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3

Comprehensive Characterization of Nanostructured Materials

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The morphologies and sizes of the
as-prepared samples were observed by a field scanning electron microscope
(S-4800II, HITACHI, Japan) equipped with an energy-dispersive spectrum
(EDS) and a transmission electron microscope (Tecnai 12, Philips,
Netherlands). High-resolution transmission electron microscopy (HR-TEM)
was conducted on a Tecnai G2F30S-TWIN field emission transmission
electron microscope. The phase composition of the as-prepared samples
was investigated using a D8 advance X-ray diffraction instrument (XRD,
Bruker AXS, Germany). Raman spectra were investigated (using an In
Via Raman spectrometer, Renishaw, Britain). Fourier transform infrared
spectroscopy (FT-IR) signals were recorded on a Cary 610/670 micro
infrared spectrometer (Varian). Further, the ultraviolet and visible
(UV–vis) spectra were investigated by a Cary 5000 spectrophotometer
(Varian).
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