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18 protocols using spm 9700ht

1

Morphology Imaging of Emulsion Structures

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The morphology of the assembled structures at the emulsion surfaces was imaged by AFM (SPM-9700HT, Shimadzu, Kyoto, Japan) in tapping mode in air at ambient temperature. The emulsions were dispersed in distilled water to remove the freed M13 phage, and 2 µL aliquots of the diluted dispersion were deposited onto a freshly cleaved mica substrate and dried for at least 6 h at ambient temperature in a desiccator with silica gel.
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2

Atomic Force Microscopy Analysis of SPP Hydrolysis

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Atomic force microscopy is a reference to Quaisie et al. with slight modifications (Quaisie et al., 2021 (link)). AFM (Shimadzu spm-9700 ht, Japan) was used to analyze the surface morphology of SPP hydrolysis product. Take 0.001 g sample, disperse it in 10 mL ethanol, and then ultrasonic disperse it well. Take 10 mL, The sample is dried on the mica substrate under the infrared lamp for 20 min and then tested. Analytical conditions: scanning area 8.0 × 8.0 µm2, scanning frequency 1 Hz. AFM images were analyzed by Gwyddion software.
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3

Nanomechanical Probing of Cells

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Cells were grown in minimal medium on coverslips at 30°C for 24 h. The medium was removed by pipetting and the cells were analyzed using a scanning probe microscope SPM-9700HT (Shimadzu) with high magnification optical microscope unit, active vibration isolation table, wide area scanner (XY: 125 μm, Z: 5 μm), and fiber light. We used scanning probes (tips), PointProbe-Plus silicon-SPM-Sensor, PPP-NCHAuD (NANOSENSORS), thickness 4.0 ± 1 μm; length 125 ± 10 μm; width 30 ± 7.5 μm; resonance frequency 204-497 kHz; and tip height 10 to 15 μm. Images were collected and analyzed by Nano 3D mapping software (Shimadzu). The nanoindentation results were fitted to the JKR model.
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4

Characterization of Receptor Materials

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The receptor materials including EITS, EIPani, and EITS–EIPani composite are characterized by Agilent Cary 630 Fourier transform infrared (FTIR) spectrophotometer to investigate the structural features, and by Shimadzu SPM-9700HT atomic force microscope (AFM) to study the microstructure and surface morphology.
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5

Preparation of Conductive Polishing Samples

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As a first step, a conductive resin (Technovit 5000, Kulzer, Germany) were prepared, which is composed of the mixture of powder (90 wt% Cu and 10 wt% benzoyl peroxide) and liquid (organic compounds: C5H8O2, C12H18O4, C14H22O6). The mixing weight ratio of powder to liquid is 2. The liquid was put in the half of the powder in a hard paper cup and mixed thoroughly. Continuously, the 2nd half of powder was poured in the cup after mixed for 40 s. After that, the mixture of the core–shell microspherical particles and the conductive resin were poured into a mold and cured to obtain the polishing sample. Parallel polishing (#1500, #2000, #2400, #4000) using water-resistant abrasive paper and buffing (diamond slurry: 3 μm, 0.25 μm) afforded the observation sample for KPFM with a mirror surface. The final shape of the sample was a disc of 10 mm diameter and 1 mm of thickness. Then, the sample was attached to the sample holder, which is stainless steel disk of 15 mm diameter and 1 mm thickness by carbon tape, and the lower surface of the holder was directly connected to the stage of KPFM (SPM-9700HT, Shimadzu, Japan).
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6

Atomic Force Microscopy of Capsule Surfaces

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AFM is widely used for micro- and nanoscale material conditions to create a 3D image of a physical surface (26 ). In the present study, the AFM topography of each capsule inner surface was obtained by scanning probe microscopy (SPM-9700HT; Shimadzu Corp.). Prior to observations, the capsule was cut off and placed on a specimen mount with double-side tape. AFM topography was performed in air using an EFM cantilever with a force constant 42 N/m in the phase mode. All experiments were performed in triplicate with an area of 20.0x20.0 µm in each capsule. The obtained AFM images were evaluated and quantified using ImageJ software. The capsule inner surface of each capsule using AFM was characterized by calculating the valley diameter, the valley area and the valley ratio. The valley diameter corresponds to the average diameter of capsule valleys in the total observed area. The valley area is the average area of capsule valleys in the total observed area. The valley ratio was expressed as the ratio of valley areas in the total observed area. The valley diameter, valley area and valley ratio were evaluated for 40 valleys in one observation area, and the average value was calculated.
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7

Morphological Characterization of SNPs

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The morphological information of the SNPs was obtained by TEM and AFM. HT7700 TEM (Tokyo, Japan) was used to investigate SNPs with an accelerating voltage of 80 kV. Droplets of the SNP solution were prepared using the same method described in 2.4. Before the measurement, all samples were freeze-dried. 10 μL of 0.01% SNPs solution were dried on a mica substrate at 40 °C, then tested using dynamic mode AFM (SPM9700HT, Shimadzu, Japan).
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8

Comprehensive Characterization of Foam Microstructure

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Atomic force microscopy (AFM)
Shimadzu SPM-9700HT (Shimadzu Corp., Kyoto, Japan) was used to evaluate
the hard–soft domains phase separation of the foam. The instrument
was operated at a scan rate of 1.0 Hz in a noncontact mode with Nanoworld
NCHR-10 Pointprobe-Silicon SPM-Sensor phase cantilever with the following
specifications: 4 μm thickness, 125 μm length, 30 μm
width, 320 kHz resonance frequency, and 42 N/m force constant. Scanning
electron microscopy (SEM) images of the foam samples were obtained
using HITACHI SU-1510 (Japan) at 35× magnification. The samples
were coated with a gold–palladium alloy for 1 min at 10 mA
and a sample-target distance of 15 mm. The cell size distribution
of the foams was analyzed using ImageJ. The open cell content of the
foam samples was determined according to ASTM D622636 using Quantachrome Ultrapyc 1200e automatic gas pycnometer
(Germany). The mechanical and physical properties of the foam were
tested using Universal Testing Machine AGS-X Series (Shimadzu Corp.,
Kyoto, Japan) with ASTM standard tests. Density, compression force
deflection (CFD) at 50% deformation, tensile strength, and ball rebound
resilience tests were conducted according to ASTM D357437 Tests A, D, E, and H, respectively.
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9

Characterizing M-CNF Ionic Gel Surfaces

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A detailed investigation of the surface of M-CNF-based ionic gels with various water content was performed using a scanning probe microscope (SPM-9700HT, Shimadzu, Kyoto, Japan) operating in the tapping mode, with an NSG30-SS silicon tip (tip curvature radius 2 nm). A total of 512 × 512 points images were obtained.
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10

Multimodal Characterization of Nanowires

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The morphology of the resulting nanowires was characterized by optical microscopy (50/100× objective, purchased from Sunny Optical Technology (Group) Co., Ltd. in Ningbo, China) The thickness of the 2D material was measured by atomic force microscopy (SmartSPM 1000, purchased from AIStar-Technology company, Novato, CA, USA). Raman testing was acquired by Raman spectroscopy system (Horiba LabRAM HR Evolution, purchased from HORIBA, Ltd. in Kyoto, Japan) under 532 nm laser excitation. X-ray diffractometer (D8 discover X-ray, purchased from Bruker company in Billerica, MA, USA) and transmission electron microscope (Talos F200S, purchased from Thermo Fisher Scientific in Waltham, MA, USA) were used to characterize the structure of nanowires. KPFM was tested on an atomic force microscope (SPM-9700HT, Shimadzu Co., Ltd. in Nagoya, Japan).
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