To observe the original and two-layer coatings, the PLA films were examined by Scanning Electron Microscopy using a JSM-IT 800SHL instrument (Jeol, Tokyo, Japan). The PLA films were cut and adhered to a double-sided conductive carbon tape, placed on a holder, and sputtered with gold to ensure conductivity and prevent charging effects. The samples were examined with an accelerating voltage of 5 kV, along with a variable working distance and comparable magnification. The images were acquired using a secondary electron detector.
Jsm it800shl
Manufactured by JEOL
Sourced in Japan
The JSM-IT800SHL is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of samples. It features a high-brightness field emission gun (FEG) electron source, providing high-resolution imaging capabilities. The microscope is equipped with advanced detectors for secondary electron, backscattered electron, and energy-dispersive X-ray (EDX) analysis. The JSM-IT800SHL is intended for use in materials science, nanotechnology, and other research and industrial applications requiring high-resolution imaging and elemental analysis.
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Lab products found in correlation
8 protocols using jsm it800shl
1
Scanning Electron Microscopy of PLA Films
2
Structural Analysis of Extracellular Whey Gel
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The surface and cross-sectional structure of the EWG were examined through SEM. The EWG samples were cut into cubes (5 × 5 × 5 mm3) and fixed in a 2.5% (v/v) glutaraldehyde solution (prepared in 0.1 M, pH 7.2 phosphate buffer) for 24 h [52 (link)]. Following fixation, the samples underwent three washes with a phosphate buffer and were then lyophilized. After lyophilization, the samples were affixed to a sample stand for SEM (Nissin EM Corporation, Type-HM, Tokyo, Japan) using double-sided carbon tape (Nissin EM Corporation, 8 mm × 20 m, Tokyo, Japan). Gold deposition was carried out, and SEM observations (JSM-IT800SHL, JEOL Ltd., Tokyo, Japan) were conducted at an acceleration voltage of 20 kV with a magnification of 600×.
3
Ultrastructural Analysis of Peptide Assemblies
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For the preparation of the SEM samples, HuH-7 cells in the exponential growth phase were seeded on a 35 mm glass bottom petri dish. Once the cells were fully attached, peptide assemblies were added to the cell culture. After 12 h incubation, the culture medium was removed, and the cell culture was washed three times using 1×PBS buffer. 2.5% glutaric dialdehyde was added to the cells for 30 min followed by 1% osmium to fix the cells. Then the cells were dehydrated using ethanol, rinsed with t-BuOH, and freeze-dried in a lyophilizer (Freeze Dryer, Labconco) for more than 12 h. All samples were coated with 5 nm Osmium (Os) using Os coating device OPC80T (Filgen) before imaging. And the SEM images were captured using an ultra-high-resolution FE-SEM JSM-IT800SHL (JEOL, Japan) at 1.0 kV WD 6 mm.
4
SEM Analysis of Sample Powder
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SEM microscopy was used to observe the surface structure of the sample powder. The sample was fixed to an SEM specimen stand (Nissin EM Corporation, Type-HM, Tokyo, Japan) with double-sided carbon tape for SEM (Nissin EM Corporation, 8 mm × 20 m, Tokyo, Japan). Gold deposition was carried out, and the specimens were observed via SEM (JSM-IT800SHL, JEOL Ltd., Tokyo, Japan) at an acceleration voltage of 10 kV and a magnification of 600×.
5
Freeze-Drying of Phosphate-Buffered BA-HA/Sal-HA Systems
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The BA-HA/Sal-HA systems (8-12 mg) prepared using a 0.20 M phosphate buffer (pH 3.4, 7.4, and 11.4) were placed in a microtube and immersed into cold ethanol (À80 1C), followed by rapid freezing. Thereafter, the samples were stored in a deep freezer at À80 1C for more than 24 h and thoroughly lyophilised. All samples were coated via Pt sputtering to increase their conductivity. Field-emission scanning electron microscopy (FE-SEM) was performed using a field-emission scanning electron microscope (JSM-IT800 SHL, JEOL Ltd, Tokyo, Japan).
6
Comprehensive Characterization of Nanofibrous Membranes
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Field-emission
scanning electron microscopy
(FE-SEM; JSM-IT800SHL) and high-resolution transmission electron microscopy
(TEM; JEOL, JEOL2010; accelerating voltage, 200 kV) were used to record
the morphology and elemental composition of the membrane. Crystal
structuring was characterized by X-ray diffraction (XRD; Rigaku, MiniFlex300)
with monochromatic Cu Kα radiation at 33 kV. Fourier transform
infrared (FT/IR-6600) and X-ray photoelectron spectroscopy (XPS, AXIS-ULTRA
HSA SV) analyses were performed to thoroughly characterize the chemical
structure and morphology of NFMs. For FTIR analysis, 72 scans at a
resolution of 4 cm–1 were performed for each sample,
and all spectra were presented in the wavenumber range 400–4000
cm–1. Thermogravimetric analysis (Thermo plus TG-8120)
of polymers was measured as a weight change analysis. Silver release
content was measured by inductively coupled plasma optical emission
spectrometry (ICP-OES, SPS 5000). An ultraviolet (UV) lamp light (WFH-204B,
Shanghai Int.) was used as a reducing agent.
scanning electron microscopy
(FE-SEM; JSM-IT800SHL) and high-resolution transmission electron microscopy
(TEM; JEOL, JEOL2010; accelerating voltage, 200 kV) were used to record
the morphology and elemental composition of the membrane. Crystal
structuring was characterized by X-ray diffraction (XRD; Rigaku, MiniFlex300)
with monochromatic Cu Kα radiation at 33 kV. Fourier transform
infrared (FT/IR-6600) and X-ray photoelectron spectroscopy (XPS, AXIS-ULTRA
HSA SV) analyses were performed to thoroughly characterize the chemical
structure and morphology of NFMs. For FTIR analysis, 72 scans at a
resolution of 4 cm–1 were performed for each sample,
and all spectra were presented in the wavenumber range 400–4000
cm–1. Thermogravimetric analysis (Thermo plus TG-8120)
of polymers was measured as a weight change analysis. Silver release
content was measured by inductively coupled plasma optical emission
spectrometry (ICP-OES, SPS 5000). An ultraviolet (UV) lamp light (WFH-204B,
Shanghai Int.) was used as a reducing agent.
7
Analyzing Kat-CNF Morphology by SEM
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The morphology of the kat-CNF was examined by Scanning Electron Microscopy (SEM) using a JSM-IT 800SHL instrument (Jeol, Tokyo, Japan). The kat-CNF dispersion was put onto a double-sided conductive carbon tape with a pipette (about 100 μL), left to dry well, placed on a holder, and sputtered with gold, to ensure conductivity and prevent charging effects. The sample was examined with an accelerating voltage of 3 kV and a variable working distance. The images were acquired using a secondary electron detector.
8
Characterization of Gold Nanoparticles
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Scanning electron microscopy with an energy-dispersive X-ray spectroscope (SEM-EDX) was conducted on a Sirion 400 NC (FEI, Hillsboro, OR, USA) and a JEOL JSM-IT800SHL with EDX (JEOL, Akishima, Tokyo, Japan). Freeze-dried AuNPs in PVP matrix samples were applied on a graphite tape in a thin layer on an SEM stub holder and moved into the sample chamber for analysis. The cosmetic cream with AuNPs was spread thinly on a graphite tape placed on the SEM stub holder before analysis.
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